ATE40751T1 - Verfahren und vorrichtung zur pruefung der elektrischen kontinuitaet einer aus elektrisch leitendem stoff bestehenden vorrichtung durch messung der impedanz. - Google Patents
Verfahren und vorrichtung zur pruefung der elektrischen kontinuitaet einer aus elektrisch leitendem stoff bestehenden vorrichtung durch messung der impedanz.Info
- Publication number
- ATE40751T1 ATE40751T1 AT85401946T AT85401946T ATE40751T1 AT E40751 T1 ATE40751 T1 AT E40751T1 AT 85401946 T AT85401946 T AT 85401946T AT 85401946 T AT85401946 T AT 85401946T AT E40751 T1 ATE40751 T1 AT E40751T1
- Authority
- AT
- Austria
- Prior art keywords
- impedance
- current
- testing
- measurement
- conductive material
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/20—Investigating the presence of flaws
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Sorting Of Articles (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR8416138A FR2572183B1 (fr) | 1984-10-22 | 1984-10-22 | Procede et appareil pour la verification par mesure d'impedance de la continuite electrique d'un dispositif de matiere electriquement conductrice |
EP85401946A EP0179705B1 (de) | 1984-10-22 | 1985-10-04 | Verfahren und Vorrichtung zur Prüfung der elektrischen Kontinuität einer aus elektrisch leitendem Stoff bestehenden Vorrichtung durch Messung der Impedanz |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE40751T1 true ATE40751T1 (de) | 1989-02-15 |
Family
ID=9308877
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT85401946T ATE40751T1 (de) | 1984-10-22 | 1985-10-04 | Verfahren und vorrichtung zur pruefung der elektrischen kontinuitaet einer aus elektrisch leitendem stoff bestehenden vorrichtung durch messung der impedanz. |
Country Status (9)
Country | Link |
---|---|
US (1) | US5115200A (de) |
EP (1) | EP0179705B1 (de) |
JP (1) | JPS61107149A (de) |
AT (1) | ATE40751T1 (de) |
CA (1) | CA1257904A (de) |
DE (1) | DE3568220D1 (de) |
ES (1) | ES8701987A1 (de) |
FR (1) | FR2572183B1 (de) |
IN (1) | IN163306B (de) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2710413B1 (fr) * | 1993-09-21 | 1995-11-03 | Asulab Sa | Dispositif de mesure pour capteurs amovibles. |
US5644242A (en) * | 1995-06-21 | 1997-07-01 | Fisher; James Allan | Armature winding and winding connection test methods |
JP4582869B2 (ja) * | 2000-06-29 | 2010-11-17 | 日置電機株式会社 | 回路基板検査装置 |
US6822463B1 (en) | 2001-12-21 | 2004-11-23 | Lecroy Corporation | Active differential test probe with a transmission line input structure |
US6828768B2 (en) * | 2002-04-16 | 2004-12-07 | Agilent Technologies, Inc. | Systems and methods for wideband differential probing of variably spaced probe points |
GB2417091A (en) * | 2004-08-03 | 2006-02-15 | Advanced Analysis And Integrat | Aircraft test and measuring instruments |
US7811728B2 (en) * | 2006-12-01 | 2010-10-12 | Xerox Corporation | Imaging members and process for preparing same |
KR101188288B1 (ko) * | 2007-09-18 | 2012-10-05 | 삼성전자주식회사 | 반도체 소자 검사 장치 |
DE102008043103A1 (de) * | 2008-10-22 | 2010-04-29 | Alstrom Technology Ltd. | Vorrichtung und Verfahren zur Überwachung und/oder Analyse von Rotoren von elektrischen Maschinen im Betrieb |
US9151818B2 (en) * | 2011-11-08 | 2015-10-06 | Analog Devices Global | Voltage measurement |
WO2013038176A2 (en) | 2011-09-12 | 2013-03-21 | Metroic Limited | Current measurement |
GB201120295D0 (en) | 2011-11-24 | 2012-01-04 | Metroic Ltd | Current measurement apparatus |
KR102090578B1 (ko) * | 2013-05-06 | 2020-03-19 | 삼성디스플레이 주식회사 | 전자 장치의 기판, 이를 포함하는 전자 장치 및 접속부의 저항 측정 방법 |
US11549797B2 (en) * | 2018-10-26 | 2023-01-10 | Deere & Company | Device for detecting wear of replaceable components |
CN118348436B (zh) * | 2024-06-18 | 2024-09-03 | 青岛艾诺仪器有限公司 | 交流阻抗测量的激励源装置及控制方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE285536C (de) * | ||||
FR771305A (fr) * | 1934-06-27 | 1934-10-04 | Procédé pour la vérification de la qualité des soudures et appareils pour la mise en ceuvre de ce procédé | |
US2401917A (en) * | 1944-03-14 | 1946-06-11 | Sperry Prod Inc | Shell banding tester |
GB1169711A (en) * | 1966-05-12 | 1969-11-05 | South London Electric Equipmen | Improvements relating to the Measurement of Resistivity |
US3466539A (en) * | 1966-10-31 | 1969-09-09 | Collins Radio Co | Four-point probe for microminaturized circuitry having individual biasing means for each point |
US3699436A (en) * | 1970-02-24 | 1972-10-17 | Mitsubishi Heavy Ind Ltd | Remotely controllable defect detector of electric resistance type |
HU162604B (de) * | 1970-11-14 | 1973-03-28 | ||
DE2557658A1 (de) * | 1975-12-20 | 1977-06-30 | Motoren Turbinen Union | Verfahren zur pruefung von bauteilen auf anrisse oder fehlstellen |
US4266185A (en) * | 1979-02-16 | 1981-05-05 | Dover & Partners Limited | Probes and apparatus for and methods of measuring crack depths |
JPS59197846A (ja) * | 1983-04-25 | 1984-11-09 | Akai Bussan Kk | 構造用圧延鋼材鋼種の非破壊識別方法 |
-
1984
- 1984-10-22 FR FR8416138A patent/FR2572183B1/fr not_active Expired
-
1985
- 1985-10-04 EP EP85401946A patent/EP0179705B1/de not_active Expired
- 1985-10-04 DE DE8585401946T patent/DE3568220D1/de not_active Expired
- 1985-10-04 AT AT85401946T patent/ATE40751T1/de not_active IP Right Cessation
- 1985-10-17 IN IN742/CAL/85A patent/IN163306B/en unknown
- 1985-10-17 CA CA000493209A patent/CA1257904A/fr not_active Expired
- 1985-10-18 ES ES548604A patent/ES8701987A1/es not_active Expired
- 1985-10-22 JP JP60236241A patent/JPS61107149A/ja active Pending
-
1990
- 1990-07-26 US US07/559,498 patent/US5115200A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
IN163306B (de) | 1988-09-03 |
EP0179705A3 (en) | 1986-11-26 |
EP0179705A2 (de) | 1986-04-30 |
FR2572183B1 (fr) | 1987-01-09 |
JPS61107149A (ja) | 1986-05-26 |
DE3568220D1 (en) | 1989-03-16 |
EP0179705B1 (de) | 1989-02-08 |
US5115200A (en) | 1992-05-19 |
ES548604A0 (es) | 1986-12-01 |
CA1257904A (fr) | 1989-07-25 |
ES8701987A1 (es) | 1986-12-01 |
FR2572183A1 (fr) | 1986-04-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
UEP | Publication of translation of european patent specification | ||
REN | Ceased due to non-payment of the annual fee |