JPS6138160Y2 - - Google Patents
Info
- Publication number
- JPS6138160Y2 JPS6138160Y2 JP1981191201U JP19120181U JPS6138160Y2 JP S6138160 Y2 JPS6138160 Y2 JP S6138160Y2 JP 1981191201 U JP1981191201 U JP 1981191201U JP 19120181 U JP19120181 U JP 19120181U JP S6138160 Y2 JPS6138160 Y2 JP S6138160Y2
- Authority
- JP
- Japan
- Prior art keywords
- addresses
- input
- write
- test
- address
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 19
- 239000000872 buffer Substances 0.000 claims description 10
- 238000007796 conventional method Methods 0.000 description 1
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
Landscapes
- Static Random-Access Memory (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19120181U JPS5897800U (ja) | 1981-12-22 | 1981-12-22 | メモリ装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19120181U JPS5897800U (ja) | 1981-12-22 | 1981-12-22 | メモリ装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5897800U JPS5897800U (ja) | 1983-07-02 |
JPS6138160Y2 true JPS6138160Y2 (US06534493-20030318-C00166.png) | 1986-11-04 |
Family
ID=30104675
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19120181U Granted JPS5897800U (ja) | 1981-12-22 | 1981-12-22 | メモリ装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5897800U (US06534493-20030318-C00166.png) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009176375A (ja) * | 2008-01-25 | 2009-08-06 | Toshiba Corp | 不揮発性半導体記憶装置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51147924A (en) * | 1975-06-13 | 1976-12-18 | Fujitsu Ltd | Memory unit |
JPS53132273A (en) * | 1977-04-22 | 1978-11-17 | Mitsubishi Electric Corp | Semiconductor memory device |
JPS5585957A (en) * | 1978-11-25 | 1980-06-28 | Fujitsu Ltd | Logic circuit for test bit selection |
-
1981
- 1981-12-22 JP JP19120181U patent/JPS5897800U/ja active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51147924A (en) * | 1975-06-13 | 1976-12-18 | Fujitsu Ltd | Memory unit |
JPS53132273A (en) * | 1977-04-22 | 1978-11-17 | Mitsubishi Electric Corp | Semiconductor memory device |
JPS5585957A (en) * | 1978-11-25 | 1980-06-28 | Fujitsu Ltd | Logic circuit for test bit selection |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009176375A (ja) * | 2008-01-25 | 2009-08-06 | Toshiba Corp | 不揮発性半導体記憶装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS5897800U (ja) | 1983-07-02 |
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