JPH0443207B2 - - Google Patents

Info

Publication number
JPH0443207B2
JPH0443207B2 JP60063220A JP6322085A JPH0443207B2 JP H0443207 B2 JPH0443207 B2 JP H0443207B2 JP 60063220 A JP60063220 A JP 60063220A JP 6322085 A JP6322085 A JP 6322085A JP H0443207 B2 JPH0443207 B2 JP H0443207B2
Authority
JP
Japan
Prior art keywords
thickness
sample
radiation
scale
primary calibration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60063220A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61223507A (ja
Inventor
Asao Monno
Sakae Tezuka
Jiro Katayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd, Kawasaki Steel Corp filed Critical Fuji Electric Co Ltd
Priority to JP60063220A priority Critical patent/JPS61223507A/ja
Publication of JPS61223507A publication Critical patent/JPS61223507A/ja
Publication of JPH0443207B2 publication Critical patent/JPH0443207B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP60063220A 1985-03-29 1985-03-29 圧延コントロール用放射線透過式厚さ計の校正方法 Granted JPS61223507A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60063220A JPS61223507A (ja) 1985-03-29 1985-03-29 圧延コントロール用放射線透過式厚さ計の校正方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60063220A JPS61223507A (ja) 1985-03-29 1985-03-29 圧延コントロール用放射線透過式厚さ計の校正方法

Publications (2)

Publication Number Publication Date
JPS61223507A JPS61223507A (ja) 1986-10-04
JPH0443207B2 true JPH0443207B2 (enExample) 1992-07-15

Family

ID=13222906

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60063220A Granted JPS61223507A (ja) 1985-03-29 1985-03-29 圧延コントロール用放射線透過式厚さ計の校正方法

Country Status (1)

Country Link
JP (1) JPS61223507A (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6437689U (enExample) * 1987-08-31 1989-03-07
JP5760698B2 (ja) * 2011-05-27 2015-08-12 Ｊｆｅスチール株式会社 バックリング検査装置の評価装置及びバックリング検査装置の評価方法
DE102022119877A1 (de) * 2022-08-08 2024-02-08 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Kalibriervorrichtung für ein Messgerät sowie Verfahren zur Kalibrierung eines Messgeräts

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53126960A (en) * 1977-04-13 1978-11-06 Hitachi Ltd Radiation thickness gauge
JPS5450359A (en) * 1977-09-29 1979-04-20 Toshiba Corp Radiation thickness gauge
JPS58158511A (ja) * 1982-03-17 1983-09-20 Toshiba Corp 厚み校正装置
JPS58193208U (ja) * 1982-06-18 1983-12-22 株式会社日立製作所 放射線応用計器の温度調節装置
JPS5919804A (ja) * 1982-07-26 1984-02-01 Hitachi Ltd 放射線厚さ計のオンライン自動校正装置
JPS5954913A (ja) * 1982-09-22 1984-03-29 Sumitomo Metal Ind Ltd 放射線厚み計の校正方法及びその治具

Also Published As

Publication number Publication date
JPS61223507A (ja) 1986-10-04

Similar Documents

Publication Publication Date Title
US6041098A (en) X-ray reflectometer
US5420427A (en) Mobile, multi-mode apparatus and method for nondestructively inspecting components of an operating system
US4172383A (en) Method and an apparatus for simultaneous measurement of both temperature and emissivity of a heated material
US20200088651A1 (en) Optical devices for calibrating, and for analyzing the quality of a glazing, and methods
US5351203A (en) Online tomographic gauging of sheet metal
EP0250764B1 (en) Film thickness measuring method and device therefor
US5867275A (en) Method and apparatus for high speed measurement of oilfield tubular diameter and ovality
US20170356862A1 (en) Measurement chamber for a compact goniometer in an x-ray spectrometer
JPH0443207B2 (enExample)
JPH0643888B2 (ja) 厚さ監視装置
JP2001289627A (ja) 厚み測定装置
US3099744A (en) Apparatus for measuring the height and contour of material
US4998269A (en) Device for on-line measurement of the gamma radiation emitted by the water in a nuclear reactor circuit, in particular the primary cooling circuit of a pressurized water nuclear reactor
GB2265002A (en) Variable gamma ray collimator for fuel element measurements
US4495633A (en) Process and apparatus for the dimensional and non-destructive control of a hollow member
Astvatsatourov et al. The H1 very forward proton spectrometer at HERA
US3593427A (en) Apparatus for determining a dimension of a member
JP3847913B2 (ja) 結晶方位決定装置
JPH08128807A (ja) 圧延機のロール変位測定方法及びその装置
Kirk Experimental features of residual stress measurement by X‐ray diffractometry
KR100916237B1 (ko) 방사선을 이용한 호퍼의 3차원 측정 시스템
EP4411341B1 (en) Pole piece quality test method and apparatus, coating method and apparatus, and device, system and medium
JPS5815847Y2 (ja) ホウシヤセンアツサソクテイソウチ
KR200212622Y1 (ko) 강판두께 측정장치용 교정장치
CN110500144A (zh) 汽轮机转子膨胀量测量装置及测量方法

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees