JPS6132759B2 - - Google Patents

Info

Publication number
JPS6132759B2
JPS6132759B2 JP55170376A JP17037680A JPS6132759B2 JP S6132759 B2 JPS6132759 B2 JP S6132759B2 JP 55170376 A JP55170376 A JP 55170376A JP 17037680 A JP17037680 A JP 17037680A JP S6132759 B2 JPS6132759 B2 JP S6132759B2
Authority
JP
Japan
Prior art keywords
test
clock
ram
memory
pseudo
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55170376A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5794997A (en
Inventor
Takashi Ihi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55170376A priority Critical patent/JPS5794997A/ja
Publication of JPS5794997A publication Critical patent/JPS5794997A/ja
Publication of JPS6132759B2 publication Critical patent/JPS6132759B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP55170376A 1980-12-03 1980-12-03 Memory test system Granted JPS5794997A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55170376A JPS5794997A (en) 1980-12-03 1980-12-03 Memory test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55170376A JPS5794997A (en) 1980-12-03 1980-12-03 Memory test system

Publications (2)

Publication Number Publication Date
JPS5794997A JPS5794997A (en) 1982-06-12
JPS6132759B2 true JPS6132759B2 (enExample) 1986-07-29

Family

ID=15903785

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55170376A Granted JPS5794997A (en) 1980-12-03 1980-12-03 Memory test system

Country Status (1)

Country Link
JP (1) JPS5794997A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03203548A (ja) * 1989-12-27 1991-09-05 Mitsubishi Electric Corp 電動機

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03203548A (ja) * 1989-12-27 1991-09-05 Mitsubishi Electric Corp 電動機

Also Published As

Publication number Publication date
JPS5794997A (en) 1982-06-12

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