JPS6161426B2 - - Google Patents

Info

Publication number
JPS6161426B2
JPS6161426B2 JP55106225A JP10622580A JPS6161426B2 JP S6161426 B2 JPS6161426 B2 JP S6161426B2 JP 55106225 A JP55106225 A JP 55106225A JP 10622580 A JP10622580 A JP 10622580A JP S6161426 B2 JPS6161426 B2 JP S6161426B2
Authority
JP
Japan
Prior art keywords
under test
output
digital circuit
failure
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55106225A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5731058A (en
Inventor
Kenzo Ookawa
Toshio Maeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP10622580A priority Critical patent/JPS5731058A/ja
Publication of JPS5731058A publication Critical patent/JPS5731058A/ja
Publication of JPS6161426B2 publication Critical patent/JPS6161426B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
JP10622580A 1980-08-01 1980-08-01 Fault diagnostic system of digital circuit Granted JPS5731058A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10622580A JPS5731058A (en) 1980-08-01 1980-08-01 Fault diagnostic system of digital circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10622580A JPS5731058A (en) 1980-08-01 1980-08-01 Fault diagnostic system of digital circuit

Publications (2)

Publication Number Publication Date
JPS5731058A JPS5731058A (en) 1982-02-19
JPS6161426B2 true JPS6161426B2 (sv) 1986-12-25

Family

ID=14428188

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10622580A Granted JPS5731058A (en) 1980-08-01 1980-08-01 Fault diagnostic system of digital circuit

Country Status (1)

Country Link
JP (1) JPS5731058A (sv)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0429835U (sv) * 1990-06-29 1992-03-10
JPH0523054U (ja) * 1991-09-03 1993-03-26 エヌオーケー株式会社 液面センサ
JPH0536322U (ja) * 1991-10-21 1993-05-18 エヌオーケー株式会社 液面センサ

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04167029A (ja) * 1990-10-31 1992-06-15 Nec Corp 故障検出判定装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0429835U (sv) * 1990-06-29 1992-03-10
JPH0523054U (ja) * 1991-09-03 1993-03-26 エヌオーケー株式会社 液面センサ
JPH0536322U (ja) * 1991-10-21 1993-05-18 エヌオーケー株式会社 液面センサ

Also Published As

Publication number Publication date
JPS5731058A (en) 1982-02-19

Similar Documents

Publication Publication Date Title
US4228537A (en) Method of and apparatus for automatic fault diagnosis of electrical circuits employing on-line simulation of faults in such circuits during diagnosis
US4639917A (en) Fault determining apparatus for data transmission system
US4539682A (en) Method and apparatus for signaling on-line failure detection
US4683569A (en) Diagnostic circuit utilizing bidirectional test data comparisons
JPS6161426B2 (sv)
JPH01156680A (ja) 論理回路の故障診断方法
JPS6234247A (ja) 障害ハ−ドウエア指摘テ−ブル生成方式
JP3378975B2 (ja) 障害診断器
JPS63198135A (ja) 診断装置付電子計算機システム
US5168501A (en) Method for checking hardware errors
JP2878014B2 (ja) Ｒａｍ試験方式
JP2870001B2 (ja) 論理回路パッケージ
CN117711475A (zh) 存储单元的故障检测电路及方法、功能芯片
JPS6346458B2 (sv)
CN115384531A (zh) 汽车怀挡档位识别诊断方法及装置、电子设备、计算机可读存储介质
CN115691638A (zh) 一种故障检测方法及其相关装置
CN117851230A (zh) 接口测试方法、装置、终端设备及存储介质
JPH0378657B2 (sv)
JPH0997194A (ja) フェイルメモリのデータ取得装置
JPS63121935A (ja) 論理装置の故障診断方式
Tuomenoksa et al. Problems of programming for shared real-time systems
JPS628828B2 (sv)
Stiffler Fault-Tolerant Computing: An Introduction
JPH05157814A (ja) 故障領域特定方法及び装置
JPS5941617B2 (ja) 信号伝送系の検査回路