JPS6057226A - 放射温度計 - Google Patents

放射温度計

Info

Publication number
JPS6057226A
JPS6057226A JP16711383A JP16711383A JPS6057226A JP S6057226 A JPS6057226 A JP S6057226A JP 16711383 A JP16711383 A JP 16711383A JP 16711383 A JP16711383 A JP 16711383A JP S6057226 A JPS6057226 A JP S6057226A
Authority
JP
Japan
Prior art keywords
light
polarized light
emissivity
measured
receiving element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16711383A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0260132B2 (enrdf_load_stackoverflow
Inventor
Masahiro Watari
正博 渡
Kan Fujimoto
敢 藤本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Hokushin Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hokushin Electric Corp filed Critical Yokogawa Hokushin Electric Corp
Priority to JP16711383A priority Critical patent/JPS6057226A/ja
Publication of JPS6057226A publication Critical patent/JPS6057226A/ja
Publication of JPH0260132B2 publication Critical patent/JPH0260132B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/58Radiation pyrometry, e.g. infrared or optical thermometry using absorption; using extinction effect
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J2005/0074Radiation pyrometry, e.g. infrared or optical thermometry having separate detection of emissivity

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)
JP16711383A 1983-09-09 1983-09-09 放射温度計 Granted JPS6057226A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16711383A JPS6057226A (ja) 1983-09-09 1983-09-09 放射温度計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16711383A JPS6057226A (ja) 1983-09-09 1983-09-09 放射温度計

Publications (2)

Publication Number Publication Date
JPS6057226A true JPS6057226A (ja) 1985-04-03
JPH0260132B2 JPH0260132B2 (enrdf_load_stackoverflow) 1990-12-14

Family

ID=15843672

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16711383A Granted JPS6057226A (ja) 1983-09-09 1983-09-09 放射温度計

Country Status (1)

Country Link
JP (1) JPS6057226A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04233421A (ja) * 1990-11-30 1992-08-21 Krishnan Shanker 遠隔物体の熱力学的温度又は他の表面物性の非接触的測定方法及び該測定方法に用いる測定装置
CN105319239A (zh) * 2015-12-03 2016-02-10 河南师范大学 一种材料极化方向发射率测量装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04233421A (ja) * 1990-11-30 1992-08-21 Krishnan Shanker 遠隔物体の熱力学的温度又は他の表面物性の非接触的測定方法及び該測定方法に用いる測定装置
CN105319239A (zh) * 2015-12-03 2016-02-10 河南师范大学 一种材料极化方向发射率测量装置
CN105319239B (zh) * 2015-12-03 2017-11-28 河南师范大学 一种材料极化方向发射率测量装置的控制方法

Also Published As

Publication number Publication date
JPH0260132B2 (enrdf_load_stackoverflow) 1990-12-14

Similar Documents

Publication Publication Date Title
EP3413022A1 (en) Integrated polarization interferometer and snapshot spectrophotometer applying same
US7253902B2 (en) Wavelength detector
CA1203398A (en) Dual differential interferometer
Azzam Beam-splitters for the division-of-amplitude photopolarimeter
CA2766461A1 (en) Beamsplitter configuration for optical subtraction of self emission with fourier transform spectrometer in dual input port mode
JPS6057226A (ja) 放射温度計
JPH04500409A (ja) 物理量の離隔測定のためのオプトエレクトロニック装置
WO2024146600A1 (zh) 干涉解调装置和干涉测量系统
JPS59164914A (ja) 光学式スケ−ル読取装置
JPH05264220A (ja) 距離測定のための光学的方法と光学装置、および部品の相対的位置決めへのその応用
JPH076841B2 (ja) 偏光角検出方法および偏光角検出装置
JPS6057223A (ja) 放射温度計を用いた温度測定方法
WO2025182774A1 (ja) 放射温度測定装置、放射温度測定方法、及び、放射温度測定用プログラム
JPS6055011B2 (ja) 温度検出装置
JPH03287030A (ja) 光ファイバ放射温度計
JPS6058522A (ja) 放射温度計
Nee Birefringence characterization using transmission ellipsometry
JPH01250778A (ja) 光学検出装置
JPS6130727A (ja) 物体の温度測定方法及びその方法を用いた放射温度計
SU1032375A1 (ru) Способ измерени коэффициента отражени оптической поверхности
JPH05164615A (ja) 放射測温装置
JPH0365637A (ja) 薄膜の屈折率・膜厚測定方法
JPH0654217B2 (ja) 干渉膜厚測定方法
RU1779915C (ru) Способ контрол углового положени объектов
JPH04355308A (ja) 多層膜厚測定装置