JPS605124U - semiconductor integrated circuit element - Google Patents

semiconductor integrated circuit element

Info

Publication number
JPS605124U
JPS605124U JP9772183U JP9772183U JPS605124U JP S605124 U JPS605124 U JP S605124U JP 9772183 U JP9772183 U JP 9772183U JP 9772183 U JP9772183 U JP 9772183U JP S605124 U JPS605124 U JP S605124U
Authority
JP
Japan
Prior art keywords
integrated circuit
circuit element
semiconductor integrated
transistor
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9772183U
Other languages
Japanese (ja)
Inventor
金巻 政幸
Original Assignee
日本電気ホームエレクトロニクス株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電気ホームエレクトロニクス株式会社 filed Critical 日本電気ホームエレクトロニクス株式会社
Priority to JP9772183U priority Critical patent/JPS605124U/en
Publication of JPS605124U publication Critical patent/JPS605124U/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のIC素子を有する半導体ウェーハの平面
図、第2図は本考案によるIC素子の実記  施例を示
す半導体ウェーハの部分拡大図を含む平4 面図、第3
図は第2図のIC素子における要部のジ  等価回路図
、第4図は第2図のIC素子の部分概寥  略断面図、
第5図は第3図のトランジスタのV−I士  関係図で
ある。   ゛ 4・・・・・・半導体ウェーハ、5・・・・・・半導体
集積回路素子(IC素子)、6・・・・・・トランジス
タ、7・・曲性−性測定専用トランジスタ、8・・・・
・・半導体抵抗。
Fig. 1 is a plan view of a semiconductor wafer having a conventional IC element, Fig. 2 is a plan view including a partially enlarged view of the semiconductor wafer showing an embodiment of the IC element according to the present invention, and Fig. 3 is a plan view of a semiconductor wafer having a conventional IC element.
The figure is an equivalent circuit diagram of the main parts of the IC element in Figure 2, and Figure 4 is a partial schematic cross-sectional view of the IC element in Figure 2.
FIG. 5 is a V-I relationship diagram of the transistor shown in FIG.゛4...Semiconductor wafer, 5...Semiconductor integrated circuit element (IC element), 6...Transistor, 7...Transistor dedicated to curvature measurement, 8...・・・
...Semiconductor resistance.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体ウェーハに複数個形成された半導体集毛゛ 回路
素子であって、その内部に所望のトランジ;りを含む集
積回路要素と独立させて前記トランらスタと同一条件で
且つベースとコレクタ間に半導体抵抗を接続させた特性
測定専用トランジスタイ形成したことを特徴とする半導
体集積回路素子。
A plurality of semiconductor collector circuit elements formed on a semiconductor wafer, which are independent of an integrated circuit element including a desired transistor therein, under the same conditions as the transistor, and between a base and a collector. A semiconductor integrated circuit element characterized by forming a transistor exclusively for measuring characteristics to which a resistor is connected.
JP9772183U 1983-06-23 1983-06-23 semiconductor integrated circuit element Pending JPS605124U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9772183U JPS605124U (en) 1983-06-23 1983-06-23 semiconductor integrated circuit element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9772183U JPS605124U (en) 1983-06-23 1983-06-23 semiconductor integrated circuit element

Publications (1)

Publication Number Publication Date
JPS605124U true JPS605124U (en) 1985-01-14

Family

ID=30232322

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9772183U Pending JPS605124U (en) 1983-06-23 1983-06-23 semiconductor integrated circuit element

Country Status (1)

Country Link
JP (1) JPS605124U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7677800B2 (en) 2007-03-23 2010-03-16 Fujifilm Corporation Radiological imaging apparatus, radiological imaging method, and program

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7677800B2 (en) 2007-03-23 2010-03-16 Fujifilm Corporation Radiological imaging apparatus, radiological imaging method, and program

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