ATE40751T1 - Verfahren und vorrichtung zur pruefung der elektrischen kontinuitaet einer aus elektrisch leitendem stoff bestehenden vorrichtung durch messung der impedanz. - Google Patents

Verfahren und vorrichtung zur pruefung der elektrischen kontinuitaet einer aus elektrisch leitendem stoff bestehenden vorrichtung durch messung der impedanz.

Info

Publication number
ATE40751T1
ATE40751T1 AT85401946T AT85401946T ATE40751T1 AT E40751 T1 ATE40751 T1 AT E40751T1 AT 85401946 T AT85401946 T AT 85401946T AT 85401946 T AT85401946 T AT 85401946T AT E40751 T1 ATE40751 T1 AT E40751T1
Authority
AT
Austria
Prior art keywords
impedance
current
testing
measurement
conductive material
Prior art date
Application number
AT85401946T
Other languages
English (en)
Inventor
Pierre Victor Andre Lahitte
Michel Joseph Raymond
Jean-Paul Kayser
Original Assignee
Aerospatiale
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aerospatiale filed Critical Aerospatiale
Application granted granted Critical
Publication of ATE40751T1 publication Critical patent/ATE40751T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/20Investigating the presence of flaws

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Sorting Of Articles (AREA)
AT85401946T 1984-10-22 1985-10-04 Verfahren und vorrichtung zur pruefung der elektrischen kontinuitaet einer aus elektrisch leitendem stoff bestehenden vorrichtung durch messung der impedanz. ATE40751T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8416138A FR2572183B1 (fr) 1984-10-22 1984-10-22 Procede et appareil pour la verification par mesure d'impedance de la continuite electrique d'un dispositif de matiere electriquement conductrice
EP85401946A EP0179705B1 (de) 1984-10-22 1985-10-04 Verfahren und Vorrichtung zur Prüfung der elektrischen Kontinuität einer aus elektrisch leitendem Stoff bestehenden Vorrichtung durch Messung der Impedanz

Publications (1)

Publication Number Publication Date
ATE40751T1 true ATE40751T1 (de) 1989-02-15

Family

ID=9308877

Family Applications (1)

Application Number Title Priority Date Filing Date
AT85401946T ATE40751T1 (de) 1984-10-22 1985-10-04 Verfahren und vorrichtung zur pruefung der elektrischen kontinuitaet einer aus elektrisch leitendem stoff bestehenden vorrichtung durch messung der impedanz.

Country Status (9)

Country Link
US (1) US5115200A (de)
EP (1) EP0179705B1 (de)
JP (1) JPS61107149A (de)
AT (1) ATE40751T1 (de)
CA (1) CA1257904A (de)
DE (1) DE3568220D1 (de)
ES (1) ES8701987A1 (de)
FR (1) FR2572183B1 (de)
IN (1) IN163306B (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2710413B1 (fr) * 1993-09-21 1995-11-03 Asulab Sa Dispositif de mesure pour capteurs amovibles.
US5644242A (en) * 1995-06-21 1997-07-01 Fisher; James Allan Armature winding and winding connection test methods
JP4582869B2 (ja) * 2000-06-29 2010-11-17 日置電機株式会社 回路基板検査装置
US6822463B1 (en) 2001-12-21 2004-11-23 Lecroy Corporation Active differential test probe with a transmission line input structure
US6828768B2 (en) * 2002-04-16 2004-12-07 Agilent Technologies, Inc. Systems and methods for wideband differential probing of variably spaced probe points
GB2417091A (en) * 2004-08-03 2006-02-15 Advanced Analysis And Integrat Aircraft test and measuring instruments
US7811728B2 (en) * 2006-12-01 2010-10-12 Xerox Corporation Imaging members and process for preparing same
KR101188288B1 (ko) * 2007-09-18 2012-10-05 삼성전자주식회사 반도체 소자 검사 장치
DE102008043103A1 (de) * 2008-10-22 2010-04-29 Alstrom Technology Ltd. Vorrichtung und Verfahren zur Überwachung und/oder Analyse von Rotoren von elektrischen Maschinen im Betrieb
US9151818B2 (en) * 2011-11-08 2015-10-06 Analog Devices Global Voltage measurement
WO2013038176A2 (en) 2011-09-12 2013-03-21 Metroic Limited Current measurement
GB201120295D0 (en) 2011-11-24 2012-01-04 Metroic Ltd Current measurement apparatus
KR102090578B1 (ko) * 2013-05-06 2020-03-19 삼성디스플레이 주식회사 전자 장치의 기판, 이를 포함하는 전자 장치 및 접속부의 저항 측정 방법
US11549797B2 (en) * 2018-10-26 2023-01-10 Deere & Company Device for detecting wear of replaceable components
CN118348436B (zh) * 2024-06-18 2024-09-03 青岛艾诺仪器有限公司 交流阻抗测量的激励源装置及控制方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE285536C (de) *
FR771305A (fr) * 1934-06-27 1934-10-04 Procédé pour la vérification de la qualité des soudures et appareils pour la mise en ceuvre de ce procédé
US2401917A (en) * 1944-03-14 1946-06-11 Sperry Prod Inc Shell banding tester
GB1169711A (en) * 1966-05-12 1969-11-05 South London Electric Equipmen Improvements relating to the Measurement of Resistivity
US3466539A (en) * 1966-10-31 1969-09-09 Collins Radio Co Four-point probe for microminaturized circuitry having individual biasing means for each point
US3699436A (en) * 1970-02-24 1972-10-17 Mitsubishi Heavy Ind Ltd Remotely controllable defect detector of electric resistance type
HU162604B (de) * 1970-11-14 1973-03-28
DE2557658A1 (de) * 1975-12-20 1977-06-30 Motoren Turbinen Union Verfahren zur pruefung von bauteilen auf anrisse oder fehlstellen
US4266185A (en) * 1979-02-16 1981-05-05 Dover & Partners Limited Probes and apparatus for and methods of measuring crack depths
JPS59197846A (ja) * 1983-04-25 1984-11-09 Akai Bussan Kk 構造用圧延鋼材鋼種の非破壊識別方法

Also Published As

Publication number Publication date
IN163306B (de) 1988-09-03
EP0179705A3 (en) 1986-11-26
EP0179705A2 (de) 1986-04-30
FR2572183B1 (fr) 1987-01-09
JPS61107149A (ja) 1986-05-26
DE3568220D1 (en) 1989-03-16
EP0179705B1 (de) 1989-02-08
US5115200A (en) 1992-05-19
ES548604A0 (es) 1986-12-01
CA1257904A (fr) 1989-07-25
ES8701987A1 (es) 1986-12-01
FR2572183A1 (fr) 1986-04-25

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Legal Events

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UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee