JPS61223507A - 圧延コントロール用放射線透過式厚さ計の校正方法 - Google Patents

圧延コントロール用放射線透過式厚さ計の校正方法

Info

Publication number
JPS61223507A
JPS61223507A JP60063220A JP6322085A JPS61223507A JP S61223507 A JPS61223507 A JP S61223507A JP 60063220 A JP60063220 A JP 60063220A JP 6322085 A JP6322085 A JP 6322085A JP S61223507 A JPS61223507 A JP S61223507A
Authority
JP
Japan
Prior art keywords
thickness
sample
radiation
radiographic
rolling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60063220A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0443207B2 (enExample
Inventor
Asao Monno
門野　浅雄
Sakae Tezuka
手塚　栄
Jiro Katayama
二郎 片山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd, Kawasaki Steel Corp filed Critical Fuji Electric Co Ltd
Priority to JP60063220A priority Critical patent/JPS61223507A/ja
Publication of JPS61223507A publication Critical patent/JPS61223507A/ja
Publication of JPH0443207B2 publication Critical patent/JPH0443207B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
JP60063220A 1985-03-29 1985-03-29 圧延コントロール用放射線透過式厚さ計の校正方法 Granted JPS61223507A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60063220A JPS61223507A (ja) 1985-03-29 1985-03-29 圧延コントロール用放射線透過式厚さ計の校正方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60063220A JPS61223507A (ja) 1985-03-29 1985-03-29 圧延コントロール用放射線透過式厚さ計の校正方法

Publications (2)

Publication Number Publication Date
JPS61223507A true JPS61223507A (ja) 1986-10-04
JPH0443207B2 JPH0443207B2 (enExample) 1992-07-15

Family

ID=13222906

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60063220A Granted JPS61223507A (ja) 1985-03-29 1985-03-29 圧延コントロール用放射線透過式厚さ計の校正方法

Country Status (1)

Country Link
JP (1) JPS61223507A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6437689U (enExample) * 1987-08-31 1989-03-07
JP2012247314A (ja) * 2011-05-27 2012-12-13 Jfe Steel Corp バックリング検査装置の評価装置及びバックリング検査装置の評価方法
WO2024032986A1 (de) * 2022-08-08 2024-02-15 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Kalibriervorrichtung für ein messgerät sowie verfahren zur kalibrierung eines messgeräts

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53126960A (en) * 1977-04-13 1978-11-06 Hitachi Ltd Radiation thickness gauge
JPS5450359A (en) * 1977-09-29 1979-04-20 Toshiba Corp Radiation thickness gauge
JPS58158511A (ja) * 1982-03-17 1983-09-20 Toshiba Corp 厚み校正装置
JPS58193208U (ja) * 1982-06-18 1983-12-22 株式会社日立製作所 放射線応用計器の温度調節装置
JPS5919804A (ja) * 1982-07-26 1984-02-01 Hitachi Ltd 放射線厚さ計のオンライン自動校正装置
JPS5954913A (ja) * 1982-09-22 1984-03-29 Sumitomo Metal Ind Ltd 放射線厚み計の校正方法及びその治具

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53126960A (en) * 1977-04-13 1978-11-06 Hitachi Ltd Radiation thickness gauge
JPS5450359A (en) * 1977-09-29 1979-04-20 Toshiba Corp Radiation thickness gauge
JPS58158511A (ja) * 1982-03-17 1983-09-20 Toshiba Corp 厚み校正装置
JPS58193208U (ja) * 1982-06-18 1983-12-22 株式会社日立製作所 放射線応用計器の温度調節装置
JPS5919804A (ja) * 1982-07-26 1984-02-01 Hitachi Ltd 放射線厚さ計のオンライン自動校正装置
JPS5954913A (ja) * 1982-09-22 1984-03-29 Sumitomo Metal Ind Ltd 放射線厚み計の校正方法及びその治具

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6437689U (enExample) * 1987-08-31 1989-03-07
JP2012247314A (ja) * 2011-05-27 2012-12-13 Jfe Steel Corp バックリング検査装置の評価装置及びバックリング検査装置の評価方法
WO2024032986A1 (de) * 2022-08-08 2024-02-15 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Kalibriervorrichtung für ein messgerät sowie verfahren zur kalibrierung eines messgeräts

Also Published As

Publication number Publication date
JPH0443207B2 (enExample) 1992-07-15

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees