JPS608760A - Deciding device of various coils - Google Patents

Abstract

PURPOSE:To improve the operation efficiency by comparing a transient response waveform, which is generated in a coil by a surge voltage, with that of an ideal coil digitally to decide whether the coil is good or not quickly and accurately without requiring skill. CONSTITUTION:A capacitor Cs having a known capacity is added to a coil Lx to be decided, and a surge voltage generating circuit 1 is connected to the capacitor Cs. A digital memory 2 plots a prescribed number of comparison deciding points to convert the transient response voltage waveform to a digital code and stores this code. A microcomputer 3 compares the transient response voltage waveform of an ideal coil with that of the coil Lx with each other and operates them, and the operation result is not only displayed on a display device but also displayed on a CRT to make it possible that it is decided directly visually. A certain allowable width T given to a transient response voltage waveform Wo of a good coil; and if the transient response voltage waveform of the coil Lx is placed within the width T, it is decided that the coil Lx is good.

Description

[Detailed Description of the Invention] The invention relates to a device for determining the quality of various coils such as electromagnetic valve coils, motor coils, generator coils, transformers, etc., and particularly to devices for determining the quality of various coils such as electromagnetic valve coils, motor coils, generator coils, transformers, etc.
The present invention relates to a determination device that can quickly and accurately determine incorrect wiring connections and winding errors.

Conventionally, it is known that a Q meter is used to determine the quality of a coil. That is, when a capacitor is connected to the coil to be determined, the self-inductance of the coil is L, the resistance is R, and the capacitance of the capacitor is C, uoL/R=]/1. The determination was made by measuring the Q value determined by cJocR. However, in the conventional method using a Q meter, it is not easy to determine the occurrence of defects such as rare shoot or turn count error based on the measured Q value (it relies on the intuition of the measurer). is currently,
The drawbacks were that quick and accurate judgments could not be expected, and the efficiency of the judgment work was also poor. Furthermore, in recent years, coil scopes have come into use, but these coil scopes are capable of measuring the transient response a of a good coil and the coil to be measured.
are imaged on the scope surface and visually compared, and this is used to determine the quality of the coil to be measured.In addition to the coil to be determined, when determining the quality of the coil,
Since good quality coils must be selected and connected each time, and the judgment work is cumbersome, scales are used to judge quality by visual inspection, so they can be integrated into automatic lines such as manufacturing processes. There were also problems in that it was difficult to judge whether the product was good or not, and the work efficiency was poor.

In view of the above circumstances, the present invention makes it possible to directly read the determination result of coil quality by effectively applying a microcomputer that has come to be used in various fields in recent years, without requiring any skill. It is an object of the present invention to provide a determination device for various coils that can be quickly and accurately determined without any problems and can improve work efficiency.

In order to achieve the above object, the present invention includes a surge voltage generation circuit that supplies a surge voltage to a coil to be determined, and a microcomputer in which an ideal transient response waveform of the coil is digitally encoded and stored in advance. and after the microcomputer digitally encodes a transient response waveform generated in the coil to be determined by applying the surge voltage,
The present invention is characterized by a determination device for various coils that performs a comparison calculation with a digital code in a transient response waveform of an ideal coil stored in advance and outputs the calculation result.

DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of a determination device for various coils according to the present invention will be described below with reference to the drawings. First, the principle of the judgment device will be explained with reference to Figs. 1 and 2. As shown in Fig. 1, the coil LX to be judged, which has a self-inductance L and a resistance R1, includes stray capacitance. A capacitor Cs with a known capacitance is added to the circuit, and a discharge capacitor C0 is connected to the circuit via a switch SW1.

The capacitor C8 is charged with a predetermined voltage FJS in advance (. Then, when the switch SWI is turned on, the voltage ES of the capacitor Co is supplied to the capacitor C5 and the coil LX via the switch SW, and the coil Lx A transient response voltage waveform as shown in Fig. 2 is generated at both ends of the coil X and the capacitor C5.
If the condition Cs is satisfied and it is oscillatory, the oscillation frequency f of the transient response voltage waveform in Fig. 2 is f-]/2π white-5
becomes. Also, in FIG. 2, mutual=ωL+/Rs.

Therefore, Q and inductance L1 can be determined from the transient response waveform, and it is possible to determine whether the coil Lx is good or bad. For example, when the number of turns is different for a predetermined number of turns, so-called a difference in the number of turns, the vibration frequency f changes for a coil with a predetermined number of turns because the inductance L1 is different.

When the coil Lx has a rare shoot, not only the inductance changes but also energy loss occurs within the coil Lx, so the transient response waveform becomes thick (
Change. In other words, by observing the transient response waveform, it is possible to determine whether the coil Lx is a good product.

The present invention utilizes the above principle, and as shown in FIG. After detecting and digitally encoding, a digital memory 2 is connected to store the digitally encoded transient response voltage waveform and the digitally encoded transient response voltage waveform of an ideal non-defective coil. The microcomputer 3 performs comparison calculations and outputs the results of the calculations.

The digital memory 2 is built into the microcomputer 3, and it goes without saying that a capacitor Cs as shown in FIG. 1 is connected to the coil Lx. As shown in FIG. 4, the digital memory 2 plots and digitally encodes a predetermined number of transient response voltage waveforms, for example, 50 comparison points, and stores the digital code. On the other hand, the microcomputer 3 also stores in advance the digitally encoded transient response voltage waveform of the ideal coil, and in the digital encoding as well, the transient response voltage waveform of the coil Lx to be determined is digitally encoded. It goes without saying that the transient response voltage waveform can be plotted at the same time on the time axis (horizontal axis) as shown in FIG. 4 and digitally encoded. In order to store the digitally encoded transient response voltage waveform of an ideal coil in a microcomputer, it is sufficient to connect a good coil in place of the coil Lx shown in Fig. 3, or to store a plurality of good coils. It is also possible to measure the transient response voltage waveform and store the average value internally. microcomputer 3
compares and calculates the transient response voltage waveform of the ideal coil and the transient response voltage waveform of the coil Lx to be determined, displays the calculation result on a display device, prints it on a printer, and further The transient response voltage waveform of the ideal coil and the transient response voltage waveform of the coil Lx to be determined are simultaneously expressed as C, R, T (cathode-ray
-tube) so that it can be determined by direct viewing. A constant tolerance width T is given to the ideal transient response voltage waveform Wo of a good coil shown in FIG. If it is not located, it is determined that the product is defective.

This will be explained in detail based on the circuit diagram shown in Figure 5.
Input the transient response voltage waveform of the ideal good coil in advance (
The signal No. After plotting a predetermined number of waveforms and converting them into digital signals, the buffer circuit 15
Random access memory (hereinafter referred to as RAM)
The upper and lower limits of the permissible width T are set using the setter 16. Regarding the number of plots, the division ratio of the oscillation frequency inputted from the oscillator 17 via the AND gate 18 can be freely set using the switch 5W11. The frequency-divided signal from the frequency dividing circuit 19 is input to the A/D conversion circuit 14 via the one-shot multivibrator 20. The method of storing the digitally encoded transient response voltage waveform of the ideal good coil in the RAM is the same as the case of storing the transient response voltage waveform of the coil Lx to be judged in the RAM, which will be described later.
The only difference is the address to be stored.

Next, in order to judge the quality of the coil Lx, first, the operation start signal is sent from the line 21.22 to the OR gate 23.24y.
through the flip-flops 25 to 27 and the counter 28,
29, the flip-flops 25 to 27 and counters 28 and 29 are operated, and the signal is also input to the counter 32 via the OR gate 314 from the line 30, and the counter 32 is prepared for operation. Furthermore, when the reset signal (not shown) is received by )tAM and the counter 32, the coil Lx stored in )l and AM during the previous judgment operation is
The transient response voltage waveform of the counter 32 is canceled, and the counter 32
The contents of the file will also be deleted. Next, when the operation signal is inputted from the operation signal generation circuit 33 to the OR gate 34, "C-
(Input to JR gate 35. The operation signal input to OR gate 35 is passed through inverter 38 to frequency dividing circuit 1.
9 to enable operation, AND gate 18 is opened, and the output of oscillator 17 is output to AND gate 18.
The signal is supplied to the A/I conversion circuit 14 via the frequency dividing circuit 18 and the one-shot multivibrator 20. Therefore, the A/D conversion circuit 14 determines whether the coil Lx
A predetermined number of transient response pressure waveforms, that is, analog signals, are received from the one-shot multivibrator 20, plotted in a predetermined number as shown in FIG. 4, and digitally encoded. The digital signal is temporarily stored in the RAM via the data bus 39 and the buffer circuit 15.

Next, the digital signal of the ideal transient response voltage waveform of the coil and the allowable width T are added to each of the BD calculator 4o and the subtracter 41 from within the RAM via the buffer circuit 15 and the data bus 39. The subtracter 41 calculates the upper limit value for a non-defective product, and conversely calculates the allowable width T from the digital signal.
Subtract this value to determine a good product and calculate the lower limit value. As a result, a permissible width T having upper and lower limits is calculated. In other words, even if the number of agents is the same as that of a good coil and there are no defects such as rare shoot, due to differences other than resistance, the transient response voltage waveform will be slightly different from the ideal transient response voltage waveform. Since it is not desirable for such a coil Lx to be considered a defective product, it is provided with a certain allowable width T. The respective calculation results of adder 40 and subtracter 41 are provided to comparison circuits 42 and 43, respectively.

Each comparator circuit 42, 43 receives the digital code of the coil Lx to be determined from It A M, and also inputs the transient response voltage waveform via the data bus 44. Therefore, each comparator circuit 4
2.43 compares the calculation results of the adder 40 and the subtracter 41 with the digitally encoded transient response voltage waveform of the determination coil Lx. The comparison value is input to the counter 28 through an OR gate 45 and 46 flip-flops to enable each counter 28 and 29, and at the same time is input to the counters 28 and 29 through an ANIJ gate 47 to .29 counts the number of times the digitally encoded transient response voltage waveform of the coil Lx to be determined exceeds the allowable width T, and supplies the counted number to the flip-flop 25 via the switch circuits 48 and 49.

After the operation start signal is input to the flip 70 tube 25, an operation signal is input from the OR+ gate 35 via the one-shot multivibrator 50 and the zero gate 23, and the flip 70 knob 25 maintains the operation state, and also operates the adder 40 and the subtracter. The calculation result of 4] is inputted via the OR gate 51, and upon receiving the count values of the counters 28 and 29 together with the calculation result, the coil L
Various states of x are displayed on the display device 52. That is, if the number of consecutive replotted locations of the digitally encoded transient response voltage waveform of the coil Lx to be determined is greater than or equal to a predetermined number,
Example: When two or more blocks exceed the allowable width T, the light emitting diode D
1 is displayed by emitting light, and when the sum of the numbers exceeding the allowable width T reaches a predetermined value or more in the entire judgment process of the digitally encoded transient response voltage waveform of the coil Lx to be judged, for example, 10 If the number reaches more than 1, the light emitting diode D! lights up and displays. Each light emitting diode D1)
When any one of D2 emits light, the light emitting diode D and the IE light emitting diode D are emitted through the OR gate 53 to display the light, and an NG signal is output from the output terminal 54.
The determination operation as described above is stopped. Alternatively, the NG signal is sent to a discharge device built into the automatic coil manufacturing line, the discharge device is operated, and the defective coils measured as described above are removed from the automatic coil manufacturing line. It is designed to be discharged from

Further, when an error occurs in the judgment operation, the light emitting diode D4 emits light to display an indication. Also, when either the upper or lower limit is exceeded,
By providing light emitting diodes that emit light in accordance with the above-mentioned conditions, the cause of defective products can also be indicated. When the series of determination operations is completed, a termination signal No. 11 is output from a termination circuit (not shown) or one-shot multivibrator 69, and the flip 70 knob 25 receives this termination signal to cause the light emitting diode Ds to emit light for display. Length, RAM
Coil Lx to be determined via data bus 44.55
The digitally encoded transient response voltage waveform of the ideal coil is provided to C, R, and T via the launch circuit 56 and the output circuit 57, while the digitally encoded transient response voltage waveform of the ideal coil is also supplied from the RAM. The signal is supplied to C0 and T via the buffer circuit 5 and the data bus 58, and further via the latch circuit 59 and the output circuit 60.

Therefore, the transient response voltage waveforms of C1 and T can be imaged at the same time, so that the quality of the coil Lx can be directly read. A level sensitivity adjustment circuit 61 is interposed in the flip-flop 27, and the level sensitivity adjustment circuit 6
Reference numeral 1 includes a comparator circuit 62 equipped with a variable resistor V for level adjustment, and a slope selection switch SW incorporating an inverter 3 to generate a level sense trigger pulse. The inverter 63 and the slope selection switch SW are used to select whether the starting point of the transient response voltage waveform of the coil Lx to be determined starts from a rising edge or when it starts from a falling edge. A delay circuit 64 and a flip-flop 65 are interposed between the flip-flop 26 and the OR gate 35, and the delay circuit 64 and the flip-flop 65 are connected to the A/I conversion circuit 14.
This is to open the OR gate 35 with a delay from the time when the operation signal is input to the 0th gate 34 in order to stabilize the circuit operation between the circuits such as RAM and RAM. An inverter 66 and a one-shot multivibrator 6 are connected to the AND gate 36 from the A/D conversion circuit 14.
7, and the provision of such a signal is performed by plotting the transient response voltage waveform of the coil Lx to be determined by the conversion circuit 14 with a fixed time relationship, and using the digital In correspondence with the encoding, the temporal cycle operation when writing or reading data to/from the RAM is controlled.
Each time the K signal is input, the contents of the RAM are sequentially loaded or read, and the operation of supplying the contents of the counter 32 to the RAM is controlled.

Writing and reading to RA and M are performed by inputting write and read signals to line 78, which are output from a control circuit (not shown). The write and read signals are also input to the buffer circuit 15, so that the signal transmission direction of the buffer circuit 5 is controlled.

The output signal of the AND circuit 36 is inputted to an AND gate 47 via a delay circuit 70 and a one-shot multi-pipe relay 71, and the AND gate 47 is input to the comparison circuits 42 and 43.
In addition, the adder 40 and the subtracter 41 have an output value of zero when their respective inputs are zero. Offset switch circuit 72 so that
is mediated. The flip-flops 26, 27,
65 and counters 28.degree. and 29, upon completion of a series of determination operations, a termination signal is inputted from the one-shot multivibrator 69 via the OR gate 24, thereby setting them to 9.

The flip-flops 26, 27 are provided with external start switch circuits 73.27 to enable manual operation from the outside.
74 is interposed. That is, the external start switch circuit 73 is connected to the flip-flop 26 via the pulse code oscillation circuit 75 and the 0 mode circuit 34, and the external start switch circuit 74 is connected to the pulse code generation circuit 76.
．． The flip-flop 27 is connected via the one-shot multivibrator 77 and a changeover switch SWs between internal automatic operation and external manual operation. External start switch circuit 73 and pulse code generation circuit 7
5 has the same function as the operation signal generation circuit 33, and an external start switch circuit 74, a pulse code generation circuit 76, and a one-shot multivibrator 77 have the same function as the level sensitivity adjustment circuit 61. . Note that VB is for varying the level value output from the amplifier 12.

Next, as shown in FIGS. 6 to 9, if we explain the state observed in the defective C1R,T of the coil Lx to be judged, in FIGS. 6 to 9, 80 is the ideal good product. This is the transient response voltage waveform of the coil. Furthermore, in FIGS. 6 to 9, the vertical axis represents voltage and the horizontal axis represents time, similarly to FIGS. 2 and 4. Coil Lx to be determined
If it is a good product, it overlaps with the transient response voltage waveform 80 or the tolerance width T with respect to the transient response voltage waveform 80.
Transient response voltage waveforms are scattered within. Coil L to be judged
When x has caused a rare shoot, as shown in FIG.
The voltage level of the transient response voltage waveform 81 of Therefore, the vibration frequency of the transient response changes, and for example, if the number of turns is large, the vibration frequency becomes low.Also, if there is a short circuit between the terminals of the coil A/LX, as shown in Fig.
3't'', and when the coil Lx is disconnected, only voltage appears between the terminals of the coil Lx, as shown at 84 in Figure 9, and no current flows, causing vibration. It can be used as is for overpressure tests, and
By determining the welding current waveform as described above, it is also possible to measure the quality of the welding state.

As described above, according to the determination device for various coils according to the present invention, the transient response of the coil to be determined for defects such as rare shoot, difference in the number of agents, disconnection, etc. of various coils with respect to the reference waveform of an ideal coil. By digitally comparing and analyzing waveforms, it is possible to automatically distinguish between good and defective products.
It has great effects, such as being highly suitable for incorporation into automatic production lines.

[Brief explanation of drawings]

The drawings show an embodiment of the percent packing coil determination device according to the present invention, FIG. 1 is a circuit diagram for explaining the principle of the determination device, FIG. 2 is a voltage waveform diagram of the transient response in FIG. 1, Third
The figure is a block diagram of the determination device of the present invention, FIG. 4 is a waveform diagram showing the plotting state when the transient response voltage waveform obtained in FIG. The circuit diagram of the determination device in FIG. 3 and FIGS. 6 to 9 are waveform diagrams by C8R and T showing the defective state of the coil to be determined.Lx...Coil Ll to be determined °°°Coil Lx Self-inductance...
・Resistance Co, Cs of coil Lx...Capacitor 8W,...Switched...Surge voltage generation circuit 2...Digital memory 3...Microcomputer 0 figure 81 0j3 figure 3 fang 7 figure' )-9Figure 4

Claims (1)

[Claims] It has a surge voltage generation circuit that supplies a surge voltage to a coil to be determined, and a microcomputer in which an ideal transient response waveform of the coil is digitally encoded and stored in advance, and the microcomputer supplies the surge voltage. It is characterized by digitally encoding the transient response waveform occurring in the coil to be judged, then performing a comparison operation with the digital code of the ideal transient response waveform of the coil stored in advance, and outputting the result of the operation. Determination device for various coils.