JPS6168541A - ビデオ式錠剤検査方法 - Google Patents

ビデオ式錠剤検査方法

Info

Publication number
JPS6168541A
JPS6168541A JP18974984A JP18974984A JPS6168541A JP S6168541 A JPS6168541 A JP S6168541A JP 18974984 A JP18974984 A JP 18974984A JP 18974984 A JP18974984 A JP 18974984A JP S6168541 A JPS6168541 A JP S6168541A
Authority
JP
Japan
Prior art keywords
video signal
frame memory
foreign matter
detection
video
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18974984A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0536742B2 (enrdf_load_html_response
Inventor
Nobuo Nishikawa
西川　信夫
Susumu Sano
佐野　進
Kazukuni Yoshida
吉田　和晋
Yuji Matsuda
松田　佑治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
C C D KK
HAYASHI YAKUHIN KIKAI KK
Daiichi Pharmaceutical Co Ltd
Original Assignee
C C D KK
HAYASHI YAKUHIN KIKAI KK
Daiichi Pharmaceutical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by C C D KK, HAYASHI YAKUHIN KIKAI KK, Daiichi Pharmaceutical Co Ltd filed Critical C C D KK
Priority to JP18974984A priority Critical patent/JPS6168541A/ja
Publication of JPS6168541A publication Critical patent/JPS6168541A/ja
Publication of JPH0536742B2 publication Critical patent/JPH0536742B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP18974984A 1984-09-12 1984-09-12 ビデオ式錠剤検査方法 Granted JPS6168541A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18974984A JPS6168541A (ja) 1984-09-12 1984-09-12 ビデオ式錠剤検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18974984A JPS6168541A (ja) 1984-09-12 1984-09-12 ビデオ式錠剤検査方法

Publications (2)

Publication Number Publication Date
JPS6168541A true JPS6168541A (ja) 1986-04-08
JPH0536742B2 JPH0536742B2 (enrdf_load_html_response) 1993-05-31

Family

ID=16246534

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18974984A Granted JPS6168541A (ja) 1984-09-12 1984-09-12 ビデオ式錠剤検査方法

Country Status (1)

Country Link
JP (1) JPS6168541A (enrdf_load_html_response)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0745222A (ja) * 1993-07-29 1995-02-14 Nec Corp 蛍光表示管

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54133186A (en) * 1978-04-06 1979-10-16 Ishikawajima Harima Heavy Ind Method of detecting flaws of hot piece
JPS5863838A (ja) * 1981-10-14 1983-04-15 Fuji Electric Co Ltd 欠陥検出回路

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54133186A (en) * 1978-04-06 1979-10-16 Ishikawajima Harima Heavy Ind Method of detecting flaws of hot piece
JPS5863838A (ja) * 1981-10-14 1983-04-15 Fuji Electric Co Ltd 欠陥検出回路

Also Published As

Publication number Publication date
JPH0536742B2 (enrdf_load_html_response) 1993-05-31

Similar Documents

Publication Publication Date Title
US5625709A (en) Method and apparatus for identifying characteristics of an object in a field of view
EP0168557B1 (de) Verfahren zum Auslesen einer Entfernungsbildzeile
GB1518093A (en) Mark detection apparatus
FR2393497A1 (fr) Procede de traitement de signaux d
US3908078A (en) Method and apparatus for digital recognition of objects particularly biological materials
JPS6168541A (ja) ビデオ式錠剤検査方法
US5359672A (en) Line detecting method using two rectangular windows passing through the line to be detected
US4555664A (en) Process and device for inspecting a surface in simulated manner which differs from the real surface scanning by an eddy current transducer
GB1306798A (en) Character recognition systems
JPS60138924A (ja) パタ−ン検査方法及びその装置
JPH06308054A (ja) 欠陥画像再生装置
CA1300266C (en) Apparatus for pre-processing sensor data
SU1439484A1 (ru) Вихретоковое устройство дл неразрушающего контрол
JPS61175787A (ja) エツジ検出回路
JPH0334112B2 (enrdf_load_html_response)
JPS6336035B2 (enrdf_load_html_response)
JPH0462110B2 (enrdf_load_html_response)
JPH01242906A (ja) 光切断法における線化方法
JP2632820B2 (ja) 撮像装置
JPS6118143A (ja) パタ−ン検査方法
JPS633354B2 (enrdf_load_html_response)
JPS62168038A (ja) 表面欠陥検査方法
JPH0324671A (ja) 欠陥検査装置
JPS5950218B2 (ja) パタ−ン検査装置
JPS5827323A (ja) マスク検査方法および装置