JPS6030732Y2 - Glass substrate holding inspection jig - Google Patents

Glass substrate holding inspection jig

Info

Publication number
JPS6030732Y2
JPS6030732Y2 JP6537976U JP6537976U JPS6030732Y2 JP S6030732 Y2 JPS6030732 Y2 JP S6030732Y2 JP 6537976 U JP6537976 U JP 6537976U JP 6537976 U JP6537976 U JP 6537976U JP S6030732 Y2 JPS6030732 Y2 JP S6030732Y2
Authority
JP
Japan
Prior art keywords
glass substrate
substrate holding
inspection jig
glass
metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP6537976U
Other languages
Japanese (ja)
Other versions
JPS52156750U (en
Inventor
義英 南山
昭 藤田
Original Assignee
株式会社日立製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社日立製作所 filed Critical 株式会社日立製作所
Priority to JP6537976U priority Critical patent/JPS6030732Y2/en
Publication of JPS52156750U publication Critical patent/JPS52156750U/ja
Application granted granted Critical
Publication of JPS6030732Y2 publication Critical patent/JPS6030732Y2/en
Expired legal-status Critical Current

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Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Microscoopes, Condenser (AREA)

Description

【考案の詳細な説明】 従来、撮像管用面板、表示素子用ガラス基板等の保持、
検査治具は金属製樹脂製、ガラス製等で作成されており
各工程で必要な治具への乗せ換を実施している。
[Detailed description of the invention] Conventionally, it has been used to hold face plates for image pickup tubes, glass substrates for display elements, etc.
Inspection jigs are made of metal, resin, glass, etc., and are replaced with the necessary jigs in each process.

しかし上記部品は数mμオーダーの塵付着も製品欠陥と
なり、我々の実験では乗せ換るたび塵付着ポテンシャル
を増大している事が確認出来た。
However, for the above-mentioned parts, dust adhesion on the order of several microns can also cause product defects, and our experiments have confirmed that the dust adhesion potential increases each time the parts are replaced.

また、上記被保持部品との接触部及び周辺部に塵付着が
ある場合も部品への付着ポテンシャルが高いことが確認
出来た。
Furthermore, it was confirmed that the potential for adhesion to the component is high even when there is dust adhesion to the contact area and surrounding area with the component to be held.

このような実験結果から面板等の保持部は静電気を帯び
ることなく、くり返し使用する場合洗浄、高温処理が可
能であり、他の部分は光学的検査が可能なように透明で
あることが要求される。
From these experimental results, it is required that the holding parts such as the face plate do not carry static electricity and can be washed and subjected to high temperature treatment when used repeatedly, and that other parts are transparent to enable optical inspection. Ru.

しかし、従来使用治具は金属、樹脂、ガラス等で同一材
料で作成しており金属製では光学的検査のための乗せ換
、樹脂製では樹脂治具自体からの発塵静電気による塵付
着、高温処理が出来ないガラス製は静電気による塵付着
、高温処理が出来ない取扱いでのクラック発生など種々
の難点があつた。
However, conventionally used jigs are made of the same materials such as metal, resin, and glass, and with metal jigs, they are replaced for optical inspection, and with resin jigs, there is dust adhesion due to static electricity generated from the resin jigs themselves, and high temperatures. Glass products that cannot be treated have various drawbacks, such as dust adhesion due to static electricity and cracks when handled because they cannot be treated at high temperatures.

本考案は保持部を金属製にする事により静電気による集
塵作用を防止し、他の部分を透明な樹脂あるいはガラス
製とすることにより光学的検査が同一治具で実施可能と
腰更に金属部と樹脂あるいはガラス部を切り離せる構造
とすることによるくり返し使用のための洗浄、高温処理
が独立で実施することが可能となり防塵効果を高める事
が可能となった。
In this invention, the holding part is made of metal to prevent dust collection due to static electricity, and the other parts are made of transparent resin or glass, making it possible to conduct optical inspections with the same jig. By creating a structure in which the plastic or glass parts can be separated, cleaning and high-temperature treatment for repeated use can be carried out independently, making it possible to enhance the dust-proofing effect.

第1図は本考案の一実施例を示し、同図に於いて、ガラ
ス基板等1の具体的実施例を示すものである。
FIG. 1 shows an embodiment of the present invention, and in the same figure, a specific embodiment of a glass substrate etc. 1 is shown.

保持部を金属製2とする事により静電気を帯びる事の防
止し、治具自体からの発塵は完全に防止出来る。
By making the holding part 2 made of metal, static electricity can be prevented and dust generation from the jig itself can be completely prevented.

更に、面板との接触を保持に必要最少限の構造とするこ
とにより面板端面クラックを最少にすることが出来る。
Furthermore, cracks on the end face of the face plate can be minimized by reducing the contact with the face plate to the minimum necessary for holding.

また、樹脂部あるいはガラス部3をもうけることにより
照明光をその側面外側からその側面を通して面板に当て
ることが可能となり面板上の微少欠陥検出が可能となっ
た。
Further, by providing the resin part or the glass part 3, it becomes possible to apply illumination light to the face plate from the outside of the side surface through the side surface, and it becomes possible to detect minute defects on the face plate.

また、金属部2と樹脂あるいはガラス部3を切離しを可
能とするためかん合組立構造としているためくり返し使
用に当って洗浄、高温処理を独自に行なえ、面板への塵
付着を防止する事が可能となった。
In addition, since the metal part 2 and the resin or glass part 3 can be separated, they have an interlocking assembly structure, so they can be independently cleaned and treated at high temperatures for repeated use, and it is possible to prevent dust from adhering to the face plate. It became.

【図面の簡単な説明】[Brief explanation of the drawing]

図は本考案による検査治具の一実施例を示す要部断面図
である。 1・・・・・・ガラス基板、 2・・・・・・金属性保持部、 3・・・ ・・・透明材料支持構体。
The figure is a sectional view of essential parts showing an embodiment of the inspection jig according to the present invention. DESCRIPTION OF SYMBOLS 1...Glass substrate, 2...Metal holding part, 3...Transparent material support structure.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] ガラス基板を載置してその光学的検査を行なうためのガ
ラス基板保持検査治具においてガラス基板の周辺部を直
接保持する金属からなる基板保持部と、該基板保持部を
着脱可能に載置する透明筒部とからなることを特徴とす
るガラス基板保持検査治具。
A glass substrate holding inspection jig for placing a glass substrate and performing optical inspection thereof includes a substrate holding part made of metal that directly holds the peripheral part of the glass substrate, and the substrate holding part is removably mounted. A glass substrate holding/inspection jig comprising a transparent cylindrical part.
JP6537976U 1976-05-24 1976-05-24 Glass substrate holding inspection jig Expired JPS6030732Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6537976U JPS6030732Y2 (en) 1976-05-24 1976-05-24 Glass substrate holding inspection jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6537976U JPS6030732Y2 (en) 1976-05-24 1976-05-24 Glass substrate holding inspection jig

Publications (2)

Publication Number Publication Date
JPS52156750U JPS52156750U (en) 1977-11-28
JPS6030732Y2 true JPS6030732Y2 (en) 1985-09-14

Family

ID=28530342

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6537976U Expired JPS6030732Y2 (en) 1976-05-24 1976-05-24 Glass substrate holding inspection jig

Country Status (1)

Country Link
JP (1) JPS6030732Y2 (en)

Also Published As

Publication number Publication date
JPS52156750U (en) 1977-11-28

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