JPS52137370A - Method of measuring thickness of object - Google Patents

Method of measuring thickness of object

Info

Publication number
JPS52137370A
JPS52137370A JP12078576A JP12078576A JPS52137370A JP S52137370 A JPS52137370 A JP S52137370A JP 12078576 A JP12078576 A JP 12078576A JP 12078576 A JP12078576 A JP 12078576A JP S52137370 A JPS52137370 A JP S52137370A
Authority
JP
Japan
Prior art keywords
measuring thickness
measuring
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12078576A
Other languages
Japanese (ja)
Inventor
Guraabenderufuaa Berunaa
Hirudebarunto Hainaa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Krautkraemer GmbH
Original Assignee
Krautkraemer GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Krautkraemer GmbH filed Critical Krautkraemer GmbH
Publication of JPS52137370A publication Critical patent/JPS52137370A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S15/00—Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems
    • G01S15/02—Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems using reflection of acoustic waves
    • G01S15/06—Systems determining the position data of a target
    • G01S15/08—Systems for measuring distance only
    • G01S15/10—Systems for measuring distance only using transmission of interrupted, pulse-modulated waves
    • G01S15/18—Systems for measuring distance only using transmission of interrupted, pulse-modulated waves wherein range gates are used
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
    • G01B17/02—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
JP12078576A 1976-05-11 1976-10-07 Method of measuring thickness of object Pending JPS52137370A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19762620835 DE2620835C3 (en) 1976-05-11 1976-05-11 Electronic time interval measuring method

Publications (1)

Publication Number Publication Date
JPS52137370A true JPS52137370A (en) 1977-11-16

Family

ID=5977665

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12078576A Pending JPS52137370A (en) 1976-05-11 1976-10-07 Method of measuring thickness of object

Country Status (4)

Country Link
JP (1) JPS52137370A (en)
DE (1) DE2620835C3 (en)
FR (1) FR2351387A1 (en)
GB (1) GB1538760A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5892811A (en) * 1980-12-08 1983-06-02 Teitsuu Denshi Kenkyusho:Kk Ultrasonic thickness measuring method

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2950862A1 (en) * 1979-12-18 1981-07-23 Me Meerestechnik Elektronik Gmbh, 2351 Trappenkamp Sound wave propagation time measuring system - uses phase-shift of wave train at centre of successive bursts
NL8002888A (en) * 1980-05-19 1981-12-16 Neratoom SYSTEM FOR MEASURING THE WALL THICKNESS OF A MEASURING OBJECT.
DE3210470C2 (en) * 1982-03-22 1984-01-05 Siemens AG, 1000 Berlin und 8000 München Ultrasonic sensor
DE3216314A1 (en) * 1982-05-03 1983-11-03 Johann F. Dipl.-Phys. 2000 Hamburg Hipp Method for measuring the time between two analog electrical pulses, which can be repeated any number of times and has statistically distributed amplitudes
DE3328540A1 (en) * 1983-08-06 1985-02-14 Robert Bosch Gmbh, 7000 Stuttgart DEVICE FOR MEASURING TIME BETWEEN TWO EVENTS
DE3347420A1 (en) * 1983-12-29 1985-07-11 Nukem Gmbh, 6450 Hanau Method for measuring the time interval between two electrical pulses, and device for carrying out the method
DE3741338A1 (en) * 1987-12-07 1989-06-15 Rump Elektronik Tech APPARATUS AND METHOD FOR ELECTRONIC DISTANCE MEASUREMENT WITH THE AID OF THE RUNTIME DETERMINATION OF WAVE-SHAPED IMPULSES
DE4414030C1 (en) * 1994-04-22 1995-08-10 Abb Research Ltd Ultrasonic thickness measurement of thin layer

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2831162A (en) * 1955-05-09 1958-04-15 Julian E Gross Time-interval measuring device
US3808879A (en) * 1972-08-03 1974-05-07 Amf Inc Ultrasonic wall thickness measurement

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5892811A (en) * 1980-12-08 1983-06-02 Teitsuu Denshi Kenkyusho:Kk Ultrasonic thickness measuring method
JPS6249921B2 (en) * 1980-12-08 1987-10-22 Teitsu Denshi Kenkyusho Kk

Also Published As

Publication number Publication date
DE2620835B2 (en) 1980-10-30
FR2351387A1 (en) 1977-12-09
DE2620835A1 (en) 1977-12-01
DE2620835C3 (en) 1981-09-24
GB1538760A (en) 1979-01-24

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