JPS5315850A - Method of detecting deviated thickness of insulating film - Google Patents

Method of detecting deviated thickness of insulating film

Info

Publication number
JPS5315850A
JPS5315850A JP8914676A JP8914676A JPS5315850A JP S5315850 A JPS5315850 A JP S5315850A JP 8914676 A JP8914676 A JP 8914676A JP 8914676 A JP8914676 A JP 8914676A JP S5315850 A JPS5315850 A JP S5315850A
Authority
JP
Japan
Prior art keywords
insulating film
detecting
thickness
deviated thickness
detecting deviated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8914676A
Other languages
Japanese (ja)
Other versions
JPS585362B2 (en
Inventor
Osamu Hatsutori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DENSOKU KOUGIYOU KK
Original Assignee
DENSOKU KOUGIYOU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DENSOKU KOUGIYOU KK filed Critical DENSOKU KOUGIYOU KK
Priority to JP51089146A priority Critical patent/JPS585362B2/en
Publication of JPS5315850A publication Critical patent/JPS5315850A/en
Publication of JPS585362B2 publication Critical patent/JPS585362B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Manufacturing Of Electric Cables (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
JP51089146A 1976-07-28 1976-07-28 Method for detecting uneven thickness of insulating coating Expired JPS585362B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP51089146A JPS585362B2 (en) 1976-07-28 1976-07-28 Method for detecting uneven thickness of insulating coating

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP51089146A JPS585362B2 (en) 1976-07-28 1976-07-28 Method for detecting uneven thickness of insulating coating

Publications (2)

Publication Number Publication Date
JPS5315850A true JPS5315850A (en) 1978-02-14
JPS585362B2 JPS585362B2 (en) 1983-01-31

Family

ID=13962715

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51089146A Expired JPS585362B2 (en) 1976-07-28 1976-07-28 Method for detecting uneven thickness of insulating coating

Country Status (1)

Country Link
JP (1) JPS585362B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56128403A (en) * 1980-03-14 1981-10-07 Hitachi Ltd Checking method and device for thickness of insulating base material
JPH0458145A (en) * 1990-06-28 1992-02-25 Unitika Setsubi Gijutsu Kk Defect inspecting device for electric wire given processing agent
JP2010145288A (en) * 2008-12-19 2010-07-01 Fujikura Ltd Method and device for measuring diameter of void in optical fiber having void, and method and apparatus for manufacturing optical fiber having void

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0221763U (en) * 1988-07-28 1990-02-14

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4929595A (en) * 1972-07-17 1974-03-16

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4929595A (en) * 1972-07-17 1974-03-16

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56128403A (en) * 1980-03-14 1981-10-07 Hitachi Ltd Checking method and device for thickness of insulating base material
JPH0458145A (en) * 1990-06-28 1992-02-25 Unitika Setsubi Gijutsu Kk Defect inspecting device for electric wire given processing agent
JP2010145288A (en) * 2008-12-19 2010-07-01 Fujikura Ltd Method and device for measuring diameter of void in optical fiber having void, and method and apparatus for manufacturing optical fiber having void

Also Published As

Publication number Publication date
JPS585362B2 (en) 1983-01-31

Similar Documents

Publication Publication Date Title
JPS52132688A (en) Method of forming flat thin film
JPS5340900A (en) Method of polarizing single electrode of dielectric film
JPS5299686A (en) Method of measuring erythrosedimentation
JPS5369026A (en) Method of triming photoregistered film
JPS5350144A (en) Method of assaying immuntion effect of improved mesadon
JPS52141443A (en) Method of etching films
JPS52140355A (en) Method of measuring thickness of thin film
JPS52137370A (en) Method of measuring thickness of object
JPS5310863A (en) Method of testing multilayer substrate
JPS5315850A (en) Method of detecting deviated thickness of insulating film
JPS5366232A (en) Method of taking electrophotography
JPS52151639A (en) Plating method of film
JPS55159105A (en) Thickness measuring method of dielectric film
JPS52117973A (en) Method of manufacturing electric insulation film
JPS52150651A (en) Method of detecting travelling condition of plate
JPS531858A (en) Method of forming thin film circuit
JPS5327055A (en) Method of measuring thickness of transparent board
JPS5285033A (en) Method of forming thin film structure
IE46084L (en) Measuring the thickness of a layer
JPS5357891A (en) Method of detecting leakage
JPS52119677A (en) Method of manufacturing electroconductive films
JPS5337775A (en) Method of manufacture of laminated film
JPS52154137A (en) Method of detecting electronic range failure
JPS5319561A (en) Method of forming thick film circuit
JPS52122867A (en) Method of detecting mark