JPS61107149A - 導電性材料製の装置の電気的連続性をインピーダンスを測定することにより検査する方法と装置 - Google Patents

導電性材料製の装置の電気的連続性をインピーダンスを測定することにより検査する方法と装置

Info

Publication number
JPS61107149A
JPS61107149A JP60236241A JP23624185A JPS61107149A JP S61107149 A JPS61107149 A JP S61107149A JP 60236241 A JP60236241 A JP 60236241A JP 23624185 A JP23624185 A JP 23624185A JP S61107149 A JPS61107149 A JP S61107149A
Authority
JP
Japan
Prior art keywords
current
conductive material
electrical continuity
points
contact electrodes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60236241A
Other languages
English (en)
Japanese (ja)
Inventor
ピエール　ヴイクトール　アンドレ　ライツト
ミシエル　ジヨゼフ　レイモン
ジヤン‐ポール　ケゼ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NATL IND AEROSPAT SOC
SOC NATL IND AEROSPAT
Original Assignee
NATL IND AEROSPAT SOC
SOC NATL IND AEROSPAT
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NATL IND AEROSPAT SOC, SOC NATL IND AEROSPAT filed Critical NATL IND AEROSPAT SOC
Publication of JPS61107149A publication Critical patent/JPS61107149A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/20—Investigating the presence of flaws

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Sorting Of Articles (AREA)
JP60236241A 1984-10-22 1985-10-22 導電性材料製の装置の電気的連続性をインピーダンスを測定することにより検査する方法と装置 Pending JPS61107149A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8416138 1984-10-22
FR8416138A FR2572183B1 (fr) 1984-10-22 1984-10-22 Procede et appareil pour la verification par mesure d'impedance de la continuite electrique d'un dispositif de matiere electriquement conductrice

Publications (1)

Publication Number Publication Date
JPS61107149A true JPS61107149A (ja) 1986-05-26

Family

ID=9308877

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60236241A Pending JPS61107149A (ja) 1984-10-22 1985-10-22 導電性材料製の装置の電気的連続性をインピーダンスを測定することにより検査する方法と装置

Country Status (9)

Country Link
US (1) US5115200A (enExample)
EP (1) EP0179705B1 (enExample)
JP (1) JPS61107149A (enExample)
AT (1) ATE40751T1 (enExample)
CA (1) CA1257904A (enExample)
DE (1) DE3568220D1 (enExample)
ES (1) ES8701987A1 (enExample)
FR (1) FR2572183B1 (enExample)
IN (1) IN163306B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002014132A (ja) * 2000-06-29 2002-01-18 Hioki Ee Corp 回路基板検査装置

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FR2710413B1 (fr) * 1993-09-21 1995-11-03 Asulab Sa Dispositif de mesure pour capteurs amovibles.
US5644242A (en) * 1995-06-21 1997-07-01 Fisher; James Allan Armature winding and winding connection test methods
US6822463B1 (en) 2001-12-21 2004-11-23 Lecroy Corporation Active differential test probe with a transmission line input structure
US6828768B2 (en) * 2002-04-16 2004-12-07 Agilent Technologies, Inc. Systems and methods for wideband differential probing of variably spaced probe points
GB2417091A (en) * 2004-08-03 2006-02-15 Advanced Analysis And Integrat Aircraft test and measuring instruments
US7811728B2 (en) * 2006-12-01 2010-10-12 Xerox Corporation Imaging members and process for preparing same
KR101188288B1 (ko) * 2007-09-18 2012-10-05 삼성전자주식회사 반도체 소자 검사 장치
DE102008043103A1 (de) * 2008-10-22 2010-04-29 Alstrom Technology Ltd. Vorrichtung und Verfahren zur Überwachung und/oder Analyse von Rotoren von elektrischen Maschinen im Betrieb
EP3736578B1 (en) 2011-09-12 2025-03-05 Analog Devices International Unlimited Company Current measurement
US9151818B2 (en) * 2011-11-08 2015-10-06 Analog Devices Global Voltage measurement
GB201120295D0 (en) 2011-11-24 2012-01-04 Metroic Ltd Current measurement apparatus
KR102090578B1 (ko) * 2013-05-06 2020-03-19 삼성디스플레이 주식회사 전자 장치의 기판, 이를 포함하는 전자 장치 및 접속부의 저항 측정 방법
US11549797B2 (en) * 2018-10-26 2023-01-10 Deere & Company Device for detecting wear of replaceable components
CN118348436B (zh) * 2024-06-18 2024-09-03 青岛艾诺仪器有限公司 交流阻抗测量的激励源装置及控制方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE285536C (enExample) *
FR771305A (fr) * 1934-06-27 1934-10-04 Procédé pour la vérification de la qualité des soudures et appareils pour la mise en ceuvre de ce procédé
US2401917A (en) * 1944-03-14 1946-06-11 Sperry Prod Inc Shell banding tester
GB1169711A (en) * 1966-05-12 1969-11-05 South London Electric Equipmen Improvements relating to the Measurement of Resistivity
US3466539A (en) * 1966-10-31 1969-09-09 Collins Radio Co Four-point probe for microminaturized circuitry having individual biasing means for each point
US3699436A (en) * 1970-02-24 1972-10-17 Mitsubishi Heavy Ind Ltd Remotely controllable defect detector of electric resistance type
HU162604B (enExample) * 1970-11-14 1973-03-28
DE2557658A1 (de) * 1975-12-20 1977-06-30 Motoren Turbinen Union Verfahren zur pruefung von bauteilen auf anrisse oder fehlstellen
US4266185A (en) * 1979-02-16 1981-05-05 Dover & Partners Limited Probes and apparatus for and methods of measuring crack depths
JPS59197846A (ja) * 1983-04-25 1984-11-09 Akai Bussan Kk 構造用圧延鋼材鋼種の非破壊識別方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002014132A (ja) * 2000-06-29 2002-01-18 Hioki Ee Corp 回路基板検査装置

Also Published As

Publication number Publication date
US5115200A (en) 1992-05-19
FR2572183A1 (fr) 1986-04-25
EP0179705B1 (fr) 1989-02-08
EP0179705A2 (fr) 1986-04-30
IN163306B (enExample) 1988-09-03
DE3568220D1 (en) 1989-03-16
CA1257904A (fr) 1989-07-25
EP0179705A3 (en) 1986-11-26
ATE40751T1 (de) 1989-02-15
ES8701987A1 (es) 1986-12-01
FR2572183B1 (fr) 1987-01-09
ES548604A0 (es) 1986-12-01

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