JPS60167340A - ステツチボンデイング部の接合状態の検査方法 - Google Patents
ステツチボンデイング部の接合状態の検査方法Info
- Publication number
- JPS60167340A JPS60167340A JP59023254A JP2325484A JPS60167340A JP S60167340 A JPS60167340 A JP S60167340A JP 59023254 A JP59023254 A JP 59023254A JP 2325484 A JP2325484 A JP 2325484A JP S60167340 A JPS60167340 A JP S60167340A
- Authority
- JP
- Japan
- Prior art keywords
- lead terminal
- copper wire
- bonding
- indentation
- silver
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H10W72/90—
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/4501—Shape
- H01L2224/45012—Cross-sectional shape
- H01L2224/45015—Cross-sectional shape being circular
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45147—Copper (Cu) as principal constituent
-
- H10W72/0711—
-
- H10W72/07141—
-
- H10W72/075—
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- H10W72/07521—
-
- H10W72/07531—
-
- H10W72/07532—
-
- H10W72/07533—
-
- H10W72/07551—
-
- H10W72/50—
-
- H10W72/536—
-
- H10W72/5363—
-
- H10W72/5525—
-
- H10W72/59—
-
- H10W72/934—
-
- H10W72/952—
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- H10W90/756—
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Wire Bonding (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59023254A JPS60167340A (ja) | 1984-02-09 | 1984-02-09 | ステツチボンデイング部の接合状態の検査方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59023254A JPS60167340A (ja) | 1984-02-09 | 1984-02-09 | ステツチボンデイング部の接合状態の検査方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60167340A true JPS60167340A (ja) | 1985-08-30 |
| JPH038586B2 JPH038586B2 (enExample) | 1991-02-06 |
Family
ID=12105458
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59023254A Granted JPS60167340A (ja) | 1984-02-09 | 1984-02-09 | ステツチボンデイング部の接合状態の検査方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60167340A (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5474224A (en) * | 1993-07-16 | 1995-12-12 | Kaijo Corporation | Wire bonder and wire bonding method |
| CN100336191C (zh) * | 2005-03-04 | 2007-09-05 | 汕头华汕电子器件有限公司 | 用铜线形成半导体器件内引线的方法 |
-
1984
- 1984-02-09 JP JP59023254A patent/JPS60167340A/ja active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5474224A (en) * | 1993-07-16 | 1995-12-12 | Kaijo Corporation | Wire bonder and wire bonding method |
| CN100336191C (zh) * | 2005-03-04 | 2007-09-05 | 汕头华汕电子器件有限公司 | 用铜线形成半导体器件内引线的方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH038586B2 (enExample) | 1991-02-06 |
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