JPS56120178A - Test device of luminous semiconductor device - Google Patents

Test device of luminous semiconductor device

Info

Publication number
JPS56120178A
JPS56120178A JP2482980A JP2482980A JPS56120178A JP S56120178 A JPS56120178 A JP S56120178A JP 2482980 A JP2482980 A JP 2482980A JP 2482980 A JP2482980 A JP 2482980A JP S56120178 A JPS56120178 A JP S56120178A
Authority
JP
Japan
Prior art keywords
thermostat
luminous semiconductor
photo
detector
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2482980A
Other languages
Japanese (ja)
Inventor
Minoru Wago
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP2482980A priority Critical patent/JPS56120178A/en
Publication of JPS56120178A publication Critical patent/JPS56120178A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Led Devices (AREA)

Abstract

PURPOSE:To shorten a necessary time for testing by leading a photo-output of a tested semiconductor toward outside of a thermostat using an optical fiber and monitoring it with a detector. CONSTITUTION:A photo-output 5 of a tested element from an optical fiber is led toward outside of a thermostat 3. A photodetector 3 is set outside of the thermostat 3. Accordingly, if the temperature of the thermostat changes, there is no need of the temperature correction of the detector 2. Accordingly, a necessary testing time is shortened.
JP2482980A 1980-02-28 1980-02-28 Test device of luminous semiconductor device Pending JPS56120178A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2482980A JPS56120178A (en) 1980-02-28 1980-02-28 Test device of luminous semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2482980A JPS56120178A (en) 1980-02-28 1980-02-28 Test device of luminous semiconductor device

Publications (1)

Publication Number Publication Date
JPS56120178A true JPS56120178A (en) 1981-09-21

Family

ID=12149073

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2482980A Pending JPS56120178A (en) 1980-02-28 1980-02-28 Test device of luminous semiconductor device

Country Status (1)

Country Link
JP (1) JPS56120178A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61129178U (en) * 1985-01-31 1986-08-13
JP2011179937A (en) * 2010-03-01 2011-09-15 Hirayama Seisakusho:Kk Led life testing method and apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4924685A (en) * 1972-07-03 1974-03-05
JPS541010B1 (en) * 1969-12-22 1979-01-19

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS541010B1 (en) * 1969-12-22 1979-01-19
JPS4924685A (en) * 1972-07-03 1974-03-05

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61129178U (en) * 1985-01-31 1986-08-13
JP2011179937A (en) * 2010-03-01 2011-09-15 Hirayama Seisakusho:Kk Led life testing method and apparatus

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