JPS56128403A - Checking method and device for thickness of insulating base material - Google Patents

Checking method and device for thickness of insulating base material

Info

Publication number
JPS56128403A
JPS56128403A JP3157780A JP3157780A JPS56128403A JP S56128403 A JPS56128403 A JP S56128403A JP 3157780 A JP3157780 A JP 3157780A JP 3157780 A JP3157780 A JP 3157780A JP S56128403 A JPS56128403 A JP S56128403A
Authority
JP
Japan
Prior art keywords
base material
capacitor
insulating base
thickness
copper
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3157780A
Other languages
Japanese (ja)
Inventor
Koichi Tsukazaki
Kazuo Yamada
Fumio Imahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP3157780A priority Critical patent/JPS56128403A/en
Publication of JPS56128403A publication Critical patent/JPS56128403A/en
Pending legal-status Critical Current

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Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

PURPOSE: To check the thickness of the base material in a short time without destruction of the substrate, by applying an AC regulated voltage to copper foils on both faces of the copper-plated laminated plate and by measuring the current flowed in accordance with the electric capacity of the insulating base material.
CONSTITUTION: Copper-plated laminated plate 1 for printed circuit is shown as a capacitor, and ammeter 2 is arranged in series with the capacitor, and voltmeter 3 is arranged in parallel with the capacitor. The current flowed into the insulating base material when an AC regulated voltage is applied to the measure terminal is measured by ammeter 2 to check the distance between plate of the capacitor.
COPYRIGHT: (C)1981,JPO&Japio
JP3157780A 1980-03-14 1980-03-14 Checking method and device for thickness of insulating base material Pending JPS56128403A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3157780A JPS56128403A (en) 1980-03-14 1980-03-14 Checking method and device for thickness of insulating base material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3157780A JPS56128403A (en) 1980-03-14 1980-03-14 Checking method and device for thickness of insulating base material

Publications (1)

Publication Number Publication Date
JPS56128403A true JPS56128403A (en) 1981-10-07

Family

ID=12335031

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3157780A Pending JPS56128403A (en) 1980-03-14 1980-03-14 Checking method and device for thickness of insulating base material

Country Status (1)

Country Link
JP (1) JPS56128403A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2544514A1 (en) * 2011-07-05 2013-01-09 Pierburg Pump Technology GmbH Method for testing whether a substrate is sticking to an electrically and thermally conductive body correctly

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5053065A (en) * 1973-09-08 1975-05-10
JPS5315850A (en) * 1976-07-28 1978-02-14 Densoku Kougiyou Kk Method of detecting deviated thickness of insulating film
JPS53148466A (en) * 1977-05-31 1978-12-25 Iwatsu Electric Co Ltd Thickness gauge

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5053065A (en) * 1973-09-08 1975-05-10
JPS5315850A (en) * 1976-07-28 1978-02-14 Densoku Kougiyou Kk Method of detecting deviated thickness of insulating film
JPS53148466A (en) * 1977-05-31 1978-12-25 Iwatsu Electric Co Ltd Thickness gauge

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2544514A1 (en) * 2011-07-05 2013-01-09 Pierburg Pump Technology GmbH Method for testing whether a substrate is sticking to an electrically and thermally conductive body correctly
WO2013004446A1 (en) * 2011-07-05 2013-01-10 Pierburg Pump Technology Gmbh Method for verifying correct adhesion of a substrate on an electrically and thermally conductive body
CN103650646A (en) * 2011-07-05 2014-03-19 皮尔伯格泵技术有限责任公司 Method for verifying correct adhesion of a substrate on an electrically and thermally conductive body

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