JPS608760A - 各種コイルの判定装置 - Google Patents
各種コイルの判定装置Info
- Publication number
- JPS608760A JPS608760A JP58117672A JP11767283A JPS608760A JP S608760 A JPS608760 A JP S608760A JP 58117672 A JP58117672 A JP 58117672A JP 11767283 A JP11767283 A JP 11767283A JP S608760 A JPS608760 A JP S608760A
- Authority
- JP
- Japan
- Prior art keywords
- coil
- transient response
- voltage waveform
- response voltage
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000004044 response Effects 0.000 claims abstract description 57
- 230000001052 transient effect Effects 0.000 claims abstract description 57
- 239000003990 capacitor Substances 0.000 abstract description 12
- 230000002950 deficient Effects 0.000 description 9
- 238000010586 diagram Methods 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000007547 defect Effects 0.000 description 3
- 230000010355 oscillation Effects 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010348 incorporation Methods 0.000 description 1
- 230000001404 mediated effect Effects 0.000 description 1
- 230000003534 oscillatory effect Effects 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58117672A JPS608760A (ja) | 1983-06-29 | 1983-06-29 | 各種コイルの判定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58117672A JPS608760A (ja) | 1983-06-29 | 1983-06-29 | 各種コイルの判定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS608760A true JPS608760A (ja) | 1985-01-17 |
JPH0376713B2 JPH0376713B2 (enrdf_load_stackoverflow) | 1991-12-06 |
Family
ID=14717425
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58117672A Granted JPS608760A (ja) | 1983-06-29 | 1983-06-29 | 各種コイルの判定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS608760A (enrdf_load_stackoverflow) |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61162755A (ja) * | 1985-01-14 | 1986-07-23 | Denshi Seigyo Group:Kk | インパルスコイル試験器 |
JPS61182586A (ja) * | 1985-02-08 | 1986-08-15 | Japan Atom Energy Res Inst | コイル系異常監視装置 |
US4814937A (en) * | 1986-06-09 | 1989-03-21 | Mitsubishi Denki Kabushiki Kaisha | Defect detector circuit for inductive load driving circuit |
JPH0992100A (ja) * | 1995-09-26 | 1997-04-04 | Fuji Electric Co Ltd | 直流高速度真空遮断器 |
JP2000097982A (ja) * | 1998-09-21 | 2000-04-07 | Ikd:Kk | コイル試験評価装置 |
JP2003075500A (ja) * | 2001-09-05 | 2003-03-12 | Denso Corp | 巻線異常検査方法 |
JP2004271538A (ja) * | 1997-09-30 | 2004-09-30 | Mitsubishi Electric Corp | 電子回路検査装置 |
JP2009151687A (ja) * | 2007-12-21 | 2009-07-09 | Fuji Xerox Co Ltd | 検知装置および処理システム |
CN104076253A (zh) * | 2013-03-29 | 2014-10-01 | 致茂电子(苏州)有限公司 | 电性测试装置 |
JP2014186024A (ja) * | 2013-03-25 | 2014-10-02 | Chroma Ate Inc | 電気試験装置及び電気試験方法 |
JP2014186025A (ja) * | 2013-03-25 | 2014-10-02 | Chroma Ate Inc | 電気試験装置 |
JP2017211280A (ja) * | 2016-05-26 | 2017-11-30 | 日置電機株式会社 | コイル試験装置およびコイル試験方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5899669U (ja) * | 1981-12-28 | 1983-07-06 | 株式会社東芝 | 回転電機用電機子巻線の絶縁診断装置 |
-
1983
- 1983-06-29 JP JP58117672A patent/JPS608760A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5899669U (ja) * | 1981-12-28 | 1983-07-06 | 株式会社東芝 | 回転電機用電機子巻線の絶縁診断装置 |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61162755A (ja) * | 1985-01-14 | 1986-07-23 | Denshi Seigyo Group:Kk | インパルスコイル試験器 |
JPS61182586A (ja) * | 1985-02-08 | 1986-08-15 | Japan Atom Energy Res Inst | コイル系異常監視装置 |
US4814937A (en) * | 1986-06-09 | 1989-03-21 | Mitsubishi Denki Kabushiki Kaisha | Defect detector circuit for inductive load driving circuit |
JPH0992100A (ja) * | 1995-09-26 | 1997-04-04 | Fuji Electric Co Ltd | 直流高速度真空遮断器 |
JP2004271538A (ja) * | 1997-09-30 | 2004-09-30 | Mitsubishi Electric Corp | 電子回路検査装置 |
JP2000097982A (ja) * | 1998-09-21 | 2000-04-07 | Ikd:Kk | コイル試験評価装置 |
JP2003075500A (ja) * | 2001-09-05 | 2003-03-12 | Denso Corp | 巻線異常検査方法 |
JP2009151687A (ja) * | 2007-12-21 | 2009-07-09 | Fuji Xerox Co Ltd | 検知装置および処理システム |
JP2014186024A (ja) * | 2013-03-25 | 2014-10-02 | Chroma Ate Inc | 電気試験装置及び電気試験方法 |
JP2014186025A (ja) * | 2013-03-25 | 2014-10-02 | Chroma Ate Inc | 電気試験装置 |
CN104076253A (zh) * | 2013-03-29 | 2014-10-01 | 致茂电子(苏州)有限公司 | 电性测试装置 |
JP2017211280A (ja) * | 2016-05-26 | 2017-11-30 | 日置電機株式会社 | コイル試験装置およびコイル試験方法 |
Also Published As
Publication number | Publication date |
---|---|
JPH0376713B2 (enrdf_load_stackoverflow) | 1991-12-06 |
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