JPS6122500A - Ｉｃ試験装置 - Google Patents

Ｉｃ試験装置

Info

Publication number
JPS6122500A
JPS6122500A JP59141677A JP14167784A JPS6122500A JP S6122500 A JPS6122500 A JP S6122500A JP 59141677 A JP59141677 A JP 59141677A JP 14167784 A JP14167784 A JP 14167784A JP S6122500 A JPS6122500 A JP S6122500A
Authority
JP
Japan
Prior art keywords
output
access time
test
logic
under test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59141677A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0325880B2 (enrdf_load_stackoverflow
Inventor
Junji Nishiura
西浦　淳治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP59141677A priority Critical patent/JPS6122500A/ja
Publication of JPS6122500A publication Critical patent/JPS6122500A/ja
Publication of JPH0325880B2 publication Critical patent/JPH0325880B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP59141677A 1984-07-09 1984-07-09 Ｉｃ試験装置 Granted JPS6122500A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59141677A JPS6122500A (ja) 1984-07-09 1984-07-09 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59141677A JPS6122500A (ja) 1984-07-09 1984-07-09 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPS6122500A true JPS6122500A (ja) 1986-01-31
JPH0325880B2 JPH0325880B2 (enrdf_load_stackoverflow) 1991-04-09

Family

ID=15297630

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59141677A Granted JPS6122500A (ja) 1984-07-09 1984-07-09 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JPS6122500A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6378400A (ja) * 1986-09-19 1988-04-08 Fujitsu Ltd Ｒａｍ試験方式
JPH0210278A (ja) * 1988-03-17 1990-01-16 Internatl Business Mach Corp <Ibm> マクロのアクセス時間をテストするための装置と方法
JP2001356153A (ja) * 2000-06-14 2001-12-26 Advantest Corp 半導体デバイス試験方法・半導体デバイス試験装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59124100A (ja) * 1982-12-29 1984-07-18 Fujitsu Ltd アクセスタイム測定装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59124100A (ja) * 1982-12-29 1984-07-18 Fujitsu Ltd アクセスタイム測定装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6378400A (ja) * 1986-09-19 1988-04-08 Fujitsu Ltd Ｒａｍ試験方式
JPH0210278A (ja) * 1988-03-17 1990-01-16 Internatl Business Mach Corp <Ibm> マクロのアクセス時間をテストするための装置と方法
JP2001356153A (ja) * 2000-06-14 2001-12-26 Advantest Corp 半導体デバイス試験方法・半導体デバイス試験装置

Also Published As

Publication number Publication date
JPH0325880B2 (enrdf_load_stackoverflow) 1991-04-09

Similar Documents

Publication Publication Date Title
US4555663A (en) Test pattern generating apparatus
US7002334B2 (en) Jitter measuring apparatus and a testing apparatus
US7260493B2 (en) Testing a device under test by sampling its clock and data signal
JPH01138477A (ja) 回路試験装置
US6128754A (en) Tester having event generation circuit for acquiring waveform by supplying strobe events for waveform acquisition rather than using strobe events specified by the test program
US6865698B2 (en) Method and apparatus for testing semiconductor devices
JPH027530B2 (enrdf_load_stackoverflow)
JPS6122500A (ja) Ｉｃ試験装置
JP2985056B2 (ja) Ｉｃ試験装置
JP3378647B2 (ja) 半導体試験装置の論理比較回路
US6768954B2 (en) Jitter quantity calculator and tester
JP2002202350A (ja) 半導体試験装置
JP2620072B2 (ja) 論理回路試験装置
JP3060580B2 (ja) メモリ搭載パッケージの検査装置
JP3519329B2 (ja) 半導体試験装置
JP2651178B2 (ja) Ｉｃカード試験装置
JP2769588B2 (ja) Ｉｃ試験装置内のデータ出力タイミング同期方式
JPH0587888A (ja) 集積回路の検査装置
JP2002062322A (ja) パルス信号検査装置
JPH0989998A (ja) 不良解析装置
JPH05297067A (ja) Ｌｓｉテスタ
JPH0293383A (ja) パターン発生器
JPS6385377A (ja) 半導体メモリ評価装置
JPH0520897A (ja) メモリ集積回路の検査装置
JPS62293600A (ja) Ｐｒｏｍ検査装置