JPS60146152A - 超音波顕微鏡 - Google Patents

超音波顕微鏡

Info

Publication number
JPS60146152A
JPS60146152A JP59001947A JP194784A JPS60146152A JP S60146152 A JPS60146152 A JP S60146152A JP 59001947 A JP59001947 A JP 59001947A JP 194784 A JP194784 A JP 194784A JP S60146152 A JPS60146152 A JP S60146152A
Authority
JP
Japan
Prior art keywords
sample
ultrasonic
sound wave
acoustic impedance
cover plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59001947A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0330105B2 (en:Method
Inventor
Hiroshi Kanda
浩 神田
Kiyoshi Ishikawa
潔 石川
Kageyoshi Katakura
景義 片倉
Chitose Nakatani
中谷　千歳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP59001947A priority Critical patent/JPS60146152A/ja
Priority to US06/689,955 priority patent/US4597293A/en
Priority to CA000471796A priority patent/CA1225733A/en
Priority to DE3500640A priority patent/DE3500640C2/de
Priority to GB08500641A priority patent/GB2153997B/en
Publication of JPS60146152A publication Critical patent/JPS60146152A/ja
Publication of JPH0330105B2 publication Critical patent/JPH0330105B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G—PHYSICS
    • G10—MUSICAL INSTRUMENTS; ACOUSTICS
    • G10K—SOUND-PRODUCING DEVICES; METHODS OR DEVICES FOR PROTECTING AGAINST, OR FOR DAMPING, NOISE OR OTHER ACOUSTIC WAVES IN GENERAL; ACOUSTICS NOT OTHERWISE PROVIDED FOR
    • G10K11/00—Methods or devices for transmitting, conducting or directing sound in general; Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
    • G10K11/02—Mechanical acoustic impedances; Impedance matching, e.g. by horns; Acoustic resonators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02854—Length, thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Chemical & Material Sciences (AREA)
  • Multimedia (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Ultra Sonic Daignosis Equipment (AREA)
JP59001947A 1984-01-11 1984-01-11 超音波顕微鏡 Granted JPS60146152A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP59001947A JPS60146152A (ja) 1984-01-11 1984-01-11 超音波顕微鏡
US06/689,955 US4597293A (en) 1984-01-11 1985-01-09 Scanning acoustic microscope
CA000471796A CA1225733A (en) 1984-01-11 1985-01-09 Scanning acoustic microscope
DE3500640A DE3500640C2 (de) 1984-01-11 1985-01-10 Akustisches Abtastmikroskop
GB08500641A GB2153997B (en) 1984-01-11 1985-01-10 Acoustic microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59001947A JPS60146152A (ja) 1984-01-11 1984-01-11 超音波顕微鏡

Publications (2)

Publication Number Publication Date
JPS60146152A true JPS60146152A (ja) 1985-08-01
JPH0330105B2 JPH0330105B2 (en:Method) 1991-04-26

Family

ID=11515804

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59001947A Granted JPS60146152A (ja) 1984-01-11 1984-01-11 超音波顕微鏡

Country Status (5)

Country Link
US (1) US4597293A (en:Method)
JP (1) JPS60146152A (en:Method)
CA (1) CA1225733A (en:Method)
DE (1) DE3500640C2 (en:Method)
GB (1) GB2153997B (en:Method)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007248079A (ja) * 2006-03-13 2007-09-27 Honda Electronic Co Ltd 音響インピーダンス測定方法、及び音響インピーダンス測定装置
JP2008209257A (ja) * 2007-02-27 2008-09-11 Toyohashi Univ Of Technology 音響パラメータ測定装置、音響パラメータ測定装置用の試料支持体、音響パラメータ測定方法、及び超音波脳組織観察方法

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2602043B1 (fr) * 1986-07-24 1990-10-12 France Etat Procede de mesure non destructive du profil d'une surface
US5627320A (en) * 1988-03-23 1997-05-06 Texas Instruments Incorporated Apparatus and method for automated non-destructive inspection of integrated circuit packages
CN1019919C (zh) * 1990-03-08 1993-02-17 清华大学 具有新型声镜的反射式声显微镜
US5922961A (en) * 1996-05-10 1999-07-13 The United States Of America As Represented By The Secretary Of Commerce Time and polarization resolved acoustic microscope
DE10151593A1 (de) * 2001-10-18 2003-04-30 Contitech Luftfedersyst Gmbh Abstands- und Druckmessung innerhalb einer Luftfeder
US7725167B2 (en) * 2005-07-13 2010-05-25 Clemson University Microwave imaging assisted ultrasonically
JP2015090281A (ja) * 2013-11-05 2015-05-11 パナソニックＩｐマネジメント株式会社 超音波測定方法および装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4205686A (en) * 1977-09-09 1980-06-03 Picker Corporation Ultrasonic transducer and examination method
US4503708A (en) * 1983-02-07 1985-03-12 Board Of Trustees Of The Leland Stanford Junior University Reflection acoustic microscope for precision differential phase imaging

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007248079A (ja) * 2006-03-13 2007-09-27 Honda Electronic Co Ltd 音響インピーダンス測定方法、及び音響インピーダンス測定装置
JP2008209257A (ja) * 2007-02-27 2008-09-11 Toyohashi Univ Of Technology 音響パラメータ測定装置、音響パラメータ測定装置用の試料支持体、音響パラメータ測定方法、及び超音波脳組織観察方法

Also Published As

Publication number Publication date
US4597293A (en) 1986-07-01
GB2153997A (en) 1985-08-29
CA1225733A (en) 1987-08-18
DE3500640C2 (de) 1986-07-03
GB2153997B (en) 1987-06-10
JPH0330105B2 (en:Method) 1991-04-26
GB8500641D0 (en) 1985-02-13
DE3500640A1 (de) 1985-07-18

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