JPS62145170U - - Google Patents

Info

Publication number
JPS62145170U
JPS62145170U JP3188486U JP3188486U JPS62145170U JP S62145170 U JPS62145170 U JP S62145170U JP 3188486 U JP3188486 U JP 3188486U JP 3188486 U JP3188486 U JP 3188486U JP S62145170 U JPS62145170 U JP S62145170U
Authority
JP
Japan
Prior art keywords
contact
contact terminals
terminal
terminals
integrated circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3188486U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3188486U priority Critical patent/JPS62145170U/ja
Publication of JPS62145170U publication Critical patent/JPS62145170U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP3188486U 1986-03-07 1986-03-07 Pending JPS62145170U (no)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3188486U JPS62145170U (no) 1986-03-07 1986-03-07

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3188486U JPS62145170U (no) 1986-03-07 1986-03-07

Publications (1)

Publication Number Publication Date
JPS62145170U true JPS62145170U (no) 1987-09-12

Family

ID=30838030

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3188486U Pending JPS62145170U (no) 1986-03-07 1986-03-07

Country Status (1)

Country Link
JP (1) JPS62145170U (no)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102832155A (zh) * 2011-06-17 2012-12-19 夏普株式会社 修补装置以及修补方法、器件的制造方法
JP2013003023A (ja) * 2011-06-17 2013-01-07 Sharp Corp リペア装置およびリペア方法、デバイスの製造方法
JP2013003024A (ja) * 2011-06-17 2013-01-07 Sharp Corp リペア装置およびリペア方法、デバイスの製造方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS564874B2 (no) * 1976-12-20 1981-02-02
JPS5821879B2 (ja) * 1974-05-07 1983-05-04 古野電気株式会社 チヨウオンパソウジユハキ
JPS59116063A (ja) * 1982-12-23 1984-07-04 Nec Corp 半導体装置の破壊試験方法
JPS59231458A (ja) * 1983-06-15 1984-12-26 Hitachi Micro Comput Eng Ltd 半導体装置の静電破壊試験方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5821879B2 (ja) * 1974-05-07 1983-05-04 古野電気株式会社 チヨウオンパソウジユハキ
JPS564874B2 (no) * 1976-12-20 1981-02-02
JPS59116063A (ja) * 1982-12-23 1984-07-04 Nec Corp 半導体装置の破壊試験方法
JPS59231458A (ja) * 1983-06-15 1984-12-26 Hitachi Micro Comput Eng Ltd 半導体装置の静電破壊試験方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102832155A (zh) * 2011-06-17 2012-12-19 夏普株式会社 修补装置以及修补方法、器件的制造方法
JP2013003023A (ja) * 2011-06-17 2013-01-07 Sharp Corp リペア装置およびリペア方法、デバイスの製造方法
JP2013003024A (ja) * 2011-06-17 2013-01-07 Sharp Corp リペア装置およびリペア方法、デバイスの製造方法

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