JPS6140100B2 - - Google Patents

Info

Publication number
JPS6140100B2
JPS6140100B2 JP5569279A JP5569279A JPS6140100B2 JP S6140100 B2 JPS6140100 B2 JP S6140100B2 JP 5569279 A JP5569279 A JP 5569279A JP 5569279 A JP5569279 A JP 5569279A JP S6140100 B2 JPS6140100 B2 JP S6140100B2
Authority
JP
Japan
Prior art keywords
substrate
photomask
coating
pinholes
protrusions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP5569279A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55147629A (en
Inventor
Kaoru Asao
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ulvac Inc
Original Assignee
Ulvac Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ulvac Inc filed Critical Ulvac Inc
Priority to JP5569279A priority Critical patent/JPS55147629A/ja
Publication of JPS55147629A publication Critical patent/JPS55147629A/ja
Publication of JPS6140100B2 publication Critical patent/JPS6140100B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/60Substrates

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
JP5569279A 1979-05-09 1979-05-09 Photomask substrate working method Granted JPS55147629A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5569279A JPS55147629A (en) 1979-05-09 1979-05-09 Photomask substrate working method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5569279A JPS55147629A (en) 1979-05-09 1979-05-09 Photomask substrate working method

Publications (2)

Publication Number Publication Date
JPS55147629A JPS55147629A (en) 1980-11-17
JPS6140100B2 true JPS6140100B2 (enrdf_load_stackoverflow) 1986-09-08

Family

ID=13005944

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5569279A Granted JPS55147629A (en) 1979-05-09 1979-05-09 Photomask substrate working method

Country Status (1)

Country Link
JP (1) JPS55147629A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005333124A (ja) * 2004-04-22 2005-12-02 Asahi Glass Co Ltd 反射型マスク用低膨張硝子基板および反射型マスク
WO2021229967A1 (ja) * 2020-05-13 2021-11-18 Agc株式会社 ガラス板の加工方法、及びeuvl用マスクブランクの製造方法
WO2021229968A1 (ja) * 2020-05-13 2021-11-18 Agc株式会社 ガラス板の加工方法、及び加工装置、並びにeuvl用マスクブランクの製造方法

Also Published As

Publication number Publication date
JPS55147629A (en) 1980-11-17

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