JPS62109314A - Manufacture of semiconductor - Google Patents
Manufacture of semiconductorInfo
- Publication number
- JPS62109314A JPS62109314A JP24919585A JP24919585A JPS62109314A JP S62109314 A JPS62109314 A JP S62109314A JP 24919585 A JP24919585 A JP 24919585A JP 24919585 A JP24919585 A JP 24919585A JP S62109314 A JPS62109314 A JP S62109314A
- Authority
- JP
- Japan
- Prior art keywords
- tube
- core tube
- wall surface
- furnace
- furnace core
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は半導体製造装置に係り、特に熱制御性の改善
された半導体製造装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to semiconductor manufacturing equipment, and particularly to a semiconductor manufacturing equipment with improved thermal controllability.
従来の酸化、拡散炉に使用されているSiC炉心管は主
要部は円筒状であり内部も滑らかな円筒である。The main part of the SiC core tube used in conventional oxidation and diffusion furnaces is cylindrical, and the inside is also smooth.
このような従来のSiC反応管を用いtコ拡散炉は第3
図に示しであるようにガス流入部(1)、このガス流入
部(1)に次続されr二SiC(シリコンカーバイト)
製炉心管(2)、この炉心管(2)の両端部及び中央部
を囲繞しこの炉心管(2)を所定温度に加熱するヒータ
(3)から成る。反応ガスを一定の流1を保ちながら炉
心管(2)内lこ流し、ヒーター(3)の炉温を制御し
て図示しない半導体基板の熱処理を行う。次いで反応後
のガスは炉心gを出ると図示しないダクトに排気さnる
。A t-diffusion furnace using such a conventional SiC reaction tube is the third
As shown in the figure, a gas inlet (1) is connected to the gas inlet (1) and is made of SiC (silicon carbide).
It consists of a furnace core tube (2) and a heater (3) that surrounds both ends and the center of the furnace core tube (2) and heats the furnace core tube (2) to a predetermined temperature. The reactant gas is passed through the furnace tube (2) while maintaining a constant flow 1, and the furnace temperature of the heater (3) is controlled to perform heat treatment on a semiconductor substrate (not shown). The gas after the reaction then exits the core g and is exhausted into a duct (not shown).
し発明が、解決しようとする問題点〕
従来の半導体製造装置は以上のよう(こ溝底されている
ので、昇温、降温の時、所定の温度(こ達し炉内のだ!
5が均一ζこなるまである程ぼの時間を必要とし、また
熱処理中の熱の均一分布に問題があった。[Problems that the invention aims to solve] As described above, conventional semiconductor manufacturing equipment has a groove bottom, so when the temperature is raised or lowered, it does not reach a predetermined temperature inside the furnace.
It took a certain amount of time for ζ to become uniform, and there was also a problem in uniform distribution of heat during heat treatment.
この発明は上記のような従来のものの問題点を解決する
ためになされ1こものであり、所定の温度へ短時間で達
することを目的とするものである。This invention was made to solve the problems of the conventional ones as described above, and its purpose is to reach a predetermined temperature in a short time.
この発明に係る半導体製造装置は炉心管の内壁面に凸条
を有するものである。The semiconductor manufacturing apparatus according to the present invention has a protrusion on the inner wall surface of the furnace tube.
し作用〕
この発明における炉心管は内壁面の凸条により表面積が
拡大さn熱輻射効率が上がる。Effect] The surface area of the furnace tube according to the present invention is increased by the convex stripes on the inner wall surface, and the heat radiation efficiency is increased.
以下この発明の一実施例を図誓こ基づいて説明する。第
1図はこの発明の一実施例を示す立体図である。図中第
31図と同一符号は同一まtこは相当部分を表わすもの
であり説明は省略する。図において(4)はこの炉心管
の内壁面に取付けられ1こ内壁面の表面積を拡大する凸
状である。An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a three-dimensional diagram showing an embodiment of the present invention. In the figure, the same reference numerals as in FIG. 31 represent corresponding parts, and their explanation will be omitted. In the figure, (4) is a convex shape that is attached to the inner wall surface of the core tube and expands the surface area of the inner wall surface.
ヒーター(3)Iこより所定温度に達した後、一定流量
のガスが管内に流入口より入り図示しない半導体基板と
反応し1こあとガスは管外が流出、図示しないダクトへ
排気されろ。このとき炉心管(2)内の凸条(4)によ
り炉心管(2)内の温度は制御性良く所定温度に保たれ
、熱の均一性が良くなる。After reaching a predetermined temperature from the heater (3) I, a constant flow of gas enters the tube from the inlet and reacts with a semiconductor substrate (not shown), and after one hour the gas flows out of the tube and is exhausted to a duct (not shown). At this time, the temperature inside the furnace core tube (2) is maintained at a predetermined temperature with good controllability by the ridges (4) inside the furnace core tube (2), and the uniformity of heat is improved.
第2図はこの発明の他の実施例を示したものであり、凸
条(4>を炉心管(2)の内壁面にら線状につけて上記
実施例と同じ作用をなすようにし1こものである。なお
凸条(4)は環状に内壁面に設けてもよい。Fig. 2 shows another embodiment of the present invention, in which a convex strip (4) is attached in a linear manner to the inner wall surface of the core tube (2) to achieve the same effect as the above embodiment. Note that the protruding strip (4) may be provided in an annular shape on the inner wall surface.
まtこ上記実施例では熱の均一性について説明したが流
入ガスの均一化効果も奏する。In the above embodiment, the explanation was made regarding the uniformity of heat, but the effect of making the inflowing gas uniform is also achieved.
(発明の効果)
この発明は以上説明しtことおり炉心管の内壁面に凸条
を設けたので炉心管内の所定温度への達成時間を短縮で
きる効果がある。(Effects of the Invention) As described above, this invention has the effect of shortening the time it takes to reach a predetermined temperature within the core tube, since the protrusions are provided on the inner wall surface of the core tube.
@1図はこの発明の一実施例による半導体製造装置を示
す立体図、第2図は他の実施例を示す半導体製造装置の
立体図、第8図は従来の半導体製造装置を示す立体図で
ある。
(2)は反応管、(3)はヒーター、(4)は凸条なお
図中、同一符号は同一、又は相当部分を示す。@Figure 1 is a three-dimensional diagram showing a semiconductor manufacturing device according to one embodiment of the present invention, FIG. 2 is a three-dimensional diagram showing a semiconductor manufacturing device according to another embodiment, and FIG. 8 is a three-dimensional diagram showing a conventional semiconductor manufacturing device. be. (2) is a reaction tube, (3) is a heater, and (4) is a convex strip. In the drawings, the same reference numerals indicate the same or corresponding parts.
Claims (4)
外周部に設けられた加熱手段を備えたものにおいて、前
記炉心管の内壁面内に凸条有することを特徴とする、半
導体製造装置。(1) A semiconductor manufacturing device comprising a furnace core tube for heat-treating a semiconductor substrate and a heating means provided on the outer periphery of the furnace core tube, characterized in that a protrusion is provided in the inner wall surface of the furnace core tube. .
を特徴とする特許請求の範囲第1項記載の半導体製造装
置。(2) The semiconductor manufacturing apparatus according to claim 1, wherein the protruding strip is provided on the inner wall of the furnace core tube in the generatrix direction.
ことを特徴とする特許請求の範囲第1項記載の半導体製
造装置。(3) The semiconductor manufacturing apparatus according to claim 1, wherein the protruding strip is provided in an annular shape on the circumference of the inner wall of the furnace tube.
特徴とする特許請求の範囲第1項記載の半導体製造装置
。(4) The semiconductor manufacturing apparatus according to claim 1, wherein the protruding stripes are provided in a linear shape on the inner wall of the furnace tube.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24919585A JPS62109314A (en) | 1985-11-07 | 1985-11-07 | Manufacture of semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24919585A JPS62109314A (en) | 1985-11-07 | 1985-11-07 | Manufacture of semiconductor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62109314A true JPS62109314A (en) | 1987-05-20 |
Family
ID=17189314
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP24919585A Pending JPS62109314A (en) | 1985-11-07 | 1985-11-07 | Manufacture of semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62109314A (en) |
-
1985
- 1985-11-07 JP JP24919585A patent/JPS62109314A/en active Pending
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