JPS6212851B2 - - Google Patents
Info
- Publication number
- JPS6212851B2 JPS6212851B2 JP622479A JP622479A JPS6212851B2 JP S6212851 B2 JPS6212851 B2 JP S6212851B2 JP 622479 A JP622479 A JP 622479A JP 622479 A JP622479 A JP 622479A JP S6212851 B2 JPS6212851 B2 JP S6212851B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- light beam
- recess
- indentation
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000007373 indentation Methods 0.000 claims description 54
- 239000011521 glass Substances 0.000 claims description 44
- 238000012360 testing method Methods 0.000 claims description 37
- 238000000034 method Methods 0.000 claims description 22
- 238000005259 measurement Methods 0.000 claims description 15
- 238000009792 diffusion process Methods 0.000 claims description 12
- 230000003287 optical effect Effects 0.000 claims description 11
- 238000007542 hardness measurement Methods 0.000 claims description 8
- 238000000149 argon plasma sintering Methods 0.000 claims description 2
- 239000007787 solid Substances 0.000 claims 8
- 230000000903 blocking effect Effects 0.000 claims 1
- 230000001360 synchronised effect Effects 0.000 claims 1
- 239000012780 transparent material Substances 0.000 claims 1
- 230000000007 visual effect Effects 0.000 claims 1
- 229910003460 diamond Inorganic materials 0.000 description 6
- 239000010432 diamond Substances 0.000 description 6
- 239000000463 material Substances 0.000 description 6
- 229920003023 plastic Polymers 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 230000007246 mechanism Effects 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 150000002739 metals Chemical class 0.000 description 4
- 239000004033 plastic Substances 0.000 description 4
- 229910000831 Steel Inorganic materials 0.000 description 3
- 238000000691 measurement method Methods 0.000 description 3
- 230000009467 reduction Effects 0.000 description 3
- 239000010959 steel Substances 0.000 description 3
- 210000004127 vitreous body Anatomy 0.000 description 3
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 2
- 230000004075 alteration Effects 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 230000001427 coherent effect Effects 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000011084 recovery Methods 0.000 description 2
- 229910052711 selenium Inorganic materials 0.000 description 2
- 239000011669 selenium Substances 0.000 description 2
- 238000007493 shaping process Methods 0.000 description 2
- 241000226585 Antennaria plantaginifolia Species 0.000 description 1
- 238000007546 Brinell hardness test Methods 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 208000010412 Glaucoma Diseases 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000011343 solid material Substances 0.000 description 1
- GFQYVLUOOAAOGM-UHFFFAOYSA-N zirconium(iv) silicate Chemical compound [Zr+4].[O-][Si]([O-])([O-])[O-] GFQYVLUOOAAOGM-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/28—Measuring arrangements characterised by the use of optical techniques for measuring areas
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/40—Investigating hardness or rebound hardness
- G01N3/42—Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19782803149 DE2803149C2 (de) | 1978-01-25 | 1978-01-25 | Verfahren zum Ausmessen von Härteprüfeindrücken in Materialoberflächen sowie Einrichtung zur Durchführung des Verfahrens |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS54110865A JPS54110865A (en) | 1979-08-30 |
| JPS6212851B2 true JPS6212851B2 (enrdf_load_stackoverflow) | 1987-03-20 |
Family
ID=6030340
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP622479A Granted JPS54110865A (en) | 1978-01-25 | 1979-01-24 | Method and apparatus for measuring size of depression for hardness test formed on solid surface |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPS54110865A (enrdf_load_stackoverflow) |
| DE (1) | DE2803149C2 (enrdf_load_stackoverflow) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5720642A (en) * | 1980-07-14 | 1982-02-03 | Hamamatsu Tv Kk | Hardness tester |
| JPS57177157U (enrdf_load_stackoverflow) * | 1981-05-07 | 1982-11-09 | ||
| DE3401527A1 (de) * | 1984-01-18 | 1985-08-01 | Amsler-Otto-Wolpert-Werke GmbH, 6700 Ludwigshafen | Verfahren zur automatischen bestimmung der haerte durch vermessen eines pruefeindrucks |
| IT1179997B (it) * | 1984-02-24 | 1987-09-23 | Consiglio Nazionale Ricerche | Procedimento ed apparecchiatura per il rilievo dell impronta lasciata in un provino nella misura della durezza alla penetrazione |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE602066C (de) * | 1933-05-14 | 1934-08-31 | Friedrich Goetze Akt Ges | Einrichtung zum Ausmessen von Oberflaechenverformungen, insbesondere der bei der Haertepruefung nach dem Eindringverfahren entstehenden Eindruecke |
| GB507737A (en) * | 1937-11-30 | 1939-06-20 | Zeiss Carl | Improvements in hardness testing instruments |
| DE890575C (de) * | 1942-09-27 | 1953-09-21 | Eduard Dipl-Ing Schaefer | Verfahren und Vorrichtung zur fortlaufenden Pruefung von Werkstuecken mittels einer Kugeldruckpruefeinrichtung |
| DE1648494A1 (de) * | 1967-09-13 | 1971-06-24 | Goettfert Feinwerk Technik Gmb | Verfahren und Vorrichtung zur Ermittlung der Haerte von insbesondere aus viskoelastischem Material bestehenden Probekoerpern |
| US3822946A (en) * | 1972-12-07 | 1974-07-09 | Schiller Industries Inc | Dimensional measuring apparatus using optical scan especially for hardness testing |
-
1978
- 1978-01-25 DE DE19782803149 patent/DE2803149C2/de not_active Expired
-
1979
- 1979-01-24 JP JP622479A patent/JPS54110865A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS54110865A (en) | 1979-08-30 |
| DE2803149A1 (de) | 1979-07-26 |
| DE2803149C2 (de) | 1983-10-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US3822946A (en) | Dimensional measuring apparatus using optical scan especially for hardness testing | |
| US4049350A (en) | Process and apparatus for detecting inclusions | |
| US4275966A (en) | Method and apparatus for the measurement of hardness testing indentations | |
| CA1258966A (en) | Noncontact gage system utilizing reflected light | |
| JPS6379003A (ja) | 形状測定用光プロ−ブ | |
| JPS63500119A (ja) | 表面形態を測定する計器 | |
| CN102679894B (zh) | 反射式差动共焦透镜中心厚度测量方法 | |
| JPH0153401B2 (enrdf_load_stackoverflow) | ||
| JP2529966B2 (ja) | 粒径測定装置 | |
| WO1997020192A1 (en) | Methods and apparatus for characterizing a surface | |
| CN102679895B (zh) | 反射式共焦透镜中心厚度测量方法 | |
| JP6711899B2 (ja) | レーザビームの特性を決定するための装置および方法 | |
| CN101788271A (zh) | 共焦透镜中心厚度测量方法与装置 | |
| CN108982061A (zh) | 自动化点源透过率杂散光测试系统及方法 | |
| US20190086258A1 (en) | Trasparent Measuring Probe for Beam Scanning | |
| GB1588248A (en) | Hardness testing apparatus | |
| Scheid et al. | Measurement of free surface deformation by reflectance-Schlieren method | |
| CN111238408A (zh) | 一种快速测量平行平板平行度的装置和方法 | |
| JPS6212851B2 (enrdf_load_stackoverflow) | ||
| CN110799816B (zh) | 用于光束扫描的测量探针 | |
| JP2001066127A (ja) | 光学的表面検査機構及び光学的表面検査装置 | |
| CN108362210A (zh) | 具有直线结构的单透镜激光位移测头 | |
| Butler et al. | A novel non-contact sensor for surface topography measurement using a fibre optic principle | |
| CN101320218B (zh) | 三扫描式硅片调焦调平测量装置、系统以及方法 | |
| Murty et al. | Method for measurement of parallelism of optically parallel plates |