JPS61213650A - 光学的測定装置 - Google Patents

光学的測定装置

Info

Publication number
JPS61213650A
JPS61213650A JP5538085A JP5538085A JPS61213650A JP S61213650 A JPS61213650 A JP S61213650A JP 5538085 A JP5538085 A JP 5538085A JP 5538085 A JP5538085 A JP 5538085A JP S61213650 A JPS61213650 A JP S61213650A
Authority
JP
Japan
Prior art keywords
temperature
detector
measuring device
spectral sensitivity
function
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5538085A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0464417B2 (en, 2012
Inventor
Kosei Aikawa
相川　孝生
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chino Corp
Original Assignee
Chino Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chino Works Ltd filed Critical Chino Works Ltd
Priority to JP5538085A priority Critical patent/JPS61213650A/ja
Publication of JPS61213650A publication Critical patent/JPS61213650A/ja
Publication of JPH0464417B2 publication Critical patent/JPH0464417B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP5538085A 1985-03-19 1985-03-19 光学的測定装置 Granted JPS61213650A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5538085A JPS61213650A (ja) 1985-03-19 1985-03-19 光学的測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5538085A JPS61213650A (ja) 1985-03-19 1985-03-19 光学的測定装置

Publications (2)

Publication Number Publication Date
JPS61213650A true JPS61213650A (ja) 1986-09-22
JPH0464417B2 JPH0464417B2 (en, 2012) 1992-10-14

Family

ID=12996881

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5538085A Granted JPS61213650A (ja) 1985-03-19 1985-03-19 光学的測定装置

Country Status (1)

Country Link
JP (1) JPS61213650A (en, 2012)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0194229A (ja) * 1987-10-06 1989-04-12 Jeol Ltd 赤外放射分光測定装置
JPH01193627A (ja) * 1988-01-28 1989-08-03 Toshiba Tesuko Kk 光学水分計
JPH0674824A (ja) * 1992-08-25 1994-03-18 Mitsubishi Electric Corp 光スペクトラムアナライザ
US5312531A (en) * 1990-10-09 1994-05-17 Nippon Steel Corporation Process for manufacturing galvanized steel sheet by nickel pre-coating method
WO2010049116A1 (de) * 2008-10-31 2010-05-06 Carl Zeiss Microimaging Gmbh Spektrometrische anordnung und verfahren zum ermitteln eines temperaturwerts für einen detektor eines spektrometers
WO2023091709A3 (en) * 2021-11-18 2023-07-27 Si-Ware Systems On-line compensation of instrumental response drift in miniaturized spectrometers
WO2024013310A1 (en) 2022-07-14 2024-01-18 Trinamix Gmbh Temperature drift compensation of photoresistors
WO2024013293A1 (en) 2022-07-14 2024-01-18 Trinamix Gmbh Detector with temperature drift compensation
WO2024013299A1 (en) 2022-07-14 2024-01-18 Trinamix Gmbh Background-based correction of photodetector drift

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5235658A (en) * 1975-09-12 1977-03-18 Kyocera Corp Measuring circuit
JPS5396883A (en) * 1977-02-02 1978-08-24 Ritsuo Hasumi Laser ray output meter with sensibility correcting function

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5235658A (en) * 1975-09-12 1977-03-18 Kyocera Corp Measuring circuit
JPS5396883A (en) * 1977-02-02 1978-08-24 Ritsuo Hasumi Laser ray output meter with sensibility correcting function

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0194229A (ja) * 1987-10-06 1989-04-12 Jeol Ltd 赤外放射分光測定装置
JPH01193627A (ja) * 1988-01-28 1989-08-03 Toshiba Tesuko Kk 光学水分計
US5312531A (en) * 1990-10-09 1994-05-17 Nippon Steel Corporation Process for manufacturing galvanized steel sheet by nickel pre-coating method
JPH0674824A (ja) * 1992-08-25 1994-03-18 Mitsubishi Electric Corp 光スペクトラムアナライザ
WO2010049116A1 (de) * 2008-10-31 2010-05-06 Carl Zeiss Microimaging Gmbh Spektrometrische anordnung und verfahren zum ermitteln eines temperaturwerts für einen detektor eines spektrometers
WO2023091709A3 (en) * 2021-11-18 2023-07-27 Si-Ware Systems On-line compensation of instrumental response drift in miniaturized spectrometers
WO2024013310A1 (en) 2022-07-14 2024-01-18 Trinamix Gmbh Temperature drift compensation of photoresistors
WO2024013293A1 (en) 2022-07-14 2024-01-18 Trinamix Gmbh Detector with temperature drift compensation
WO2024013299A1 (en) 2022-07-14 2024-01-18 Trinamix Gmbh Background-based correction of photodetector drift

Also Published As

Publication number Publication date
JPH0464417B2 (en, 2012) 1992-10-14

Similar Documents

Publication Publication Date Title
US5777899A (en) Horizontal position error correction mechanism for electronic level
JPS61213650A (ja) 光学的測定装置
RU2090976C1 (ru) Тепловизор
JPH03115838A (ja) 赤外線による水分測定方法
JPH0882598A (ja) 水分計
JPS6350703A (ja) 膜厚測定装置
JPS6035229A (ja) 放射温度計
JPS6161623B2 (en, 2012)
JP3333971B2 (ja) 遮光機構付き電子レベル
JPS63243822A (ja) アレイ型検出器のデ−タ処理方法
SU1103092A1 (ru) Оптико-электронное устройство дл измерени температуры
JPS6355426A (ja) 放射温度計
JPH06100541B2 (ja) 光学的測定装置
JPH0249648B2 (en, 2012)
JP2632236B2 (ja) 光干渉角速度計
JPH0543963B2 (en, 2012)
JPH0367135A (ja) 放射温度計
JPH01131405A (ja) 膜厚測定装置
JPH08136453A (ja) 水分計
JPS6350705A (ja) 膜厚測定装置
SU1569531A1 (ru) Оптико-электронный датчик углового рассогласовани
SU1732189A1 (ru) Способ определени температуры
JPS63109304A (ja) 膜厚測定装置
JPH0531732B2 (en, 2012)
JPH0882596A (ja) 水分計