JPS61254812A - 非磁性体シ−ト厚さ連続測定装置 - Google Patents

非磁性体シ−ト厚さ連続測定装置

Info

Publication number
JPS61254812A
JPS61254812A JP9735285A JP9735285A JPS61254812A JP S61254812 A JPS61254812 A JP S61254812A JP 9735285 A JP9735285 A JP 9735285A JP 9735285 A JP9735285 A JP 9735285A JP S61254812 A JPS61254812 A JP S61254812A
Authority
JP
Japan
Prior art keywords
magnetic
sheet
displacement meter
measured
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9735285A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0460528B2 (enrdf_load_stackoverflow
Inventor
Shigeru Ichikawa
茂 市川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meisan Co Ltd
Original Assignee
Meisan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meisan Co Ltd filed Critical Meisan Co Ltd
Priority to JP9735285A priority Critical patent/JPS61254812A/ja
Publication of JPS61254812A publication Critical patent/JPS61254812A/ja
Publication of JPH0460528B2 publication Critical patent/JPH0460528B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/107—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP9735285A 1985-05-08 1985-05-08 非磁性体シ−ト厚さ連続測定装置 Granted JPS61254812A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9735285A JPS61254812A (ja) 1985-05-08 1985-05-08 非磁性体シ−ト厚さ連続測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9735285A JPS61254812A (ja) 1985-05-08 1985-05-08 非磁性体シ−ト厚さ連続測定装置

Publications (2)

Publication Number Publication Date
JPS61254812A true JPS61254812A (ja) 1986-11-12
JPH0460528B2 JPH0460528B2 (enrdf_load_stackoverflow) 1992-09-28

Family

ID=14190093

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9735285A Granted JPS61254812A (ja) 1985-05-08 1985-05-08 非磁性体シ−ト厚さ連続測定装置

Country Status (1)

Country Link
JP (1) JPS61254812A (enrdf_load_stackoverflow)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63169513A (ja) * 1987-01-08 1988-07-13 Asahi Okuma Ind Co Ltd 塗膜厚測定装置
JPS63222211A (ja) * 1987-03-11 1988-09-16 Oki Electric Ind Co Ltd 砂撤船における砂厚計測方式
JPS646710A (en) * 1987-06-29 1989-01-11 Sekisui Plastics Measuring apparatus for sheet thickness
JPS6415107U (enrdf_load_stackoverflow) * 1987-07-16 1989-01-25
JPH0158110U (enrdf_load_stackoverflow) * 1987-10-07 1989-04-11
JPH01143908A (ja) * 1987-11-30 1989-06-06 Shinetsu Eng Kk 薄膜厚測定器
JPH01189511A (ja) * 1988-01-25 1989-07-28 Meisan Kk 非磁性体シート厚さ測定装置
EP0607938A1 (en) * 1993-01-22 1994-07-27 Electronic Systems S.P.A. Method and apparatus comprising two magnetic sensors and one laser meter for measuring the thickness of a film

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5897603A (ja) * 1981-12-07 1983-06-10 Omron Tateisi Electronics Co 紙葉類の厚み検出装置
JPS58189505A (ja) * 1982-04-30 1983-11-05 Hitachi Ltd 塗膜厚測定装置
JPS6055221A (ja) * 1983-09-06 1985-03-30 Anritsu Corp 走間厚み計

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5897603A (ja) * 1981-12-07 1983-06-10 Omron Tateisi Electronics Co 紙葉類の厚み検出装置
JPS58189505A (ja) * 1982-04-30 1983-11-05 Hitachi Ltd 塗膜厚測定装置
JPS6055221A (ja) * 1983-09-06 1985-03-30 Anritsu Corp 走間厚み計

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63169513A (ja) * 1987-01-08 1988-07-13 Asahi Okuma Ind Co Ltd 塗膜厚測定装置
JPS63222211A (ja) * 1987-03-11 1988-09-16 Oki Electric Ind Co Ltd 砂撤船における砂厚計測方式
JPS646710A (en) * 1987-06-29 1989-01-11 Sekisui Plastics Measuring apparatus for sheet thickness
JPS6415107U (enrdf_load_stackoverflow) * 1987-07-16 1989-01-25
JPH0158110U (enrdf_load_stackoverflow) * 1987-10-07 1989-04-11
JPH01143908A (ja) * 1987-11-30 1989-06-06 Shinetsu Eng Kk 薄膜厚測定器
JPH01189511A (ja) * 1988-01-25 1989-07-28 Meisan Kk 非磁性体シート厚さ測定装置
EP0607938A1 (en) * 1993-01-22 1994-07-27 Electronic Systems S.P.A. Method and apparatus comprising two magnetic sensors and one laser meter for measuring the thickness of a film

Also Published As

Publication number Publication date
JPH0460528B2 (enrdf_load_stackoverflow) 1992-09-28

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Legal Events

Date Code Title Description
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