JPS605124U - semiconductor integrated circuit element - Google Patents
semiconductor integrated circuit elementInfo
- Publication number
- JPS605124U JPS605124U JP9772183U JP9772183U JPS605124U JP S605124 U JPS605124 U JP S605124U JP 9772183 U JP9772183 U JP 9772183U JP 9772183 U JP9772183 U JP 9772183U JP S605124 U JPS605124 U JP S605124U
- Authority
- JP
- Japan
- Prior art keywords
- integrated circuit
- circuit element
- semiconductor integrated
- transistor
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来のＩＣ素子を有する半導体ウェーハの平面
図、第２図は本考案によるＩＣ素子の実記 施例を示
す半導体ウェーハの部分拡大図を含む平４ 面図、第３
図は第２図のＩＣ素子における要部のジ 等価回路図
、第４図は第２図のＩＣ素子の部分概寥 略断面図、
第５図は第３図のトランジスタのＶ−Ｉ士 関係図で
ある。 ゛
４・・・・・・半導体ウェーハ、５・・・・・・半導体
集積回路素子（ＩＣ素子）、６・・・・・・トランジス
タ、７・・曲性−性測定専用トランジスタ、８・・・・
・・半導体抵抗。Fig. 1 is a plan view of a semiconductor wafer having a conventional IC element, Fig. 2 is a plan view including a partially enlarged view of the semiconductor wafer showing an embodiment of the IC element according to the present invention, and Fig. 3 is a plan view of a semiconductor wafer having a conventional IC element.
The figure is an equivalent circuit diagram of the main parts of the IC element in Figure 2, and Figure 4 is a partial schematic cross-sectional view of the IC element in Figure 2.
FIG. 5 is a V-I relationship diagram of the transistor shown in FIG.゛4...Semiconductor wafer, 5...Semiconductor integrated circuit element (IC element), 6...Transistor, 7...Transistor dedicated to curvature measurement, 8...・・・
...Semiconductor resistance.
Claims (1)
素子であって、その内部に所望のトランジ；りを含む集
積回路要素と独立させて前記トランらスタと同一条件で
且つベースとコレクタ間に半導体抵抗を接続させた特性
測定専用トランジスタイ形成したことを特徴とする半導
体集積回路素子。A plurality of semiconductor collector circuit elements formed on a semiconductor wafer, which are independent of an integrated circuit element including a desired transistor therein, under the same conditions as the transistor, and between a base and a collector. A semiconductor integrated circuit element characterized by forming a transistor exclusively for measuring characteristics to which a resistor is connected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9772183U JPS605124U (en) | 1983-06-23 | 1983-06-23 | semiconductor integrated circuit element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9772183U JPS605124U (en) | 1983-06-23 | 1983-06-23 | semiconductor integrated circuit element |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS605124U true JPS605124U (en) | 1985-01-14 |
Family
ID=30232322
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9772183U Pending JPS605124U (en) | 1983-06-23 | 1983-06-23 | semiconductor integrated circuit element |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS605124U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7677800B2 (en) | 2007-03-23 | 2010-03-16 | Fujifilm Corporation | Radiological imaging apparatus, radiological imaging method, and program |
-
1983
- 1983-06-23 JP JP9772183U patent/JPS605124U/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7677800B2 (en) | 2007-03-23 | 2010-03-16 | Fujifilm Corporation | Radiological imaging apparatus, radiological imaging method, and program |
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