JPS61282939A - Online test system for distributed device - Google Patents

Abstract

PURPOSE:To test each controller in the online state by providing in addition a testing device on a bidirectional common bus and adding a test circuit part, which transmits and receives data to and from the bidirectional common bus synchronously with the testing device, to each of plural controllers. CONSTITUTION:A testing device 5 which tests the functions of controllers is connected to the bidirectional common bus 1, and each controller is provided with the test circuit part which transmits and receives data to and from the bidirectional common bus synchronously with the testing device, and specific time slots on the bidirectional common bus are used between the testing device and test circuit parts to test transmission and reception functions of controllers to the bidirectional bus. That is, the online test is performed without disconnecting controllers since transmission and reception functions of controllers are tested simultaneously with the operation of the other time slots.

Description

DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to an online test method for devices connected in a distributed manner to a bidirectional common bus.

(Prior art) Conventionally, multiple control devices are connected to a bidirectional common bus.
In a system that transmits and receives data between control devices, when testing the data transmission and reception function to the bidirectional common bus of one or more of the plurality of control devices, the bidirectional common bus is connected to the control device in advance. A test circuit for loopback was prepared in front of the bus, and during testing, the control device was disconnected from the online system and the loopback test was performed offline to test the data transmission and reception function to the bidirectional common bus.

(Problems to be Solved by the Invention) However, the above-mentioned conventional technology has the disadvantage that the control device to be tested must be separated from the online system and that signals cannot be transferred to the bidirectional common bus.

Additionally, in devices with dual bidirectional common buses, the multiple control devices connected to the bidirectional common bus are also usually duplicated; in this case, one of the bidirectional common buses is By taking some of the control devices connected to the system and one side of the bus offline, we tested the control device's ability to send and receive data to the bidirectional bus. In this case as well, there is a drawback that the control device to be tested and one system of the bidirectional common bus must be taken off-line.

The present invention aims to overcome the above-mentioned drawbacks of the prior art.

(Means for Solving the Problems) A feature of the present invention for achieving the above object is that a plurality of control devices are connected to a bidirectional common bus, and data is exchanged between the control devices via the bidirectional common bus. In an online test method for a distributed device that performs transmission and reception, a test device for testing the functions of a control device is connected to the bidirectional common bus, and each control device synchronizes with the test device to connect data to the bidirectional common bus. The control device has a test circuit unit that performs transmission and reception between the test device and the test circuit unit, and uses a specific time slot on the bidirectional common bus to transmit and receive the control device to and from the bidirectional common bus. There is an online test method for the distributed device to test the functionality.

(Function) Using a specific time slot between the test device and the control device, the transmission and reception functions of the control device are tested simultaneously with operations in other time slots.

Therefore, online testing can be performed without disconnecting the control device.

(Embodiment) FIG. 1 shows an embodiment of the present invention. 1 is a bidirectional common bus, 2, 3. 4 are control devices connected to the bidirectional common bus, and the maximum number is N (N is an integer. ) control devices are connected. 5 is a test device, 6 is a monitoring device that monitors the entire control device and distributes a basic clock, and 7 is a bus for basic clocks distributed from the monitoring device. Test data is transmitted and received between the control device (2, 3, 4) and the test device 5 via the bidirectional common bus 1.

FIG. 2 shows the test circuit part of the control device, where 10 is the control device, 11 is the basic clock bus, 12 is the primary counter, and 1
3 is a secondary counter, 14 is a bidirectional common bus, 15 is a device number, 16 is a secondary counter output, 17 is a matching circuit,
18 is an input instruction signal, 19 is a general data input instruction signal,
20 is an input gate, 21 is an internal test gate, 22 is an internal test register, 23 is an output instruction signal, 24 is an output data gate, 25 is a general data output gate, 26 is an output gate, and 27 is a general data output instruction signal. , 28 is a logical sum signal of the input instruction signal 18 and the output instruction signal 23, and 29 is general data.

The control device 10 receives the basic clock from the basic clock bus 11 and creates a primary counter 12 and a secondary counter 13. The primary counter 12 is the first barrier to data, and the secondary counter 13 is a counter that has a value equal to the maximum number of control devices connected to the bidirectional common bus 14, and one of the secondary counters 13. The time slot is bidirectional common bus 1
This is a basic time slot in which data is sent and received once on 4. Now, in the embodiment, the primary counter 12 is converted into 480 base 2.
Next counter 13 is set to 64-decimal. Primary counter 12
is designed so that each time the secondary counter 13 counts 64, the count increases by 1 and returns to 0 after 479.

The control device 10 has the primary counter 12 count from 0 to 47.
Up to 7 are used for general data transmission and reception, and count 4
78.479 will be used for testing. Also, the control device 1
0 is the device number 1 that does not overlap between each control device 10
5 is given, and the device number 15 is assigned any one of the counts of the secondary counter 13.

The secondary counter output 16 of the control device 10 is device number 1.
5 and match circuit 17, and when the values are the same, match circuit 1
7 outputs are produced. This output is ANDed with the counter value 478.479 of the primary counter 12, and when the count is 478, the bidirectional common bus 1
The input instruction signal 18 is logically summed with the normal data input instruction signal 19 to output the input instruction signal 18 for inputting the data from 4 to the control device 10. data is input to the data input terminal of the internal test register 22 through the internal test gate 21. Data is transferred to the internal test register 22 by the basic clock.

Output of matching circuit 17 and count value 4 of primary counter 12
When the AND with 79 is taken, the internal test register 22
The output instruction signal 23 outputs the data to the bidirectional common bus 14. Output instruction signal 23 is internal test register 2
The output data gate 24 of No. 2 is opened, and the output data is ORed with the data output of the general data output gate 25 and becomes the data input of the output gate 26 of the bidirectional common bus 14. The gate of the output gate 26 is opened by the logical sum of the output instruction signal 23 and the general data output instruction signal 27, and data is output to the bidirectional common bus 14.

When the general data output gate 25 receives the OR signal 28 of the input instruction signal 18 and the output instruction signal 23, the output of the output gate 25 is suppressed, and the general data 29 is not output to the bidirectional data bus 14. .

FIG. 3 mainly shows the internal circuit of the test equipment, 40 is the test equipment, 41 is the monitoring device, 42 is the basic clock, 43 is the primary counter, 44 is the secondary counter, 45 is the transmission gate, 4
6 is a bidirectional common bus, 47 is test data, 48 is comparison data, 49 is a receiving gate, 50 is a mounted/unmounted table, 51 is mounted/unmounted output data, 52 is a test gate,
53 is a coincidence circuit, and 54 is error information. Here the second
Bidirectional common bus 14 in the figure represents a bidirectional common bus identical to 46 in FIG. The test device 40 receives the basic clock 42 from the monitoring device 41 and creates a primary counter 43 and a secondary counter 44.

Basic clock 42. Primary counter 43. Secondary counter 4
4 is a basic clock of the control device 10, and a primary counter 12.4.
Each operates in synchronization with the secondary counter 13. Therefore, when the counter value of the primary counter 12 of the control device 10 is 0, and the counter value of the secondary counter 13 is 0, the counter value of the primary counter 43 and the counter value of the 2nd counter 44 of the test device 40 are also 0. . Primary counter 43 of test device 40
When the counter value is 478, the transmission gate 45 is enabled,
Test data 47 is output to the bidirectional common bus 46. The test data 47 includes the secondary counter outputs 0 to 63 of the secondary counter 44 (6 bits from 2" to 2!) and the ground signal (2G
, 2? It consists of 9 bits: 2 bits of 2") and a parity pit (1 bit of 2"). Also, the 8 bits from the test data 47 excluding the parity pit are separately input to the reception matching circuit 53 as comparison data 48. Ru.

When the counter value of the primary counter 43 is 479, the reception gate 49 of the bidirectional common bus 46 is opened, and the bidirectional common bus 4
6, and the counter output value of the secondary counter 44 is sequentially sent to the monitoring device 41.

The monitoring device 41 has a mounted/unmounted table 50 for the control device [10]. During mounting, the output data 51 of the mounted/unmounted table is enabled, and the received data input through the receiving gate 49 is sent to the test gate 52. Through the matching circuit 53
Enter. The matching circuit 53 compares the data input through the test gate 52 with the comparison data 48, and if they do not match, sends error information 54 to the monitoring device 41. The monitoring device 41 uses the error information 54 and the value of the secondary counter 44,
It is possible to know from which control device 10 the data was defective.

(Effects of the Invention) As explained above, the present invention provides a test device exclusively for testing on a bidirectional common bus, and also provides a test device for each of a plurality of control devices connected to the bidirectional common bus in synchronization with the test device. By adding a test circuit section that transmits and receives data to and from a bidirectional common bus, there is an advantage that each control device can be tested in an online state. Therefore, a control device that transmits and receives data to and from the bidirectional common bus intermittently, a control device that cannot confirm the normality of data transmission and reception due to a temporary backup, and a bidirectional common bus on the temporary backup side of a duplicated bidirectional common bus. Detection of abnormalities in the data transmission/reception part of the control device that has an interface can be quickly performed online.

[Brief explanation of the drawing]

FIG. 1 is a schematic block diagram of an embodiment of the invention. FIG. 2 is a diagram showing the test circuit portion of the control device connected to the bidirectional common bus, and FIG. 3 is an internal schematic diagram of the test device. 1; Bidirectional common bus, 2, 3, 4; Control device, 5;
Test equipment, 6; Monitoring equipment. 7; Basic clock bus. Figure 1 Figure 2 Figure 3

Claims (1)

[Claims] In an online test method for a distributed device in which a plurality of control devices are connected to a bidirectional common bus and data is sent and received between the control devices via the bidirectional common bus, the functions of the control devices are connected to the bidirectional common bus. A test device to be tested is connected to the control device, and each control device has a test circuit unit that transmits and receives data to and from a bidirectional common bus in synchronization with the test device;
A distributed device that tests the transmitting/receiving function of a control device to and from a bidirectional common bus by using a specific time slot on the bidirectional common bus between the test device and the test circuit section. online test method.