JPS5310863A - Method of testing multilayer substrate - Google Patents
Method of testing multilayer substrateInfo
- Publication number
- JPS5310863A JPS5310863A JP8496776A JP8496776A JPS5310863A JP S5310863 A JPS5310863 A JP S5310863A JP 8496776 A JP8496776 A JP 8496776A JP 8496776 A JP8496776 A JP 8496776A JP S5310863 A JPS5310863 A JP S5310863A
- Authority
- JP
- Japan
- Prior art keywords
- multilayer substrate
- testing multilayer
- testing
- substrate
- multilayer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8496776A JPS5310863A (en) | 1976-07-19 | 1976-07-19 | Method of testing multilayer substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8496776A JPS5310863A (en) | 1976-07-19 | 1976-07-19 | Method of testing multilayer substrate |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5310863A true JPS5310863A (en) | 1978-01-31 |
Family
ID=13845384
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8496776A Pending JPS5310863A (en) | 1976-07-19 | 1976-07-19 | Method of testing multilayer substrate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5310863A (en) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54137073U (en) * | 1978-03-16 | 1979-09-22 | ||
JPS5918467A (en) * | 1982-07-06 | 1984-01-30 | スペリ−・コ−ポレ−シヨン | Method and device for detecting destructive breakdown, inadequate connection and temperature of insulator of printed circuit assembly by single electric wire |
JPS59151070A (en) * | 1983-02-18 | 1984-08-29 | Nec Corp | Inspecting method of multi-layer ceramic wiring board |
US7656166B2 (en) | 2007-02-28 | 2010-02-02 | Micronics Japan Co., Ltd. | Multilayer wiring board and method for testing the same |
US7659727B2 (en) | 2007-02-28 | 2010-02-09 | Micronics Japan Co., Ltd. | Multilayer wiring board and method for testing the same |
JP2010249664A (en) * | 2009-04-16 | 2010-11-04 | Hioki Ee Corp | Circuit board inspection device and circuit board inspection method |
JP2015004621A (en) * | 2013-06-21 | 2015-01-08 | 株式会社日本マイクロニクス | Device and method for inspecting wiring board |
US20150108997A1 (en) * | 2013-10-18 | 2015-04-23 | Kabushiki Kaisha Nihon Micronics | Inspection apparatus and inspection method |
JP2021152511A (en) * | 2020-03-25 | 2021-09-30 | 日本電産リード株式会社 | Inspection device and inspection method |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4938968U (en) * | 1972-07-07 | 1974-04-05 | ||
JPS5296358A (en) * | 1976-02-06 | 1977-08-12 | Tokyo Shibaura Electric Co | Device for inspecting pattern |
-
1976
- 1976-07-19 JP JP8496776A patent/JPS5310863A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4938968U (en) * | 1972-07-07 | 1974-04-05 | ||
JPS5296358A (en) * | 1976-02-06 | 1977-08-12 | Tokyo Shibaura Electric Co | Device for inspecting pattern |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54137073U (en) * | 1978-03-16 | 1979-09-22 | ||
JPS5918467A (en) * | 1982-07-06 | 1984-01-30 | スペリ−・コ−ポレ−シヨン | Method and device for detecting destructive breakdown, inadequate connection and temperature of insulator of printed circuit assembly by single electric wire |
JPS59151070A (en) * | 1983-02-18 | 1984-08-29 | Nec Corp | Inspecting method of multi-layer ceramic wiring board |
US7656166B2 (en) | 2007-02-28 | 2010-02-02 | Micronics Japan Co., Ltd. | Multilayer wiring board and method for testing the same |
US7659727B2 (en) | 2007-02-28 | 2010-02-09 | Micronics Japan Co., Ltd. | Multilayer wiring board and method for testing the same |
JP2010249664A (en) * | 2009-04-16 | 2010-11-04 | Hioki Ee Corp | Circuit board inspection device and circuit board inspection method |
JP2015004621A (en) * | 2013-06-21 | 2015-01-08 | 株式会社日本マイクロニクス | Device and method for inspecting wiring board |
US20150108997A1 (en) * | 2013-10-18 | 2015-04-23 | Kabushiki Kaisha Nihon Micronics | Inspection apparatus and inspection method |
US9535108B2 (en) * | 2013-10-18 | 2017-01-03 | Kabushiki Kaisha Nihon Micronics | Inspection apparatus and inspection method |
JP2021152511A (en) * | 2020-03-25 | 2021-09-30 | 日本電産リード株式会社 | Inspection device and inspection method |
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