JPS629356U - - Google Patents

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Publication number
JPS629356U
JPS629356U JP10013485U JP10013485U JPS629356U JP S629356 U JPS629356 U JP S629356U JP 10013485 U JP10013485 U JP 10013485U JP 10013485 U JP10013485 U JP 10013485U JP S629356 U JPS629356 U JP S629356U
Authority
JP
Japan
Prior art keywords
voltage
divided
ion source
sweep
quadrupole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10013485U
Other languages
Japanese (ja)
Other versions
JPH0341403Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985100134U priority Critical patent/JPH0341403Y2/ja
Publication of JPS629356U publication Critical patent/JPS629356U/ja
Application granted granted Critical
Publication of JPH0341403Y2 publication Critical patent/JPH0341403Y2/ja
Expired legal-status Critical Current

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  • Electron Tubes For Measurement (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本考案の原理的構成図、第２図は本考
案の１実施例構成図、第３図は本考案の他の実施
例構成図、第４図は本考案に用いられる他のイオ
ン源構成図、第５図は従来の四重極型質量分析計
の構成図を示す。 図中、１はイオン源、１―１はフイラメント、
１―２はグリツド、１―３は電子リペラー、１―
４はイオン集束電極、１―５は電子サプレツサ電
極、２は四重極電極、３は検出器、４は記録計、
５，５―１ないし５―４は電圧設定部、６は掃引
設定部、７は制御部を表す。 Figure 1 is a diagram showing the basic configuration of the present invention, Figure 2 is a diagram showing the configuration of one embodiment of the invention, Figure 3 is a diagram showing the configuration of another embodiment of the invention, and Figure 4 is a diagram showing the configuration of another embodiment of the invention. FIG. 5 shows a configuration diagram of a conventional quadrupole mass spectrometer. In the figure, 1 is an ion source, 1-1 is a filament,
1-2 is grid, 1-3 is electronic repeller, 1-
4 is an ion focusing electrode, 1-5 is an electronic suppressor electrode, 2 is a quadrupole electrode, 3 is a detector, 4 is a recorder,
5, 5-1 to 5-4 represent voltage setting units, 6 represents a sweep setting unit, and 7 represents a control unit.

Claims (1)

【実用新案登録請求の範囲】 イオン源によつて生成したイオンを四重極電極
間に入射し、この四重極電極に供給する電圧を掃
引して質量数を検出するよう構成した四重極型質
量分析計において、 質量数を検出する範囲を複数の区間に分割し、
この分割した各区間に存在する質量数のイオンを
検出する掃引電圧を予め夫々設定する掃引設定部
と、 前記分割した各区間に対して、イオン源から四
重極電極間に入射させるイオンのエネルギーおよ
び入射条件を決定する当該イオン源に供給する電
圧を予め夫々設定する電圧設定部とを備え、 前記掃引設定部に予め設定したいずれかの掃引
電圧を用いて所定の分割した区間を掃引する場合
に、当該分割した区間に対応した電圧を前記電圧
設定部からイオン源に供給するよう構成したこと
を特徴とする四重極型質量分析計。[Claims for Utility Model Registration] A quadrupole configured to inject ions generated by an ion source between quadrupole electrodes and detect the mass number by sweeping the voltage supplied to the quadrupole electrodes. In a type mass spectrometer, the range for detecting mass numbers is divided into multiple sections,
a sweep setting unit that presets a sweep voltage for detecting ions having a mass number existing in each of the divided sections; and an energy of ions that are incident from the ion source between the quadrupole electrodes for each of the divided sections. and a voltage setting section that presets the voltage supplied to the ion source that determines the incident condition, and when sweeping a predetermined divided section using one of the sweep voltages preset in the sweep setting section. A quadrupole mass spectrometer, characterized in that the voltage setting section supplies a voltage corresponding to the divided section to an ion source.
JP1985100134U 1985-07-02 1985-07-02 Expired JPH0341403Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985100134U JPH0341403Y2 (en) 1985-07-02 1985-07-02

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985100134U JPH0341403Y2 (en) 1985-07-02 1985-07-02

Publications (2)

Publication Number Publication Date
JPS629356U true JPS629356U (en) 1987-01-20
JPH0341403Y2 JPH0341403Y2 (en) 1991-08-30

Family

ID=30969666

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985100134U Expired JPH0341403Y2 (en) 1985-07-02 1985-07-02

Country Status (1)

Country Link
JP (1) JPH0341403Y2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07230786A (en) * 1994-02-17 1995-08-29 Shimadzu Corp Element analyzer
JPH097541A (en) * 1995-06-21 1997-01-10 Yokogawa Analytical Syst Kk Optimization method and device for lens parameter in mass spectroscope

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50122985A (en) * 1974-03-11 1975-09-26

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50122985A (en) * 1974-03-11 1975-09-26

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07230786A (en) * 1994-02-17 1995-08-29 Shimadzu Corp Element analyzer
JPH097541A (en) * 1995-06-21 1997-01-10 Yokogawa Analytical Syst Kk Optimization method and device for lens parameter in mass spectroscope

Also Published As

Publication number Publication date
JPH0341403Y2 (en) 1991-08-30

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