JPS6095369A - テストパターン発生方法 - Google Patents

テストパターン発生方法

Info

Publication number
JPS6095369A
JPS6095369A JP58202751A JP20275183A JPS6095369A JP S6095369 A JPS6095369 A JP S6095369A JP 58202751 A JP58202751 A JP 58202751A JP 20275183 A JP20275183 A JP 20275183A JP S6095369 A JPS6095369 A JP S6095369A
Authority
JP
Japan
Prior art keywords
pattern
memory
output
random
regular
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58202751A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0535391B2 (enrdf_load_stackoverflow
Inventor
Ikuo Kawaguchi
川口　郁夫
Masaaki Inadate
稲舘　昌明
Shuji Kikuchi
修司 菊地
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58202751A priority Critical patent/JPS6095369A/ja
Publication of JPS6095369A publication Critical patent/JPS6095369A/ja
Publication of JPH0535391B2 publication Critical patent/JPH0535391B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP58202751A 1983-10-31 1983-10-31 テストパターン発生方法 Granted JPS6095369A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58202751A JPS6095369A (ja) 1983-10-31 1983-10-31 テストパターン発生方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58202751A JPS6095369A (ja) 1983-10-31 1983-10-31 テストパターン発生方法

Publications (2)

Publication Number Publication Date
JPS6095369A true JPS6095369A (ja) 1985-05-28
JPH0535391B2 JPH0535391B2 (enrdf_load_stackoverflow) 1993-05-26

Family

ID=16462558

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58202751A Granted JPS6095369A (ja) 1983-10-31 1983-10-31 テストパターン発生方法

Country Status (1)

Country Link
JP (1) JPS6095369A (enrdf_load_stackoverflow)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4743840A (en) * 1985-11-26 1988-05-10 Hitachi Computer Engineering Co., Ltd. Diagnosing method for logic circuits
JPS63177772U (enrdf_load_stackoverflow) * 1987-05-08 1988-11-17
JPH04236378A (ja) * 1990-09-15 1992-08-25 Internatl Business Mach Corp <Ibm> 論理装置を試験する方法および装置
US6006350A (en) * 1997-05-22 1999-12-21 Mitsubishi Denki Kabushiki Kaisha Semiconductor device testing apparatus and method for testing memory and logic sections of a semiconductor device
JP2007261382A (ja) * 2006-03-28 2007-10-11 Honda Motor Co Ltd ステアリングハンガービーム構造
JP2009012564A (ja) * 2007-07-03 2009-01-22 Honda Motor Co Ltd ステアリングコラム支持構造

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4743840A (en) * 1985-11-26 1988-05-10 Hitachi Computer Engineering Co., Ltd. Diagnosing method for logic circuits
JPS63177772U (enrdf_load_stackoverflow) * 1987-05-08 1988-11-17
JPH04236378A (ja) * 1990-09-15 1992-08-25 Internatl Business Mach Corp <Ibm> 論理装置を試験する方法および装置
US6006350A (en) * 1997-05-22 1999-12-21 Mitsubishi Denki Kabushiki Kaisha Semiconductor device testing apparatus and method for testing memory and logic sections of a semiconductor device
JP2007261382A (ja) * 2006-03-28 2007-10-11 Honda Motor Co Ltd ステアリングハンガービーム構造
JP2009012564A (ja) * 2007-07-03 2009-01-22 Honda Motor Co Ltd ステアリングコラム支持構造

Also Published As

Publication number Publication date
JPH0535391B2 (enrdf_load_stackoverflow) 1993-05-26

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