JPS6174951U - - Google Patents
Info
- Publication number
- JPS6174951U JPS6174951U JP15800684U JP15800684U JPS6174951U JP S6174951 U JPS6174951 U JP S6174951U JP 15800684 U JP15800684 U JP 15800684U JP 15800684 U JP15800684 U JP 15800684U JP S6174951 U JPS6174951 U JP S6174951U
- Authority
- JP
- Japan
- Prior art keywords
- electrodes
- detector
- mesh
- electron beam
- shaped electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010894 electron beam technology Methods 0.000 claims 2
- 230000005684 electric field Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Description
第1図本考案の一実施例を示す構成図、第2図
は従来装置の構成図である。
1:エネルギアナライザ、2:光電子、3:分
析用電源、4:掃引制御電源、5:出射口、6:
チヤンネルプレート、7:メツシユ状電極、8:
電源、9:検出器用加速電源。
FIG. 1 is a block diagram showing an embodiment of the present invention, and FIG. 2 is a block diagram of a conventional device. 1: Energy analyzer, 2: Photoelectron, 3: Analysis power supply, 4: Sweep control power supply, 5: Output port, 6:
Channel plate, 7: mesh electrode, 8:
Power supply, 9: Acceleration power supply for the detector.
Claims (1)
電圧を与えるための掃引電源と、該電極の出射口
を通過した電子を検出するための一次元的に配列
された多数の素子から成る電子線検出器と、前記
出射口と該電子線検出器との間に設けられ前記半
球面型電極間の電場の乱れを防止するためのメツ
シユ状電極とを備えた装置において、該メツシユ
状電極と該検出器との間に一定の電圧を印加する
電源を設けたことを特徴とするエネルギ分析装置
。 An electron beam consisting of a pair of hemispherical electrodes, a sweep power supply for applying an energy sweep voltage to the electrodes, and a number of one-dimensionally arranged elements for detecting the electrons that have passed through the emission aperture of the electrodes. In an apparatus comprising a detector and a mesh-shaped electrode provided between the emission aperture and the electron beam detector to prevent disturbance of the electric field between the hemispherical electrodes, the mesh-shaped electrode and the An energy analysis device characterized by being provided with a power source that applies a constant voltage between it and a detector.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984158006U JPH0341402Y2 (en) | 1984-10-19 | 1984-10-19 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984158006U JPH0341402Y2 (en) | 1984-10-19 | 1984-10-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6174951U true JPS6174951U (en) | 1986-05-21 |
JPH0341402Y2 JPH0341402Y2 (en) | 1991-08-30 |
Family
ID=30715992
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1984158006U Expired JPH0341402Y2 (en) | 1984-10-19 | 1984-10-19 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0341402Y2 (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5823157A (en) * | 1981-07-31 | 1983-02-10 | Shimadzu Corp | Mass spectrograph |
JPS58120558U (en) * | 1982-02-10 | 1983-08-17 | 日本電子株式会社 | Negative ion detection device |
-
1984
- 1984-10-19 JP JP1984158006U patent/JPH0341402Y2/ja not_active Expired
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5823157A (en) * | 1981-07-31 | 1983-02-10 | Shimadzu Corp | Mass spectrograph |
JPS58120558U (en) * | 1982-02-10 | 1983-08-17 | 日本電子株式会社 | Negative ion detection device |
Also Published As
Publication number | Publication date |
---|---|
JPH0341402Y2 (en) | 1991-08-30 |
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