JPS60227156A - シ−トの配向性測定方法 - Google Patents

シ−トの配向性測定方法

Info

Publication number
JPS60227156A
JPS60227156A JP8491684A JP8491684A JPS60227156A JP S60227156 A JPS60227156 A JP S60227156A JP 8491684 A JP8491684 A JP 8491684A JP 8491684 A JP8491684 A JP 8491684A JP S60227156 A JPS60227156 A JP S60227156A
Authority
JP
Japan
Prior art keywords
sheet
waveguide
angle
attenuation
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8491684A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0157730B2 (enExample
Inventor
Shigeyoshi Osaki
大崎 茂芳
Yoshihiko Fujii
藤井 良彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kanzaki Paper Manufacturing Co Ltd
Original Assignee
Kanzaki Paper Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kanzaki Paper Manufacturing Co Ltd filed Critical Kanzaki Paper Manufacturing Co Ltd
Priority to JP8491684A priority Critical patent/JPS60227156A/ja
Priority to EP19850302811 priority patent/EP0160488B1/en
Priority to DE8585302811T priority patent/DE3583179D1/de
Publication of JPS60227156A publication Critical patent/JPS60227156A/ja
Publication of JPH0157730B2 publication Critical patent/JPH0157730B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/02Investigating the presence of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)
  • Shaping By String And By Release Of Stress In Plastics And The Like (AREA)
JP8491684A 1984-04-25 1984-04-25 シ−トの配向性測定方法 Granted JPS60227156A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP8491684A JPS60227156A (ja) 1984-04-25 1984-04-25 シ−トの配向性測定方法
EP19850302811 EP0160488B1 (en) 1984-04-25 1985-04-22 Method for measuring orientation of constituents of sheets
DE8585302811T DE3583179D1 (de) 1984-04-25 1985-04-22 Verfahren zur messung der orientierung von bestandteilen in folien.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8491684A JPS60227156A (ja) 1984-04-25 1984-04-25 シ−トの配向性測定方法

Publications (2)

Publication Number Publication Date
JPS60227156A true JPS60227156A (ja) 1985-11-12
JPH0157730B2 JPH0157730B2 (enExample) 1989-12-07

Family

ID=13844040

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8491684A Granted JPS60227156A (ja) 1984-04-25 1984-04-25 シ−トの配向性測定方法

Country Status (3)

Country Link
EP (1) EP0160488B1 (enExample)
JP (1) JPS60227156A (enExample)
DE (1) DE3583179D1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62201355A (ja) * 1986-02-28 1987-09-05 Kanzaki Paper Mfg Co Ltd シート状試料の磁気的異方性測定方法
JP2006506230A (ja) * 2002-11-13 2006-02-23 エム−アイ エル.エル.シー. ふるい分け及びろ過用多孔性要素における損傷検知のためのシステム及び方法

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6176942A (ja) * 1984-09-22 1986-04-19 Kanzaki Paper Mfg Co Ltd 誘電体シートの配向性又は誘電特性の測定方法
US5619143A (en) * 1989-02-14 1997-04-08 Commonwealth Scientific And Industrial Research Organisation Microwave scanning apparatus
CA2046895C (en) * 1989-02-14 2000-11-14 Thomas James Stevens Microwave scanning apparatus
KR100390695B1 (ko) * 1995-05-29 2004-06-16 도요 보세키 가부시키가이샤 신디오택틱 구조를 갖는 배향성 폴리스티렌계 필름
US7894765B2 (en) * 2006-12-18 2011-02-22 Canon Kabushiki Kaisha Sheet processing apparatus and image forming apparatus for controlling a folding operation
US9258852B2 (en) 2007-04-26 2016-02-09 Southwire Company, Llc Microwave furnace
US9253826B2 (en) 2007-04-26 2016-02-02 Southwire Company, Llc Microwave furnace
US8357885B2 (en) 2007-04-26 2013-01-22 Southwire Company Microwave furnace
CN104460062B (zh) * 2014-12-12 2018-09-18 深圳市华星光电技术有限公司 一种光配向特性检测方法、装置及系统

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3103627A (en) * 1960-05-18 1963-09-10 Polarad Electronics Corp Microwave transmission molecular identification system employing wave propagation mode detectors
US3254298A (en) * 1963-09-09 1966-05-31 Burroughs Corp Instrument for measurement of thin magnetic film parameters
FI45799C (fi) * 1971-03-23 1972-09-11 Valmet Oy Menetelmä paperin tai vastaavan kuituorientaation määräämiseksi paperi sta heijastuneen valon avulla.

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62201355A (ja) * 1986-02-28 1987-09-05 Kanzaki Paper Mfg Co Ltd シート状試料の磁気的異方性測定方法
JP2006506230A (ja) * 2002-11-13 2006-02-23 エム−アイ エル.エル.シー. ふるい分け及びろ過用多孔性要素における損傷検知のためのシステム及び方法

Also Published As

Publication number Publication date
EP0160488A3 (en) 1988-03-16
JPH0157730B2 (enExample) 1989-12-07
EP0160488A2 (en) 1985-11-06
DE3583179D1 (de) 1991-07-18
EP0160488B1 (en) 1991-06-12

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