JPS6057444A - ファ−ムウエア装置診断試験方式 - Google Patents

ファ−ムウエア装置診断試験方式

Info

Publication number
JPS6057444A
JPS6057444A JP58165950A JP16595083A JPS6057444A JP S6057444 A JPS6057444 A JP S6057444A JP 58165950 A JP58165950 A JP 58165950A JP 16595083 A JP16595083 A JP 16595083A JP S6057444 A JPS6057444 A JP S6057444A
Authority
JP
Japan
Prior art keywords
program
diagnostic test
microprocessor
processing unit
diagnosis test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58165950A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6326415B2 (enrdf_load_stackoverflow
Inventor
Kunitoshi Otsuki
大月 邦俊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP58165950A priority Critical patent/JPS6057444A/ja
Publication of JPS6057444A publication Critical patent/JPS6057444A/ja
Publication of JPS6326415B2 publication Critical patent/JPS6326415B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/261Functional testing by simulating additional hardware, e.g. fault simulation

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP58165950A 1983-09-09 1983-09-09 ファ−ムウエア装置診断試験方式 Granted JPS6057444A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58165950A JPS6057444A (ja) 1983-09-09 1983-09-09 ファ−ムウエア装置診断試験方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58165950A JPS6057444A (ja) 1983-09-09 1983-09-09 ファ−ムウエア装置診断試験方式

Publications (2)

Publication Number Publication Date
JPS6057444A true JPS6057444A (ja) 1985-04-03
JPS6326415B2 JPS6326415B2 (enrdf_load_stackoverflow) 1988-05-30

Family

ID=15822093

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58165950A Granted JPS6057444A (ja) 1983-09-09 1983-09-09 ファ−ムウエア装置診断試験方式

Country Status (1)

Country Link
JP (1) JPS6057444A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS6326415B2 (enrdf_load_stackoverflow) 1988-05-30

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