JPS6213617B2 - - Google Patents
Info
- Publication number
- JPS6213617B2 JPS6213617B2 JP54126629A JP12662979A JPS6213617B2 JP S6213617 B2 JPS6213617 B2 JP S6213617B2 JP 54126629 A JP54126629 A JP 54126629A JP 12662979 A JP12662979 A JP 12662979A JP S6213617 B2 JPS6213617 B2 JP S6213617B2
- Authority
- JP
- Japan
- Prior art keywords
- chip
- inspected
- light
- throw
- photoelectric conversion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Cutting Tools, Boring Holders, And Turrets (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12662979A JPS5648544A (en) | 1979-09-28 | 1979-09-28 | Crack detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12662979A JPS5648544A (en) | 1979-09-28 | 1979-09-28 | Crack detector |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5648544A JPS5648544A (en) | 1981-05-01 |
JPS6213617B2 true JPS6213617B2 (enrdf_load_stackoverflow) | 1987-03-27 |
Family
ID=14939917
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12662979A Granted JPS5648544A (en) | 1979-09-28 | 1979-09-28 | Crack detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5648544A (enrdf_load_stackoverflow) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5157735A (en) * | 1988-09-09 | 1992-10-20 | Hitachi, Ltd. | Chipping detection system and method |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5135879B2 (enrdf_load_stackoverflow) * | 1973-07-31 | 1976-10-05 | ||
JPS5841459B2 (ja) * | 1974-10-28 | 1983-09-12 | キヤノン株式会社 | ブツタイリヨウブケツカンケンサホウホウ |
-
1979
- 1979-09-28 JP JP12662979A patent/JPS5648544A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5648544A (en) | 1981-05-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5212390A (en) | Lead inspection method using a plane of light for producing reflected lead images | |
US4498776A (en) | Electro-optical method and apparatus for measuring the fit of adjacent surfaces | |
CA2330793A1 (en) | Container sealing surface area inspection | |
WO2002023123A1 (fr) | Capteur optique | |
JPH0760262B2 (ja) | レティクル点検方法および装置 | |
JP4215220B2 (ja) | 表面検査方法及び表面検査装置 | |
JPS6213617B2 (enrdf_load_stackoverflow) | ||
EP0284347A2 (en) | A device for inspecting the degree of vacuum in a sealed vessel | |
US5177564A (en) | Apparatus for measuring thickness of plate-shaped article | |
JPS59192902A (ja) | 基板取付部品の位置検査装置 | |
JP2500658B2 (ja) | 走査型レ―ザ変位計 | |
JPH0621877B2 (ja) | 表面状態測定装置 | |
JPH0711410B2 (ja) | 部品検査装置 | |
JPS62222117A (ja) | 多点距離計測センサ | |
JPS633204A (ja) | 光学検出装置 | |
JPS649306A (en) | Detector for light transmitting fine pattern | |
JPS5875049A (ja) | ナイフマ−ク検査装置 | |
JP2565274B2 (ja) | 高さ測定装置 | |
JPH04145311A (ja) | 高さ測定装置 | |
JP2518763Y2 (ja) | 検査用照明装置 | |
JPH07116608A (ja) | 先端形状検査装置 | |
JPS6213618B2 (enrdf_load_stackoverflow) | ||
JP2502413B2 (ja) | 非接触変位測定装置 | |
JPH0457339A (ja) | 部品検査装置 | |
JPH0350416B2 (enrdf_load_stackoverflow) |