JPS5791534A - Lifetime tester for light receiving semiconductor device - Google Patents

Lifetime tester for light receiving semiconductor device

Info

Publication number
JPS5791534A
JPS5791534A JP55167556A JP16755680A JPS5791534A JP S5791534 A JPS5791534 A JP S5791534A JP 55167556 A JP55167556 A JP 55167556A JP 16755680 A JP16755680 A JP 16755680A JP S5791534 A JPS5791534 A JP S5791534A
Authority
JP
Japan
Prior art keywords
tank
light
light receiving
receiving semiconductor
source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55167556A
Other languages
Japanese (ja)
Inventor
Minoru Wago
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP55167556A priority Critical patent/JPS5791534A/en
Publication of JPS5791534A publication Critical patent/JPS5791534A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Light Receiving Elements (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To eliminate the temperature correction of a light source using a light emitting diode by introducing the light output of the light source installed out of a constant temperature tank into the tank via an optical fiber and supplying it to a light receiving semiconductor to be tested mounted in the tank. CONSTITUTION:A light source 2 is mounted out of a constant temperature tank 3, the light output of the source 2 is supplied to a light receiving semiconductor to be tested via an optical fiber 4 mounted at one end in the tank 3 and at the other out of the tank 3. Since the source 2 is not affected by the influence of the internal temperature of the tank 3, it can eliminate the correction of the set light output upon change of the testing temperature, thereby shortening the time required for the test.
JP55167556A 1980-11-28 1980-11-28 Lifetime tester for light receiving semiconductor device Pending JPS5791534A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55167556A JPS5791534A (en) 1980-11-28 1980-11-28 Lifetime tester for light receiving semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55167556A JPS5791534A (en) 1980-11-28 1980-11-28 Lifetime tester for light receiving semiconductor device

Publications (1)

Publication Number Publication Date
JPS5791534A true JPS5791534A (en) 1982-06-07

Family

ID=15851905

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55167556A Pending JPS5791534A (en) 1980-11-28 1980-11-28 Lifetime tester for light receiving semiconductor device

Country Status (1)

Country Link
JP (1) JPS5791534A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59168378A (en) * 1983-03-14 1984-09-22 Canon Inc Measuring apparatus for image pickup element or the like
JPS59178742A (en) * 1983-03-30 1984-10-11 Fujitsu Ltd Method for measuring characteristic of semiconductor light receiving element

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4924685A (en) * 1972-07-03 1974-03-05

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4924685A (en) * 1972-07-03 1974-03-05

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59168378A (en) * 1983-03-14 1984-09-22 Canon Inc Measuring apparatus for image pickup element or the like
JPS59178742A (en) * 1983-03-30 1984-10-11 Fujitsu Ltd Method for measuring characteristic of semiconductor light receiving element
JPH0117251B2 (en) * 1983-03-30 1989-03-29 Fujitsu Ltd

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