JPS6158941B2 - - Google Patents
Info
- Publication number
- JPS6158941B2 JPS6158941B2 JP54021944A JP2194479A JPS6158941B2 JP S6158941 B2 JPS6158941 B2 JP S6158941B2 JP 54021944 A JP54021944 A JP 54021944A JP 2194479 A JP2194479 A JP 2194479A JP S6158941 B2 JPS6158941 B2 JP S6158941B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- ion
- electrode
- sample holder
- holder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 150000002500 ions Chemical class 0.000 claims description 20
- 238000010884 ion-beam technique Methods 0.000 claims description 3
- 238000000605 extraction Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 4
- 230000005684 electric field Effects 0.000 description 2
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2194479A JPS55115251A (en) | 1979-02-28 | 1979-02-28 | Ion micro analyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2194479A JPS55115251A (en) | 1979-02-28 | 1979-02-28 | Ion micro analyzer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55115251A JPS55115251A (en) | 1980-09-05 |
JPS6158941B2 true JPS6158941B2 (ko) | 1986-12-13 |
Family
ID=12069152
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2194479A Granted JPS55115251A (en) | 1979-02-28 | 1979-02-28 | Ion micro analyzer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55115251A (ko) |
-
1979
- 1979-02-28 JP JP2194479A patent/JPS55115251A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS55115251A (en) | 1980-09-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
GB1145107A (en) | Ion beam microanalyser | |
JPS58110956U (ja) | 荷電粒子照射装置 | |
EP0003659A3 (en) | Apparatus for and method of analysing materials by means of a beam of charged particles | |
JPS6158941B2 (ko) | ||
GB1303136A (ko) | ||
JPS60243958A (ja) | イオンビ−ム装置 | |
JP2569517B2 (ja) | イオンマイクロアナライザ | |
JPS6419664A (en) | Ion beam device | |
JPS58184763U (ja) | イオン源の機能を付加した平行平板型静電アナライザ | |
JPH01115042A (ja) | 走査型電子顕微鏡の試料台 | |
JPS61104960U (ko) | ||
JPH01186745A (ja) | 質量分析装置用イオン源 | |
JP3055159B2 (ja) | 中性粒子質量分析装置 | |
JP3055160B2 (ja) | 中性粒子質量分析装置 | |
JPH0355239Y2 (ko) | ||
JP2612716B2 (ja) | 二次イオン質量分析方法 | |
JPS6339853U (ko) | ||
JPH03176957A (ja) | 二次イオン分析装置 | |
JPS5971158U (ja) | オ−ジエ電子分光装置 | |
JPS62160650A (ja) | イオンマイクロアナライザ | |
JPH0668832A (ja) | 走査電子顕微鏡 | |
JPS6382364U (ko) | ||
JPS57109244A (en) | Ion source | |
JPS56132757A (en) | Ion source for mass spectrometer | |
JPS60189852A (ja) | イオンマイクロアナライザの試料微動装置 |