JPS61131050A - メモリエラ−処理方式 - Google Patents
メモリエラ−処理方式Info
- Publication number
- JPS61131050A JPS61131050A JP59253566A JP25356684A JPS61131050A JP S61131050 A JPS61131050 A JP S61131050A JP 59253566 A JP59253566 A JP 59253566A JP 25356684 A JP25356684 A JP 25356684A JP S61131050 A JPS61131050 A JP S61131050A
- Authority
- JP
- Japan
- Prior art keywords
- error
- detected
- word
- section
- counter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
- Debugging And Monitoring (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59253566A JPS61131050A (ja) | 1984-11-29 | 1984-11-29 | メモリエラ−処理方式 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59253566A JPS61131050A (ja) | 1984-11-29 | 1984-11-29 | メモリエラ−処理方式 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61131050A true JPS61131050A (ja) | 1986-06-18 |
| JPH0374422B2 JPH0374422B2 (cg-RX-API-DMAC7.html) | 1991-11-26 |
Family
ID=17253148
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59253566A Granted JPS61131050A (ja) | 1984-11-29 | 1984-11-29 | メモリエラ−処理方式 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61131050A (cg-RX-API-DMAC7.html) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63103150U (cg-RX-API-DMAC7.html) * | 1986-12-22 | 1988-07-04 | ||
| JP2014059946A (ja) * | 2012-09-15 | 2014-04-03 | Lsi Corp | 不揮発性メモリの耐久性平準化のためのセル損傷の測定 |
| US9043663B2 (en) | 2012-06-07 | 2015-05-26 | Fujitsu Limited | Apparatus and method for testing a memory |
-
1984
- 1984-11-29 JP JP59253566A patent/JPS61131050A/ja active Granted
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63103150U (cg-RX-API-DMAC7.html) * | 1986-12-22 | 1988-07-04 | ||
| US9043663B2 (en) | 2012-06-07 | 2015-05-26 | Fujitsu Limited | Apparatus and method for testing a memory |
| JP2014059946A (ja) * | 2012-09-15 | 2014-04-03 | Lsi Corp | 不揮発性メモリの耐久性平準化のためのセル損傷の測定 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0374422B2 (cg-RX-API-DMAC7.html) | 1991-11-26 |
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