JPS61154314A - 書込可能な論理回路装置 - Google Patents

書込可能な論理回路装置

Info

Publication number
JPS61154314A
JPS61154314A JP59273869A JP27386984A JPS61154314A JP S61154314 A JPS61154314 A JP S61154314A JP 59273869 A JP59273869 A JP 59273869A JP 27386984 A JP27386984 A JP 27386984A JP S61154314 A JPS61154314 A JP S61154314A
Authority
JP
Japan
Prior art keywords
test
array
circuit device
logic circuit
wiring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59273869A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0573088B2 (enrdf_load_stackoverflow
Inventor
Koichi Fujii
浩一 藤井
Akira Takada
明 高田
Zenji Oka
岡　善治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP59273869A priority Critical patent/JPS61154314A/ja
Publication of JPS61154314A publication Critical patent/JPS61154314A/ja
Publication of JPH0573088B2 publication Critical patent/JPH0573088B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Logic Circuits (AREA)
JP59273869A 1984-12-27 1984-12-27 書込可能な論理回路装置 Granted JPS61154314A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59273869A JPS61154314A (ja) 1984-12-27 1984-12-27 書込可能な論理回路装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59273869A JPS61154314A (ja) 1984-12-27 1984-12-27 書込可能な論理回路装置

Publications (2)

Publication Number Publication Date
JPS61154314A true JPS61154314A (ja) 1986-07-14
JPH0573088B2 JPH0573088B2 (enrdf_load_stackoverflow) 1993-10-13

Family

ID=17533693

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59273869A Granted JPS61154314A (ja) 1984-12-27 1984-12-27 書込可能な論理回路装置

Country Status (1)

Country Link
JP (1) JPS61154314A (enrdf_load_stackoverflow)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55127732A (en) * 1979-03-24 1980-10-02 Mitsubishi Electric Corp Program logic array circuit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55127732A (en) * 1979-03-24 1980-10-02 Mitsubishi Electric Corp Program logic array circuit

Also Published As

Publication number Publication date
JPH0573088B2 (enrdf_load_stackoverflow) 1993-10-13

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term