JPS62141778A - 絶縁ゲ−ト型電界効果トランジスタ及びその製造方法 - Google Patents
絶縁ゲ−ト型電界効果トランジスタ及びその製造方法Info
- Publication number
- JPS62141778A JPS62141778A JP28263785A JP28263785A JPS62141778A JP S62141778 A JPS62141778 A JP S62141778A JP 28263785 A JP28263785 A JP 28263785A JP 28263785 A JP28263785 A JP 28263785A JP S62141778 A JPS62141778 A JP S62141778A
- Authority
- JP
- Japan
- Prior art keywords
- region
- source
- drain
- source region
- insulated gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 18
- 230000005669 field effect Effects 0.000 title claims description 7
- 239000004065 semiconductor Substances 0.000 claims abstract description 23
- 239000012535 impurity Substances 0.000 claims abstract description 15
- 239000000758 substrate Substances 0.000 claims abstract description 12
- 238000000034 method Methods 0.000 claims abstract description 7
- 238000000151 deposition Methods 0.000 claims 1
- 230000000694 effects Effects 0.000 abstract description 11
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 20
- 235000012239 silicon dioxide Nutrition 0.000 description 10
- 239000000377 silicon dioxide Substances 0.000 description 10
- 229910052785 arsenic Inorganic materials 0.000 description 6
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 6
- 229910052796 boron Inorganic materials 0.000 description 6
- 229910052698 phosphorus Inorganic materials 0.000 description 6
- 239000011574 phosphorus Substances 0.000 description 6
- 238000000206 photolithography Methods 0.000 description 6
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 5
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 5
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- -1 boron ions Chemical class 0.000 description 3
- 150000002500 ions Chemical class 0.000 description 3
- 230000003647 oxidation Effects 0.000 description 3
- 238000007254 oxidation reaction Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 238000002955 isolation Methods 0.000 description 2
- 101100081489 Drosophila melanogaster Obp83a gene Proteins 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 239000007943 implant Substances 0.000 description 1
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28263785A JPS62141778A (ja) | 1985-12-16 | 1985-12-16 | 絶縁ゲ−ト型電界効果トランジスタ及びその製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28263785A JPS62141778A (ja) | 1985-12-16 | 1985-12-16 | 絶縁ゲ−ト型電界効果トランジスタ及びその製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62141778A true JPS62141778A (ja) | 1987-06-25 |
JPH0457097B2 JPH0457097B2 (enrdf_load_stackoverflow) | 1992-09-10 |
Family
ID=17655108
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP28263785A Granted JPS62141778A (ja) | 1985-12-16 | 1985-12-16 | 絶縁ゲ−ト型電界効果トランジスタ及びその製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62141778A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02105469A (ja) * | 1988-10-13 | 1990-04-18 | Nec Corp | Mis型半導体装置 |
US5712204A (en) * | 1994-12-21 | 1998-01-27 | Nec Corporation | Method of making a semiconductor device having reduced junction capacitance between the source and drain regions and the substrate |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6031278A (ja) * | 1983-08-01 | 1985-02-18 | Hitachi Ltd | Mis型半導体装置及びその製造方法 |
-
1985
- 1985-12-16 JP JP28263785A patent/JPS62141778A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6031278A (ja) * | 1983-08-01 | 1985-02-18 | Hitachi Ltd | Mis型半導体装置及びその製造方法 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02105469A (ja) * | 1988-10-13 | 1990-04-18 | Nec Corp | Mis型半導体装置 |
US5712204A (en) * | 1994-12-21 | 1998-01-27 | Nec Corporation | Method of making a semiconductor device having reduced junction capacitance between the source and drain regions and the substrate |
Also Published As
Publication number | Publication date |
---|---|
JPH0457097B2 (enrdf_load_stackoverflow) | 1992-09-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3831602B2 (ja) | 半導体装置の製造方法 | |
JP2591927B2 (ja) | Dramセルの製造方法 | |
JPS63226055A (ja) | 半導体集積回路装置及びその製造方法 | |
JPH0818016A (ja) | 半導体の製造方法 | |
JP3355083B2 (ja) | 半導体装置の製造方法 | |
JPS62141778A (ja) | 絶縁ゲ−ト型電界効果トランジスタ及びその製造方法 | |
JPS63217664A (ja) | Misfet及びその製造方法 | |
JPH0351309B2 (enrdf_load_stackoverflow) | ||
JP2996694B2 (ja) | 半導体スタックトcmos装置の製造方法 | |
JPH0564458B2 (enrdf_load_stackoverflow) | ||
JP2626532B2 (ja) | 半導体装置およびその製造方法 | |
JP2004063918A (ja) | 横型mosトランジスタ | |
JP3314341B2 (ja) | C−mosゲートアレイ及び基体コンタクトの形成方法 | |
JP3030459B2 (ja) | 半導体装置 | |
JPH0541516A (ja) | 半導体装置及び製造方法 | |
JPH118388A (ja) | Mos型半導体装置の高耐圧ドレイン構造 | |
JP2569454B2 (ja) | 縦型電界効果トランジスタの製造方法 | |
JP2982758B2 (ja) | 半導体装置及びその製造方法 | |
JPH02105576A (ja) | 電界効果トランジスタ | |
JPH06181312A (ja) | 半導体装置及びその製造方法 | |
JPS63115382A (ja) | 半導体装置 | |
JPS6156448A (ja) | 相補型半導体装置の製造方法 | |
KR910009742B1 (ko) | 고전압 반도체 장치 및 그 제조방법 | |
JPH03120835A (ja) | 絶縁ゲート電界効果トランジスタの製造方法 | |
JPS6136974A (ja) | Mos型半導体装置の製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |