JPS62126781U - - Google Patents
Info
- Publication number
- JPS62126781U JPS62126781U JP214586U JP214586U JPS62126781U JP S62126781 U JPS62126781 U JP S62126781U JP 214586 U JP214586 U JP 214586U JP 214586 U JP214586 U JP 214586U JP S62126781 U JPS62126781 U JP S62126781U
- Authority
- JP
- Japan
- Prior art keywords
- burn
- board
- sockets
- work
- work sockets
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP214586U JPS62126781U (enExample) | 1986-01-10 | 1986-01-10 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP214586U JPS62126781U (enExample) | 1986-01-10 | 1986-01-10 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS62126781U true JPS62126781U (enExample) | 1987-08-11 |
Family
ID=30780707
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP214586U Pending JPS62126781U (enExample) | 1986-01-10 | 1986-01-10 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62126781U (enExample) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53124080A (en) * | 1977-04-05 | 1978-10-30 | Nec Corp | Package mounted ic test equipment |
-
1986
- 1986-01-10 JP JP214586U patent/JPS62126781U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53124080A (en) * | 1977-04-05 | 1978-10-30 | Nec Corp | Package mounted ic test equipment |
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