JPS6387762U - - Google Patents
Info
- Publication number
- JPS6387762U JPS6387762U JP18314086U JP18314086U JPS6387762U JP S6387762 U JPS6387762 U JP S6387762U JP 18314086 U JP18314086 U JP 18314086U JP 18314086 U JP18314086 U JP 18314086U JP S6387762 U JPS6387762 U JP S6387762U
- Authority
- JP
- Japan
- Prior art keywords
- mass spectrometer
- ion source
- mass
- connecting portion
- value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 claims description 2
- 150000002500 ions Chemical class 0.000 claims 8
- 238000004949 mass spectrometry Methods 0.000 claims 1
- 238000004885 tandem mass spectrometry Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Electron Tubes For Measurement (AREA)
Description
第１図は本考案の一実施例の構成を示す概略図
、第２図は従来例を説明するための図である。
２：検出スリツト、３：イオン検出器、７：イ
オン源、８：衝突室、９：入射スリツト、１１：
レンズ電極群、１２：イオン源電源、１３：レン
ズ電源、１４：切換スイツチ。
FIG. 1 is a schematic diagram showing the configuration of an embodiment of the present invention, and FIG. 2 is a diagram for explaining a conventional example. 2: detection slit, 3: ion detector, 7: ion source, 8: collision chamber, 9: entrance slit, 11:
Lens electrode group, 12: ion source power supply, 13: lens power supply, 14: changeover switch.
Claims (1)
直列に結合してＭＳ／ＭＳ装置を構成し、第１の
質量分析装置の検出スリツトから第２の質量分析
装置の入射スリツトまでの接続部に、イオン検出
器と、第２の質量分析装置用イオン源と、衝突室
とを配置した装置において、前記第２の質量分析
装置用イオン源に付属するレンズ電極に供給する
電圧を、該イオン源内で生成されたイオンを第２
の質量分析装置に向けて引出すための値と、該イ
オン源を使用しない時に前記接続部を通過するイ
オンを収束させるレンズとして作用する値の２段
階に選択可能に構成したことを特徴とするＭＳ／
ＭＳ装置。 An MS/MS device is configured by connecting two mass spectrometers in series, each having a mass spectrometry field, and a connecting portion from the detection slit of the first mass spectrometer to the entrance slit of the second mass spectrometer, In an apparatus including an ion detector, a second ion source for a mass spectrometer, and a collision chamber, a voltage supplied to a lens electrode attached to the second ion source for a mass spectrometer is applied within the ion source. The generated ions are
MS characterized in that the MS is configured to be selectable in two levels: a value for extracting ions toward a mass spectrometer, and a value for acting as a lens to converge ions passing through the connecting portion when the ion source is not in use. /
MS device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18314086U JPH0411328Y2 (en) | 1986-11-28 | 1986-11-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18314086U JPH0411328Y2 (en) | 1986-11-28 | 1986-11-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6387762U true JPS6387762U (en) | 1988-06-08 |
| JPH0411328Y2 JPH0411328Y2 (en) | 1992-03-19 |
Family
ID=31129600
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18314086U Expired JPH0411328Y2 (en) | 1986-11-28 | 1986-11-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0411328Y2 (en) |
-
1986
- 1986-11-28 JP JP18314086U patent/JPH0411328Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0411328Y2 (en) | 1992-03-19 |
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