JPS60185300A - パタ−ンデ−タ転送装置 - Google Patents

パタ−ンデ−タ転送装置

Info

Publication number
JPS60185300A
JPS60185300A JP59041067A JP4106784A JPS60185300A JP S60185300 A JPS60185300 A JP S60185300A JP 59041067 A JP59041067 A JP 59041067A JP 4106784 A JP4106784 A JP 4106784A JP S60185300 A JPS60185300 A JP S60185300A
Authority
JP
Japan
Prior art keywords
pattern
write
memories
pattern data
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59041067A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0249520B2 (enrdf_load_stackoverflow
Inventor
Shigehiro Kimura
木村　重博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Takeda Riken Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp, Takeda Riken Industries Co Ltd filed Critical Advantest Corp
Priority to JP59041067A priority Critical patent/JPS60185300A/ja
Publication of JPS60185300A publication Critical patent/JPS60185300A/ja
Publication of JPH0249520B2 publication Critical patent/JPH0249520B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
JP59041067A 1984-03-02 1984-03-02 パタ−ンデ−タ転送装置 Granted JPS60185300A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59041067A JPS60185300A (ja) 1984-03-02 1984-03-02 パタ−ンデ−タ転送装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59041067A JPS60185300A (ja) 1984-03-02 1984-03-02 パタ−ンデ−タ転送装置

Publications (2)

Publication Number Publication Date
JPS60185300A true JPS60185300A (ja) 1985-09-20
JPH0249520B2 JPH0249520B2 (enrdf_load_stackoverflow) 1990-10-30

Family

ID=12598089

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59041067A Granted JPS60185300A (ja) 1984-03-02 1984-03-02 パタ−ンデ−タ転送装置

Country Status (1)

Country Link
JP (1) JPS60185300A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6092227A (en) * 1997-09-19 2000-07-18 Mitsubishi Electric System Lsi Design Corporation Test circuit
JP2006294104A (ja) * 2005-04-08 2006-10-26 Yokogawa Electric Corp デバイス試験装置およびデバイス試験方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0541524U (ja) * 1991-11-11 1993-06-08 真弓 山本 ナプキン

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6092227A (en) * 1997-09-19 2000-07-18 Mitsubishi Electric System Lsi Design Corporation Test circuit
JP2006294104A (ja) * 2005-04-08 2006-10-26 Yokogawa Electric Corp デバイス試験装置およびデバイス試験方法

Also Published As

Publication number Publication date
JPH0249520B2 (enrdf_load_stackoverflow) 1990-10-30

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