JPS6143817B2 - - Google Patents
Info
- Publication number
- JPS6143817B2 JPS6143817B2 JP53163305A JP16330578A JPS6143817B2 JP S6143817 B2 JPS6143817 B2 JP S6143817B2 JP 53163305 A JP53163305 A JP 53163305A JP 16330578 A JP16330578 A JP 16330578A JP S6143817 B2 JPS6143817 B2 JP S6143817B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- inclined surface
- knob
- electron microscope
- view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003287 optical effect Effects 0.000 claims description 4
- 230000006835 compression Effects 0.000 claims description 3
- 238000007906 compression Methods 0.000 claims description 3
- 239000010409 thin film Substances 0.000 claims description 2
- 238000010894 electron beam technology Methods 0.000 description 7
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical group [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- FGRBYDKOBBBPOI-UHFFFAOYSA-N 10,10-dioxo-2-[4-(N-phenylanilino)phenyl]thioxanthen-9-one Chemical compound O=C1c2ccccc2S(=O)(=O)c2ccc(cc12)-c1ccc(cc1)N(c1ccccc1)c1ccccc1 FGRBYDKOBBBPOI-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 238000001000 micrograph Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Landscapes
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16330578A JPS5588256A (en) | 1978-12-26 | 1978-12-26 | Sample compression tester for electron microscope or the like |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16330578A JPS5588256A (en) | 1978-12-26 | 1978-12-26 | Sample compression tester for electron microscope or the like |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5588256A JPS5588256A (en) | 1980-07-03 |
JPS6143817B2 true JPS6143817B2 (US06826419-20041130-M00005.png) | 1986-09-30 |
Family
ID=15771294
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16330578A Granted JPS5588256A (en) | 1978-12-26 | 1978-12-26 | Sample compression tester for electron microscope or the like |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5588256A (US06826419-20041130-M00005.png) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006196310A (ja) * | 2005-01-13 | 2006-07-27 | Central Res Inst Of Electric Power Ind | 電子顕微鏡用可動プローブ装置および電子顕微鏡の試料観察方法 |
US9316569B2 (en) | 2009-11-27 | 2016-04-19 | Hysitron, Inc. | Micro electro-mechanical heater |
JP5735185B2 (ja) | 2011-11-14 | 2015-06-17 | ハイジトロン, インク.Hysitron, Inc. | プローブ先端加熱アセンブリ |
EP2786116B1 (en) | 2011-11-28 | 2020-07-15 | Bruker Nano, Inc. | High temperature heating system |
JP2013127859A (ja) * | 2011-12-16 | 2013-06-27 | Nagoya Institute Of Technology | 被検査試料測定装置及び被検査試料測定装置の制御方法 |
JP5963955B2 (ja) | 2012-06-13 | 2016-08-03 | ハイジトロン, インク.Hysitron, Inc. | ミクロンまたはナノスケールでの機械的試験用環境コンディショニングアセンブリ |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5026469A (US06826419-20041130-M00005.png) * | 1973-07-09 | 1975-03-19 |
-
1978
- 1978-12-26 JP JP16330578A patent/JPS5588256A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5026469A (US06826419-20041130-M00005.png) * | 1973-07-09 | 1975-03-19 |
Also Published As
Publication number | Publication date |
---|---|
JPS5588256A (en) | 1980-07-03 |