JPS6132756B2 - - Google Patents

Info

Publication number
JPS6132756B2
JPS6132756B2 JP54127468A JP12746879A JPS6132756B2 JP S6132756 B2 JPS6132756 B2 JP S6132756B2 JP 54127468 A JP54127468 A JP 54127468A JP 12746879 A JP12746879 A JP 12746879A JP S6132756 B2 JPS6132756 B2 JP S6132756B2
Authority
JP
Japan
Prior art keywords
group
address information
entire
bit
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54127468A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5651678A (en
Inventor
Tsutomu Ishikawa
Kazumitsu Matsuzawa
Noboru Oonishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP12746879A priority Critical patent/JPS5651678A/ja
Publication of JPS5651678A publication Critical patent/JPS5651678A/ja
Publication of JPS6132756B2 publication Critical patent/JPS6132756B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP12746879A 1979-10-03 1979-10-03 Testing method for memory element and pattern generator for test Granted JPS5651678A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12746879A JPS5651678A (en) 1979-10-03 1979-10-03 Testing method for memory element and pattern generator for test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12746879A JPS5651678A (en) 1979-10-03 1979-10-03 Testing method for memory element and pattern generator for test

Publications (2)

Publication Number Publication Date
JPS5651678A JPS5651678A (en) 1981-05-09
JPS6132756B2 true JPS6132756B2 (en, 2012) 1986-07-29

Family

ID=14960667

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12746879A Granted JPS5651678A (en) 1979-10-03 1979-10-03 Testing method for memory element and pattern generator for test

Country Status (1)

Country Link
JP (1) JPS5651678A (en, 2012)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62172249U (en, 2012) * 1986-04-21 1987-10-31

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5814399A (ja) * 1981-07-17 1983-01-27 Yamatake Honeywell Co Ltd メモリ用アドレスバツフアの故障診断方法
US4891811A (en) * 1987-02-13 1990-01-02 International Business Machines Corporation Efficient address test for large memories
US5703818A (en) * 1996-08-26 1997-12-30 Mitsubishi Denki Kabushiki Kaisha Test circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62172249U (en, 2012) * 1986-04-21 1987-10-31

Also Published As

Publication number Publication date
JPS5651678A (en) 1981-05-09

Similar Documents

Publication Publication Date Title
US5796758A (en) Self-checking content-addressable memory and method of operation for detecting multiple selected word lines
US6104669A (en) Method and apparatus for generating memory addresses for testing memory devices
US5761213A (en) Method and apparatus to determine erroneous value in memory cells using data compression
US7506226B2 (en) System and method for more efficiently using error correction codes to facilitate memory device testing
US4782487A (en) Memory test method and apparatus
US5033048A (en) Memory selftest method and apparatus same
US4866676A (en) Testing arrangement for a DRAM with redundancy
US6286116B1 (en) Built-in test method for content addressable memories
JPS63102098A (ja) 集積回路
KR930004859A (ko) 에러 조정 및 테스트 기능을 가진 프로그램 가능 메모리 제어 방법 및 장치
US7398439B2 (en) Semiconductor device with memory and method for memory test
KR100718518B1 (ko) 반도체 기억 장치
KR20040008185A (ko) 데이터 저장장치를 테스트하기 위한 테스트 방법
US7246279B2 (en) Static random access memory (SRAM) unit and method for operating the same
JP3186359B2 (ja) 物理アドレス変換回路
JPS6132756B2 (en, 2012)
US6529428B2 (en) Multi-bit parallel testing for memory devices
WO1989009471A2 (en) Memory selftest method and apparatus
JPH02113499A (ja) メモリ試験方法
JP2642094B2 (ja) 半導体記憶装置
JP2871689B2 (ja) メモリ試験装置
JP3348632B2 (ja) 高速試験機能つきメモリ
KR100459690B1 (ko) 직접 액세스 모드 테스트를 위한 반도체 메모리장치 및 그테스트 방법
JP3021577B2 (ja) Ｒａｍのテスト回路
JPH04119434A (ja) パリティ・エラー検出装置