IT1179997B - Procedimento ed apparecchiatura per il rilievo dell impronta lasciata in un provino nella misura della durezza alla penetrazione - Google Patents

Procedimento ed apparecchiatura per il rilievo dell impronta lasciata in un provino nella misura della durezza alla penetrazione

Info

Publication number
IT1179997B
IT1179997B IT67181/84A IT6718184A IT1179997B IT 1179997 B IT1179997 B IT 1179997B IT 67181/84 A IT67181/84 A IT 67181/84A IT 6718184 A IT6718184 A IT 6718184A IT 1179997 B IT1179997 B IT 1179997B
Authority
IT
Italy
Prior art keywords
measure
sample
procedure
detection
equipment
Prior art date
Application number
IT67181/84A
Other languages
English (en)
Other versions
IT8467181A1 (it
IT8467181A0 (it
Inventor
Paolo Grattoni
Giulio Barbato
Original Assignee
Consiglio Nazionale Ricerche
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Consiglio Nazionale Ricerche filed Critical Consiglio Nazionale Ricerche
Priority to IT67181/84A priority Critical patent/IT1179997B/it
Publication of IT8467181A0 publication Critical patent/IT8467181A0/it
Priority to DE3505331A priority patent/DE3505331C2/de
Priority to US06/704,536 priority patent/US4627096A/en
Publication of IT8467181A1 publication Critical patent/IT8467181A1/it
Application granted granted Critical
Publication of IT1179997B publication Critical patent/IT1179997B/it

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/40Investigating hardness or rebound hardness
    • G01N3/42Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0098Tests specified by its name, e.g. Charpy, Brinnel, Mullen
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/06Indicating or recording means; Sensing means
    • G01N2203/0641Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
    • G01N2203/0647Image analysis

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
IT67181/84A 1984-02-24 1984-02-24 Procedimento ed apparecchiatura per il rilievo dell impronta lasciata in un provino nella misura della durezza alla penetrazione IT1179997B (it)

Priority Applications (3)

Application Number Priority Date Filing Date Title
IT67181/84A IT1179997B (it) 1984-02-24 1984-02-24 Procedimento ed apparecchiatura per il rilievo dell impronta lasciata in un provino nella misura della durezza alla penetrazione
DE3505331A DE3505331C2 (de) 1984-02-24 1985-02-15 Verfahren und Gerät zur Vermessung des bei der Eindringhärteprüfung in einer Probe hinterlassenen Eindrucks
US06/704,536 US4627096A (en) 1984-02-24 1985-02-22 Procedure and apparatus for the survey of the impression made on a specimen in measuring the hardness at penetration

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT67181/84A IT1179997B (it) 1984-02-24 1984-02-24 Procedimento ed apparecchiatura per il rilievo dell impronta lasciata in un provino nella misura della durezza alla penetrazione

Publications (3)

Publication Number Publication Date
IT8467181A0 IT8467181A0 (it) 1984-02-24
IT8467181A1 IT8467181A1 (it) 1985-08-24
IT1179997B true IT1179997B (it) 1987-09-23

Family

ID=11300265

Family Applications (1)

Application Number Title Priority Date Filing Date
IT67181/84A IT1179997B (it) 1984-02-24 1984-02-24 Procedimento ed apparecchiatura per il rilievo dell impronta lasciata in un provino nella misura della durezza alla penetrazione

Country Status (3)

Country Link
US (1) US4627096A (it)
DE (1) DE3505331C2 (it)
IT (1) IT1179997B (it)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2590702B1 (fr) * 1985-11-26 1990-07-27 Thomson Csf Procede de pontage entre elements de contours dans une image
JPS62209304A (ja) * 1986-03-10 1987-09-14 Fujitsu Ltd 寸法測定方法
JPS6346065A (ja) * 1986-08-13 1988-02-26 Fuji Photo Film Co Ltd 画像倍率変更方法
US5073959A (en) * 1986-10-24 1991-12-17 Canon Kabushiki Kaisha Image processing apparatus with contour extraction
US4945490A (en) * 1988-04-11 1990-07-31 Biddle Jr Ernest L Brinell hardness indicator with digital readout
EP0544644B1 (en) * 1988-04-20 2000-02-23 Fuji Photo Film Co., Ltd. Method for judging the correctness or incorrectness of prospective contour points of an irradiation field
JPH0690725B2 (ja) * 1988-07-18 1994-11-14 日本電装株式会社 位置検出装置
US5150608A (en) * 1991-02-19 1992-09-29 Giancarlo Mazzoleni Centering device for use with brinell hardness-measuring probe
DE4105284A1 (de) * 1991-02-20 1992-11-05 Bacher Gmbh B Verfahren und vorrichtung zur videounterstuetzten montage
US6134954A (en) * 1996-04-15 2000-10-24 Massachusetts Institute Of Technology Depth sensing indentation and methodology for mechanical property measurements
US5999887A (en) * 1997-02-26 1999-12-07 Massachusetts Institute Of Technology Method and apparatus for determination of mechanical properties of functionally-graded materials
US6641893B1 (en) 1997-03-14 2003-11-04 Massachusetts Institute Of Technology Functionally-graded materials and the engineering of tribological resistance at surfaces
WO2001033492A1 (en) * 1999-11-03 2001-05-10 General Electric Company Method of objectively evaluating a surface mark
US6422082B1 (en) 2000-11-27 2002-07-23 General Electric Company Laser shock peening quality assurance by ultrasonic analysis
US6520049B2 (en) 2001-04-27 2003-02-18 Hallmark Cards Incorporated Method of digitizing emboss dies and the like
US7121136B2 (en) * 2002-12-25 2006-10-17 Mitutoyo Corporation Hardness testing apparatus
CA2457366A1 (en) * 2003-02-12 2004-08-12 Mattel, Inc. Packaging for toy and lithophane combinations
EP2065695B1 (fr) * 2007-11-27 2015-07-15 Anton Paar TriTec SA Procédé d'analyse d'un test de rayure
JP2012078306A (ja) * 2010-10-06 2012-04-19 Mitsutoyo Corp 硬さ試験機
JP5501189B2 (ja) * 2010-10-06 2014-05-21 株式会社ミツトヨ 硬さ試験機
AU2012201262B2 (en) * 2011-03-01 2015-11-26 The Toro Company Evaluation of ground surface hardness
JP2013050379A (ja) * 2011-08-31 2013-03-14 Mitsutoyo Corp 硬さ試験機
JP6092530B2 (ja) * 2012-06-18 2017-03-08 キヤノン株式会社 画像処理装置、画像処理方法
JP6199692B2 (ja) * 2013-10-16 2017-09-20 株式会社ミツトヨ 硬さ試験機、及び硬さ試験方法
JP6278512B2 (ja) * 2014-03-13 2018-02-14 国立研究開発法人産業技術総合研究所 情報処理方法、情報処理システム、情報処理装置、およびプログラム
JP6990090B2 (ja) * 2017-10-30 2022-01-12 株式会社ミツトヨ 硬さ試験機及びプログラム

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1563570A (en) * 1976-08-19 1980-03-26 Seiko Instr & Electronics Hardness tester
US4255966A (en) * 1977-11-25 1981-03-17 Vickers Limited Hardness testing apparatus
GB1588248A (en) * 1977-11-25 1981-04-23 Vickers Ltd Hardness testing apparatus
DE2803149C2 (de) * 1978-01-25 1983-10-27 Claus Dr. San José Kleesattel Verfahren zum Ausmessen von Härteprüfeindrücken in Materialoberflächen sowie Einrichtung zur Durchführung des Verfahrens
US4275966A (en) * 1979-01-18 1981-06-30 Claus Kleesattel Method and apparatus for the measurement of hardness testing indentations
US4463600A (en) * 1980-09-23 1984-08-07 University Of Birmingham Automatic measurement of areas
JPS58738A (ja) * 1981-06-16 1983-01-05 Akashi Seisakusho Co Ltd 硬さ計測表示方法およびその装置
EP0149457B1 (en) * 1984-01-13 1993-03-31 Kabushiki Kaisha Komatsu Seisakusho Method of identifying contour lines
DE3401521A1 (de) * 1984-01-18 1985-07-25 Iveco Magirus AG, 7900 Ulm Kotfluegel fuer fahrzeuge, insbesondere fuer die hinterraeder von sattelzugmaschinen

Also Published As

Publication number Publication date
IT8467181A1 (it) 1985-08-24
IT8467181A0 (it) 1984-02-24
DE3505331A1 (de) 1985-08-29
DE3505331C2 (de) 1994-02-10
US4627096A (en) 1986-12-02

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Effective date: 19990225