JPS62139000A - 遠隔計測装置のフレ−ムｉｄチエツク方式 - Google Patents

遠隔計測装置のフレ−ムｉｄチエツク方式

Info

Publication number
JPS62139000A
JPS62139000A JP60280630A JP28063085A JPS62139000A JP S62139000 A JPS62139000 A JP S62139000A JP 60280630 A JP60280630 A JP 60280630A JP 28063085 A JP28063085 A JP 28063085A JP S62139000 A JPS62139000 A JP S62139000A
Authority
JP
Japan
Prior art keywords
frame
data
value
counter
frames
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60280630A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0582631B2 (enExample
Inventor
正之 廣口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP60280630A priority Critical patent/JPS62139000A/ja
Publication of JPS62139000A publication Critical patent/JPS62139000A/ja
Publication of JPH0582631B2 publication Critical patent/JPH0582631B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Arrangements For Transmission Of Measured Signals (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
JP60280630A 1985-12-12 1985-12-12 遠隔計測装置のフレ−ムｉｄチエツク方式 Granted JPS62139000A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60280630A JPS62139000A (ja) 1985-12-12 1985-12-12 遠隔計測装置のフレ−ムｉｄチエツク方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60280630A JPS62139000A (ja) 1985-12-12 1985-12-12 遠隔計測装置のフレ−ムｉｄチエツク方式

Publications (2)

Publication Number Publication Date
JPS62139000A true JPS62139000A (ja) 1987-06-22
JPH0582631B2 JPH0582631B2 (enExample) 1993-11-19

Family

ID=17627724

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60280630A Granted JPS62139000A (ja) 1985-12-12 1985-12-12 遠隔計測装置のフレ−ムｉｄチエツク方式

Country Status (1)

Country Link
JP (1) JPS62139000A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3141717U (ja) * 2008-02-29 2008-05-22 有限会社精巧エンジニアリング 磁気探査機器の無線化構造

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6380751B2 (en) 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US5345170A (en) 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US5561377A (en) 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
DE10143173A1 (de) 2000-12-04 2002-06-06 Cascade Microtech Inc Wafersonde
US6970634B2 (en) 2001-05-04 2005-11-29 Cascade Microtech, Inc. Fiber optic wafer probe
WO2003052435A1 (en) 2001-08-21 2003-06-26 Cascade Microtech, Inc. Membrane probing system
US6777964B2 (en) 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
AU2003233659A1 (en) 2002-05-23 2003-12-12 Cascade Microtech, Inc. Probe for testing a device under test
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
DE202004021093U1 (de) 2003-12-24 2006-09-28 Cascade Microtech, Inc., Beaverton Aktiver Halbleiterscheibenmessfühler
DE202005021434U1 (de) 2004-06-07 2008-03-20 Cascade Microtech, Inc., Beaverton Thermooptische Einspannvorrichtung
CA2570886A1 (en) 2004-07-07 2006-02-16 Cascade Microtech, Inc. Probe head having a membrane suspended probe
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3141717U (ja) * 2008-02-29 2008-05-22 有限会社精巧エンジニアリング 磁気探査機器の無線化構造

Also Published As

Publication number Publication date
JPH0582631B2 (enExample) 1993-11-19

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