JPS6031283A - Tester for light emitting semiconductor device - Google Patents
Tester for light emitting semiconductor deviceInfo
- Publication number
- JPS6031283A JPS6031283A JP58139008A JP13900883A JPS6031283A JP S6031283 A JPS6031283 A JP S6031283A JP 58139008 A JP58139008 A JP 58139008A JP 13900883 A JP13900883 A JP 13900883A JP S6031283 A JPS6031283 A JP S6031283A
- Authority
- JP
- Japan
- Prior art keywords
- emitting semiconductor
- light emitting
- semiconductor device
- light
- optical fiber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Led Devices (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は、発光半導体装置の試験装置に関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a testing device for light emitting semiconductor devices.
一般に、発光半導体装置の試験は発光半導体装置の発光
する光出力を常に一定に保つ自動光出力制御方式が採用
されている。Generally, when testing light emitting semiconductor devices, an automatic light output control method is used to keep the light output of the light emitting semiconductor device constant at all times.
恒温槽内に設置した、被試験発光装置の光出力を光ファ
イバを通して別の恒温槽内に設置した光検出器に、上記
光出力を導き、定出力動作を実施するのであるが従来は
、１個の発光装置につき、１個の光検出器が必要であシ
、試験を実施しようとする発光装置の数を多くしたけれ
ばそれだけ、光検出器の数を増やざなけれはならない。The light output of the light emitting device under test installed in a thermostatic chamber is guided through an optical fiber to a photodetector installed in another thermostatic chamber to perform constant output operation. One photodetector is required for each light-emitting device, and the more light-emitting devices to be tested, the more the number of photodetectors must be increased.
本発明は、従来のこの様な欠点を解決することのできる
発光半導体装置の試験装置を提供することを目的とする
。SUMMARY OF THE INVENTION An object of the present invention is to provide a test device for a light emitting semiconductor device that can solve these conventional drawbacks.
本発明によれば恒温槽内に設置した複数の被試験発光半
導体装置について、各被試験発光半導体装置の光出力を
、それぞれ光ファイバを介して光スィッチに導き、この
光スィッチよシ一定時間ごとに、各被試験発光半導体装
置の光出力を順々に上記恒温槽とは別の恒温槽内に設置
しである１個の光検出器に、光ファイバとは別の光ファ
イバを介して導き複数の被試験発光半導体装置の光出ヵ
を監視することを特徴とする発光半導体装置の試験装置
が得られる。According to the present invention, for a plurality of light emitting semiconductor devices to be tested installed in a thermostatic chamber, the optical output of each light emitting semiconductor device to be tested is guided to an optical switch via an optical fiber, and the optical switch Then, the optical output of each light-emitting semiconductor device under test is sequentially guided to one photodetector installed in a constant temperature chamber different from the above-mentioned constant temperature chamber via an optical fiber other than the optical fiber. A light emitting semiconductor device testing apparatus is obtained, which is characterized in that it monitors the light output of a plurality of light emitting semiconductor devices under test.
以下、本発明の詳細を図面で説明する。Hereinafter, details of the present invention will be explained with reference to the drawings.
第１図は従来の寿命試験装置の１例を示す図である。FIG. 1 is a diagram showing an example of a conventional life test device.
第２図は、本発明による発光半導体装置の寿命試験装置
の１実施例を示す図である。恒温槽１内に設置した複数
の被試験発光半導体装置２について、各被試験発光半導
体装置２の光出力をそれぞれ光ファイバ４を介して光ス
ィッチ５に導き、光スィッチ４よシ、一定時間ごとに各
被試験発光半導体装置２の光出力をそれぞれ順々に恒温
槽１′円に設置しである１個の光検出器３に、光ファイ
バ４′を介して、導くことによシ複数の被試験発光半導
体装置の光出力を監視することができる。すなわち、一
本発明によれば、１個の光検出器だけで、複数の被試験
発光半導体装置の寿命試験Ｚ実施することができる。FIG. 2 is a diagram showing an embodiment of a life test device for a light emitting semiconductor device according to the present invention. Regarding a plurality of light emitting semiconductor devices 2 to be tested installed in a thermostatic chamber 1, the optical output of each light emitting semiconductor device 2 to be tested is guided to an optical switch 5 via an optical fiber 4, and the light output from each light emitting semiconductor device 2 to be tested is guided to an optical switch 5 at regular intervals. The light output of each light-emitting semiconductor device 2 under test is sequentially guided to one photodetector 3 installed in a thermostatic chamber 1' via an optical fiber 4'. The light output of the light emitting semiconductor device under test can be monitored. That is, according to the present invention, the life test Z of a plurality of light emitting semiconductor devices to be tested can be carried out using only one photodetector.
第１図は従来の発光半導体装置の寿命試験装置の一例を
示す概略図であり、第２図は本発明による発光半導体装
置の寿命試験装置の一実施例を示す概略図である。
１．１′・・・・・・恒温槽、２・・・・・・被試験発
光半導体装置、３・・−・・・光検出器、４，４′・・
・・・・光ファイバー、５・・−・・光スィッチ。FIG. 1 is a schematic diagram showing an example of a conventional life test device for a light emitting semiconductor device, and FIG. 2 is a schematic diagram showing an example of a life test device for a light emitting semiconductor device according to the present invention. 1.1'... Constant temperature chamber, 2... Light emitting semiconductor device under test, 3... Photodetector, 4,4'...
...optical fiber, 5...optical switch.
Claims (1)
て、各被試験発光半導体装置の光出力を、それぞれ光フ
ァイバを介して元スイッチに導き、前記光スィッチよシ
一定時間ごとに、前記各被試験発光半導体装置の光出力
を順々に前記恒温槽とは別の恒温槽内に設置しである１
個の光検出器に、前記光ファイバとは別の光ファイバを
介して導き複数の被試験発光半導体装置の光出力を監視
することを特徴とする発光半導体装置の試験装置。For a plurality of light-emitting semiconductor devices under test installed in a thermostatic chamber, the optical output of each light-emitting semiconductor device under test is guided to the original switch via an optical fiber, and the optical switch The light output of the test light emitting semiconductor device is placed in a constant temperature chamber different from the constant temperature chamber in order.
1. A test apparatus for a light emitting semiconductor device, characterized in that the light output of a plurality of light emitting semiconductor devices under test is monitored by guiding the light output to a plurality of photodetectors via an optical fiber different from the optical fiber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58139008A JPS6031283A (en) | 1983-07-29 | 1983-07-29 | Tester for light emitting semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58139008A JPS6031283A (en) | 1983-07-29 | 1983-07-29 | Tester for light emitting semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6031283A true JPS6031283A (en) | 1985-02-18 |
Family
ID=15235321
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58139008A Pending JPS6031283A (en) | 1983-07-29 | 1983-07-29 | Tester for light emitting semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6031283A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61235769A (en) * | 1985-04-11 | 1986-10-21 | Nippon Eng Kk | Method and device for aging or screening semiconductor laser |
| EP0285493A2 (en) * | 1987-03-23 | 1988-10-05 | Optomistic Products | Apparatus for testing light-emitting devices |
| JP2015169524A (en) * | 2014-03-06 | 2015-09-28 | 株式会社アドバンテスト | Test device, calibration device, calibration method, and test method |
-
1983
- 1983-07-29 JP JP58139008A patent/JPS6031283A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61235769A (en) * | 1985-04-11 | 1986-10-21 | Nippon Eng Kk | Method and device for aging or screening semiconductor laser |
| EP0285493A2 (en) * | 1987-03-23 | 1988-10-05 | Optomistic Products | Apparatus for testing light-emitting devices |
| JP2015169524A (en) * | 2014-03-06 | 2015-09-28 | 株式会社アドバンテスト | Test device, calibration device, calibration method, and test method |
| US9791512B2 (en) | 2014-03-06 | 2017-10-17 | Advantest Corporation | Test apparatus, test method, calibration device, and calibration method |
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