JPS61270676A - 集積回路試験装置 - Google Patents

集積回路試験装置

Info

Publication number
JPS61270676A
JPS61270676A JP60111613A JP11161385A JPS61270676A JP S61270676 A JPS61270676 A JP S61270676A JP 60111613 A JP60111613 A JP 60111613A JP 11161385 A JP11161385 A JP 11161385A JP S61270676 A JPS61270676 A JP S61270676A
Authority
JP
Japan
Prior art keywords
test
clock signal
circuits
circuit
frequency division
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60111613A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0558143B2 (enrdf_load_stackoverflow
Inventor
Naoto Sakagami
坂上　直人
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP60111613A priority Critical patent/JPS61270676A/ja
Publication of JPS61270676A publication Critical patent/JPS61270676A/ja
Publication of JPH0558143B2 publication Critical patent/JPH0558143B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP60111613A 1985-05-24 1985-05-24 集積回路試験装置 Granted JPS61270676A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60111613A JPS61270676A (ja) 1985-05-24 1985-05-24 集積回路試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60111613A JPS61270676A (ja) 1985-05-24 1985-05-24 集積回路試験装置

Publications (2)

Publication Number Publication Date
JPS61270676A true JPS61270676A (ja) 1986-11-29
JPH0558143B2 JPH0558143B2 (enrdf_load_stackoverflow) 1993-08-25

Family

ID=14565772

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60111613A Granted JPS61270676A (ja) 1985-05-24 1985-05-24 集積回路試験装置

Country Status (1)

Country Link
JP (1) JPS61270676A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH0558143B2 (enrdf_load_stackoverflow) 1993-08-25

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