JPS60233508A - 寸法測定装置 - Google Patents

寸法測定装置

Info

Publication number
JPS60233508A
JPS60233508A JP59088455A JP8845584A JPS60233508A JP S60233508 A JPS60233508 A JP S60233508A JP 59088455 A JP59088455 A JP 59088455A JP 8845584 A JP8845584 A JP 8845584A JP S60233508 A JPS60233508 A JP S60233508A
Authority
JP
Japan
Prior art keywords
image signal
section
dimension
cursor
main body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59088455A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0444925B2 (enExample
Inventor
Masaaki Kano
加納　正明
Hiroshi Yamaji
山地　廣
Motosuke Miyoshi
元介 三好
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP59088455A priority Critical patent/JPS60233508A/ja
Publication of JPS60233508A publication Critical patent/JPS60233508A/ja
Publication of JPH0444925B2 publication Critical patent/JPH0444925B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP59088455A 1984-05-04 1984-05-04 寸法測定装置 Granted JPS60233508A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59088455A JPS60233508A (ja) 1984-05-04 1984-05-04 寸法測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59088455A JPS60233508A (ja) 1984-05-04 1984-05-04 寸法測定装置

Publications (2)

Publication Number Publication Date
JPS60233508A true JPS60233508A (ja) 1985-11-20
JPH0444925B2 JPH0444925B2 (enExample) 1992-07-23

Family

ID=13943269

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59088455A Granted JPS60233508A (ja) 1984-05-04 1984-05-04 寸法測定装置

Country Status (1)

Country Link
JP (1) JPS60233508A (enExample)

Also Published As

Publication number Publication date
JPH0444925B2 (enExample) 1992-07-23

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