JPS60219382A - ウインドウレギユレ−タ - Google Patents
ウインドウレギユレ−タInfo
- Publication number
- JPS60219382A JPS60219382A JP7582984A JP7582984A JPS60219382A JP S60219382 A JPS60219382 A JP S60219382A JP 7582984 A JP7582984 A JP 7582984A JP 7582984 A JP7582984 A JP 7582984A JP S60219382 A JPS60219382 A JP S60219382A
- Authority
- JP
- Japan
- Prior art keywords
- guide rail
- carrier plate
- panel
- wire
- window
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Window Of Vehicle (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7582984A JPS60219382A (ja) | 1984-04-17 | 1984-04-17 | ウインドウレギユレ−タ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7582984A JPS60219382A (ja) | 1984-04-17 | 1984-04-17 | ウインドウレギユレ−タ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60219382A true JPS60219382A (ja) | 1985-11-02 |
| JPH0367187B2 JPH0367187B2 (pm) | 1991-10-22 |
Family
ID=13587463
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7582984A Granted JPS60219382A (ja) | 1984-04-17 | 1984-04-17 | ウインドウレギユレ−タ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60219382A (pm) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5345170A (en) | 1992-06-11 | 1994-09-06 | Cascade Microtech, Inc. | Wafer probe station having integrated guarding, Kelvin connection and shielding systems |
| US6380751B2 (en) | 1992-06-11 | 2002-04-30 | Cascade Microtech, Inc. | Wafer probe station having environment control enclosure |
| US5561377A (en) | 1995-04-14 | 1996-10-01 | Cascade Microtech, Inc. | System for evaluating probing networks |
| US6002263A (en) | 1997-06-06 | 1999-12-14 | Cascade Microtech, Inc. | Probe station having inner and outer shielding |
| US6445202B1 (en) | 1999-06-30 | 2002-09-03 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
| US6914423B2 (en) | 2000-09-05 | 2005-07-05 | Cascade Microtech, Inc. | Probe station |
| US6965226B2 (en) | 2000-09-05 | 2005-11-15 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| EP1432546A4 (en) | 2001-08-31 | 2006-06-07 | Cascade Microtech Inc | OPTICAL TESTING APPARATUS |
| US6777964B2 (en) | 2002-01-25 | 2004-08-17 | Cascade Microtech, Inc. | Probe station |
| US6847219B1 (en) | 2002-11-08 | 2005-01-25 | Cascade Microtech, Inc. | Probe station with low noise characteristics |
| US7250779B2 (en) | 2002-11-25 | 2007-07-31 | Cascade Microtech, Inc. | Probe station with low inductance path |
| US6861856B2 (en) | 2002-12-13 | 2005-03-01 | Cascade Microtech, Inc. | Guarded tub enclosure |
| US7221172B2 (en) | 2003-05-06 | 2007-05-22 | Cascade Microtech, Inc. | Switched suspended conductor and connection |
| US7250626B2 (en) | 2003-10-22 | 2007-07-31 | Cascade Microtech, Inc. | Probe testing structure |
| US7187188B2 (en) | 2003-12-24 | 2007-03-06 | Cascade Microtech, Inc. | Chuck with integrated wafer support |
| EP1754072A2 (en) | 2004-06-07 | 2007-02-21 | CASCADE MICROTECH, INC. (an Oregon corporation) | Thermal optical chuck |
| US7330041B2 (en) | 2004-06-14 | 2008-02-12 | Cascade Microtech, Inc. | Localizing a temperature of a device for testing |
| US7535247B2 (en) | 2005-01-31 | 2009-05-19 | Cascade Microtech, Inc. | Interface for testing semiconductors |
-
1984
- 1984-04-17 JP JP7582984A patent/JPS60219382A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0367187B2 (pm) | 1991-10-22 |
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